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Atomic-resolution imaging with scanning transmission electron microscopy is a powerful tool for characterizing the nanoscale structure of materials, in particular features such as defects, local strains, and symmetry-breaking distortions.…
Recent progress in the application of color centers to nanoscale spin sensing makes the combined use of noise spectroscopy and scanning probe imaging an attractive route for the characterization of arbitrary material systems. Unfortunately,…
Semiconductor imaging and analysis are critical yet understudied in deep learning, limiting our ability for precise control and optimization in semiconductor manufacturing. We introduce a small-scale multimodal framework for analyzing…
In the field of transmission electron microscopy, data interpretation often lags behind acquisition methods, as image processing methods often have to be manually tailored to individual datasets. Machine learning offers a promising approach…
In this paper, we present a deep learning-based (DL-based) algorithm, as a purely mathematical platform, for providing intuitive understanding of the properties of electromagnetic (EM) wave-matter interaction in nanostructures. This…
Single-beam scanning electron microscopes (SEM) are widely used to acquire massive data sets for biomedical study, material analysis, and fabrication inspection. Datasets are typically acquired with uniform acquisition: applying the…
Low voltage transmission electron microscopy (<=80 kV) has many applications in imaging beam-sensitive samples, such as metallic nanoparticles, which may become damaged at higher voltages. To improve resolution, spherical aberration can be…
The emerging optical multiplexing within nanoscale shows super-capacity in encoding information by using the time-domain fingerprints from uniform nanoparticles. However, the optical diffraction limit compromises the decoding throughput and…
Light-sheet microscopes must compromise between field of view, optical sectioning, resolution, and detection efficiency. High-numerical-aperture (NA) detection objective lenses provide high resolution but their narrow depth of field fails…
Determining the dimensions of nanostructures is critical to ensuring the maximum performance of many geometry-sensitive nanoscale functional devices. However, accurate metrology at the nanoscale is difficult using optics-based methods due…
Nanoscale structural and electronic heterogeneities are prevalent in condensed matter physics. Investigating these heterogeneities in three dimensions (3D) has become an important task for understanding their material properties. To provide…
Scanning nanobeam electron diffraction (NBED) with fast pixelated detectors is a valuable technique for rapid, spatially resolved mapping of lattice structure over a wide range of length scales. However, intensity variations caused by…
Precise alignment of the electron beam is critical for successful application of scanning transmission electron microscopes (STEM) to understanding materials at atomic level. Despite the success of aberration correctors, aberration…
A new tool providing material contrast control in scanning electron microscopy (SEM) is demonstrated. The approach is based on deep-UV illumination during SEM imaging and delivers a novel material based contrast as well as higher resolution…
X-ray absorption spectroscopy and X-ray magnetic circular dichroism have long served as indispensable tools for probing the electronic and magnetic properties of transition-metal compounds with elemental selectivity. In recent years, the…
Dark Field X-ray Microscopy (DFXM) has advanced 3D non-destructive, high-resolution imaging of strain and orientation in crystalline materials, enabling the study of embedded structures in bulk. However, the photon-intensive nature of…
Compensated magnets are of increasing interest for both fundamental research and applications, with their net-zero magnetization leading to ultrafast dynamics and robust order. To understand and control this order, nanoscale mapping of…
To prepare for identifying the composition of nanowire-fiber mixtures in Scanning Electron Microscope (SEM) images, we optimize the performance of image classification between nanowires, fibers and tips due to their geometric similarities.…
This study develops a polygonal cell-based smoothed finite element method (CSFEM) for two-dimensional seepage analyses in porous media, covering steady-state, transient, and free-surface problems. Wachspress interpolation on convex…
Localization microscopy is an imaging technique in which the positions of individual nanoscale point emitters (e.g. fluorescent molecules) are determined at high precision from their images. This is the key ingredient in…