Near-field refractometry of van der Waals crystals
Mesoscale and Nanoscale Physics
2025-07-21 v3 Optics
Abstract
Common techniques for measuring refractive indices, such as ellipsometry and goniometry, are ineffective for van der Waals crystal flakes because of their high anisotropy and small, micron-scale, lateral size. To address this, we employ near-field optical microscopy to analyze the guided optical modes within these crystals. By probing these modes in MoS flakes with subwavelength spatial resolution at a wavelength of , we determine both the in-plane and out-of-plane permittivity components of MoS as and , respectively, with a relative uncertainty below , while overcoming the limitations of traditional methods.
Keywords
Cite
@article{arxiv.2411.07926,
title = {Near-field refractometry of van der Waals crystals},
author = {Martin Nørgaard and Torgom Yezekyan and Stefan Rolfs and Christian Frydendahl and N. Asger Mortensen and Vladimir A. Zenin},
journal= {arXiv preprint arXiv:2411.07926},
year = {2025}
}