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Electron tomography, as an important 3D imaging method, offers a powerful method to probe the 3D structure of materials from the nano- to the atomic-scale. However, as a grant challenge, radiation intolerance of the nanoscale samples and…

Materials Science · Physics 2020-03-30 Chunyang Wang , Guanglei Ding , Yitong Liu , Huolin L. Xin

Imaging of nanoscale magnetic textures within extended material systems is of critical importance both to fundamental research and technological applications. Whilst high resolution magnetic imaging of thin nanoscale samples is…

Atomic resolution imaging in transmission electron microscopy (TEM) and scanning TEM (STEM) of light elements in electron-transparent materials has long been a challenge. Biomolecular materials, for example, are rapidly altered when…

Instrumentation and Detectors · Physics 2018-12-05 Fehmi S. Yasin , Tyler R. Harvey , Jordan J. Chess , Jordan S. Pierce , Colin Ophus , Peter Ercius , Benjamin J. McMorran

Atomic resolution electron microscopy, particularly high-angle annular dark-field scanning transmission electron microscopy, has become an essential tool for many scientific fields, when direct visualization of atomic arrangements and…

Nanoparticles occur in various environments as a consequence of man-made processes, which raises concerns about their impact on the environment and human health. To allow for proper risk assessment, a precise and statistically relevant…

Single-shot imaging with femtosecond X-ray lasers is a powerful measurement technique that can achieve both high spatial and temporal resolution. However, its accuracy has been severely limited by the difficulty of applying conventional…

Resolving morphological chemical phase transformations at the nanoscale is of vital importance to many scientific and industrial applications across various disciplines. The TXM-XANES imaging technique, by combining full field transmission…

Image and Video Processing · Electrical Eng. & Systems 2022-01-04 Jizhou Li , Bin Chen , Guibin Zan , Guannan Qian , Piero Pianetta , Yijin Liu

Following the recent developement of Fourier ptychographic microscopy (FPM) in the visible range by Zheng et al. (2013), we propose an adaptation for hard x-rays. FPM employs ptychographic reconstruction to merge a series of low-resolution,…

Instrumentation and Detectors · Physics 2016-09-27 H. Simons , H. F. Poulsen , J. P. Guigay , C. Detlefs

Image denoising or artefact removal using deep learning is possible in the availability of supervised training dataset acquired in real experiments or synthesized using known noise models. Neither of the conditions can be fulfilled for…

Image and Video Processing · Electrical Eng. & Systems 2020-11-23 Suyog Jadhav , Sebastian Acuña , Krishna Agarwal , Dilip K. prasad

Recent advances in scanning transmission electron and scanning probe microscopies have opened exciting opportunities in probing the materials structural parameters and various functional properties in real space with angstrom-level…

Photoemission electron microscopy (PEEM) has evolved into an indispensable tool for structural and magnetic characterization of surfaces at the nanometer scale. In strong contrast to synchrotron-radiation-based X-ray PEEM as a leading…

Accurately tracking particles and determining their coordinate along the optical axis is a major challenge in optical microscopy, especially when extremely high precision is needed. In this study, we introduce a deep learning approach using…

Image and Video Processing · Electrical Eng. & Systems 2025-08-05 Andrey Alexandrov , Giovanni Acampora , Giovanni De Lellis , Antonia Di Crescenzo , Chiara Errico , Daria Morozova , Valeri Tioukov , Autilia Vittiello

Deep learning has demonstrated superb efficacy in processing imaging data, yet its suitability in solving challenging inverse problems in scientific imaging has not been fully explored. Of immense interest is the determination of local…

Materials Science · Physics 2019-02-20 Nouamane Laanait , Qian He , Albina Y. Borisevich

Soft X-ray angle resolved photoemission spectroscopy (SX-ARPES) is one of the most powerful spectroscopic techniques to visualize the three-dimensional bulk electronic structure in reciprocal lattice space. Compared with ARPES employing…

Strongly Correlated Electrons · Physics 2026-03-05 Kohei Yamagami , Yuichi Yokoyama , Yuta Sumiya , Hayaru Shouno , Tetsuro Nakamura , Masaichiro Mizumaki

Non-destructive nano-imaging of the internal structure of solid matter is only feasible using hard X-rays due to their high penetration. The highest resolution images are achieved at synchrotron radiation sources (SRF), offering superior…

We report the development of deep learning coherent electron diffractive imaging at sub-angstrom resolution using convolutional neural networks (CNNs) trained with only simulated data. We experimentally demonstrate this method by applying…

Materials Science · Physics 2022-04-19 Dillan J. Chang , Colum M. O'Leary , Cong Su , Salman Kahn , Alex Zettl , Jim Ciston , Peter Ercius , Jianwei Miao

Two-color X-ray imaging with Free Electron Laser pulses offers a powerful approach for probing ultrafast structural dynamics in nanoscale systems, combining (near-)atomic spatial resolution with femtosecond temporal precision. The first…

Localized surface plasmons can confine light within a deep-subwavelength volume comparable to the scale of atoms and molecules, enabling ultrasensitive responses to near-field variations. On the other hand, this extreme localization also…

Energy dispersive X-ray (EDX) spectroscopy in the transmission electron microscope is a key tool for nanomaterials analysis, providing a direct link between spatial and chemical information. However, using it for precisely determining…

Materials Science · Physics 2024-05-24 Hui Chen , Duncan T. L. Alexander , Cécile Hébert

We theoretically demonstrate the ability of electron beams to probe the nonlinear photonic response with nanometer spatial resolution, well beyond the capabilities of existing optical techniques. Although the interaction of electron beams…

Mesoscale and Nanoscale Physics · Physics 2020-12-30 Andrea Konečná , Valerio Di Giulio , Vahagn Mkhitaryan , Claus Ropers , F. Javier García de Abajo