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Techniques to improve the data quality of interferometric radio observations are considered. Fundaments of fringe frequencies in the uv-plane are discussed and filters are used to attenuate radio-frequency interference (RFI) and off-axis…

Instrumentation and Methods for Astrophysics · Physics 2012-04-02 A. R. Offringa , A. G. de Bruyn , S. Zaroubi

High-energy X-ray diffraction methods can non-destructively map the 3D microstructure and associated attributes of metallic polycrystalline engineering materials in their bulk form. These methods are often combined with external stimuli…

X-ray diffractometers primarily designed for surface x-ray diffraction are often used to measure the diffraction from powders, textured materials, and fiber-texture samples in so-called $2\theta$ scans. Unlike high-energy powder diffraction…

Applied Physics · Physics 2022-01-27 Giuseppe Abbondanza , Alfred Larsson , Francesco Carlá , Edvin Lundgren , Gary S. Harlow

X-ray spectroscopy is a powerful technique for the analysis of the energy distribution of X-rays from astrophysical sources. It allows for the study of the properties, composition, and physical processes taking place at the site of…

High Energy Astrophysical Phenomena · Physics 2023-09-22 L. Ducci , C. Malacaria

In this paper a theory of reflective X-ray multilayer structures with a graded (slowly varying) period based on the coupled waves method and quasi-classical asymptotic expansions is reported. A number of exact solutions of the coupled wave…

Optics · Physics 2022-04-26 R. M. Feshchenko

The nonlinear quantum interaction of a linearly polarized x-ray probe beam with a focused intense standing laser wave is studied theoretically. Because of the tight focusing of the standing laser pulse, diffraction effects arise for the…

High Energy Physics - Phenomenology · Physics 2018-08-01 A. Di Piazza , K. Z. Hatsagortsyan , C. H. Keitel

We propose a data-driven approach for intrinsic image decomposition, which is the process of inferring the confounding factors of reflectance and shading in an image. We pose this as a two-stage learning problem. First, we train a model to…

Computer Vision and Pattern Recognition · Computer Science 2015-10-09 Tinghui Zhou , Philipp Krähenbühl , Alexei A. Efros

A simple method of phase-and-amplitude extraction is derived that corrects for image blurring induced by partially spatially coherent incident illumination using only a single intensity image as input. The method is based on Fresnel…

Optics · Physics 2019-11-19 Mario A. Beltran , David M. Paganin , Daniele Pelliccia

We present a method using principal component analysis (PCA) to process x-ray pulses with severe shape variation where traditional optimal filter methods fail. We demonstrate that PCA is able to noise-filter and extract energy information…

Instrumentation and Detectors · Physics 2016-03-23 Daikang Yan , Thomas Cecil , Lisa Gades , Chris Jacobsen , Timothy Madden , Antonino Miceli

Phase-contrast X-ray imaging can improve the visibility of weakly absorbing objects (e.g. soft tissues) by an order of magnitude or more compared to conventional radiographs. Previously, it has been shown that combining phase retrieval with…

The core theme of X-ray crystallography is reconstructing the electron density distribution of crystals under the constraints of observed diffraction data. Nevertheless, the reconstruction of electron density distribution by straightforward…

Materials Science · Physics 2015-07-14 Hui Li , Meng He , Ze Zhang

Machine learning has been applied to the problem of X-ray diffraction phase prediction with promising results. In this paper, we describe a method for using machine learning to predict crystal structure phases from X-ray diffraction data of…

Materials Science · Physics 2023-05-26 Maksim Zhdanov , Andrey Zhdanov

Coherent X-ray diffraction microscopy is a method of imaging non-periodic isolated objects at resolutions only limited, in principle, by the largest scattering angles recorded. We demonstrate X-ray diffraction imaging with high resolution…

Formation of a bright-field microscopic image of a transparent phase object is described in terms of elementary geometrical optics. Our approach is based on the premise that image replicates the intensity distribution (real or virtual) at…

Optics · Physics 2018-02-14 A. K. Khitrin , M. A. Model

Information about microscopic objects with features smaller than the diffraction limit is almost entirely lost in a far-field diffraction image but could be partly recovered with data completition techniques. Any such approach critically…

Optics · Physics 2020-11-17 Maria Bancerek , Krzysztof M. Czajkowski , Rafal Kotynski

Estimating parameters and properties of various materials without causing damage to the material under test (MUT) is important in many applications. Thus, in this letter, we address this by wireless sensing. Here, the accuracy of the…

Signal Processing · Electrical Eng. & Systems 2020-10-29 Udaya S. K. P. Miriya Thanthrige , Jan Barowski , Ilona Rolfes , Daniel Erni , Thomas Kaiser , Aydin Sezgin

Multi-technique high resolution X-ray mapping enhanced by the recent advent of 4th generation synchrotron facilities can produce colossal datasets, challenging traditional analysis methods. Such difficulty is clearly materialized when…

Fourier imaging is an indirect imaging method which records the diffraction pattern of the object scene coherently in the focal plane of the imaging system and reconstructs the image using computational resources. The spatial resolution,…

Optics · Physics 2023-06-05 Hui Yuan , Alvydas Lisauskas , Mark D. Thomson , Hartmut G. Roskos

X-ray reflection signatures are observed around multiple classes of accreting compact objects. Modelling these features yield important constraints on the physics of accretion disks, motivating the development of X-ray reflection models…

High Energy Astrophysical Phenomena · Physics 2015-06-04 D. R. Ballantyne , J. D. Purvis , R. G. Strausbaugh , R. C. Hickox

The properties of semiconductors and functional dielectrics are defined by their response in electric fields, which may be perturbed by defects and the strain they generate. In this work, we demonstrate how diffraction-based X-ray…

Materials Science · Physics 2024-11-12 Trygve Magnus Ræder , Urko Petralanda , Thomas Olsen , Hugh Simons
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