Related papers: Reflectivity-based refractive index measurement of…
New high-refractive-index dielectric materials may enhance many optical technologies by enabling efficient manipulation of light in waveguides, metasurfaces, and nanoscale resonators. Van der Waals materials are particularly promising due…
In-operando characterization of van der Waals (vdW) devices using surface-sensitive methods provides critical insights into phase transitions and correlated electronic states. Yet, integrating vdW materials in functional devices while…
High-quality low-dimensional layered and van der Waals materials are typically exfoliated, with sample cross sectional areas on the order of tens to hundreds of microns. The small size of flakes makes the experimental characterization of…
Guided modes in anisotropic two-dimensional van der Waals materials are experimentally investigated and their refractive indices in visible wavelengths are extracted. Our method involves near-field scanning optical microscopy of waveguide…
We study mechanically exfoliated nanosheets of franckeite by quantitative optical microscopy. The analysis of transmission mode and epi-illumination mode optical microscopy images provides a rapid method to estimate the thickness of the…
As properties of mono- to few layers of exfoliated van der Waals heterostructures are heavily dependent on their thicknesses, accurate thickness measurement becomes imperative in their study. Commonly used atomic force microscopy and Raman…
Common techniques for measuring refractive indices, such as ellipsometry and goniometry, are ineffective for van der Waals crystal flakes because of their high anisotropy and small, micron-scale, lateral size. To address this, we employ…
With the advance of on-chip nanophotonics, there is a high demand for high refractive index, low-loss materials. Currently, this technology is dominated by silicon, but van der Waals (vdW) materials with high refractive index can offer a…
The integration of high-refractive-index dielectrics into scalable photonic architectures is foundational to advancing integrated circuits and augmented reality (AR) displays. Van der Waals (vdW) materials offer exceptional optical…
Reliable control of the deposition process of optical films and coatings frequently requires monitoring of the refractive index profile throughout the layer. In the present work a simple in situ approach is proposed which uses a WKBJ matrix…
The growing families of two-dimensional crystals derived from naturally occurring van der Waals materials offer an unprecedented platform to investigate elusive physical phenomena and could be of use in a diverse range of devices. Of…
We present a non-destructive, spatially resolved thickness characterization method for rhombohedral (3R) molybdenum disulfide (MoS$_2$) on polydimethylsiloxane (PDMS) substrates. Unlike broadband spectroscopic approaches, the proposed…
A method for determining the permittivity and permeability for specimens with high refractive index and variable shape is investigated. The method extracts the permeability and permittivity tensor elements from reflection measurements made…
We have experimentally studied the optical refractive index of few-layer graphene through reflection spectroscopy at visible wavelengths. A laser scanning microscope (LSM) with a coherent supercontinuum laser source measured the…
The dispersive part of the refractive index of vanadium is determined by measuring the angular displacement of the first order diffraction peak of a V/Fe superlattice. The measurements were made using elliptically polarized synchrotron…
White light spectral interferometry is applied to measure the refractive index in absorbing liquids in the spectral range from 400 to 1000 nm. We analyze the influence of absorption on the visibility of interferometric fringes and,…
A cost-effective and robust image-processing pipeline is presented for the detection and characterization of exfoliated two-dimensional (2D) material flakes in optical microscope images, designed to facilitate automation in van der Waals…
Negative reflection and negative refraction are exotic phenomena that can be achieved by platforms such as double-negative metamaterial, hyperbolic metamaterial, and phase-discontinuity metasurface. Recently, natural biaxial van der Waals…
This paper presents a simple and effective wideband method for the determination of material properties, such as the complex index of refraction and the complex permittivity and permeability. The method is explicit (non-iterative) and…
Spectroscopic ellipsometry is a powerful method with high surface sensitivity that can be used to monitor the growth of even sub-monolayer film. However, the analysis of ultrathin films is complicated by the correlation of the dielectric…