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X-ray diffraction with high spatial resolution is a prerequisite for the characterization of (poly)-crystalline materials on micro- or nanoscopic scales. This can be achieved by utilizing a focused X-ray beam and scanning of the sample.…

Materials Science · Physics 2023-01-04 Prerana Chakrabarti , Peter Modregger

An approximation is elaborated for the paraxial propagation of diffracted beams, with both one- and two-dimensional cross sections, which are released from apertures with sharp boundaries. The approximation applies to any beam under the…

Optics · Physics 2016-06-29 Eitam Luz , Er'el Granot , Boris A. Malomed

Micromechanical transducers such as cantilevers for AFM often rely on optical readout methods that require illumination of a specific region of the microstructure. Here we explore and exploit the diffraction effects that have been…

Instrumentation and Detectors · Physics 2016-06-06 Rodolfo I. Hermans , Benjamin Dueck , Joseph Wafula Ndieyira , Rachel A. McKendry , Gabriel Aeppli

Understanding the interactions between microstructure, strain, phase, and material behavior is crucial in many scientific fields. However, quantifying these correlations is challenging, as it requires the use of multiple instruments and…

We have developed an improved method of time-resolved x-ray reflectivity (XRR) using monochromatic synchrotron radiation. Our method utilizes a polycapillary x-ray optic to create a range of incident angles and an area detector to collect…

Materials Science · Physics 2019-03-27 Howie Joress , Shane Quinlan Arlington , Timothy P. Weihs , Joel D. Brock , Arthur Woll

Optical super-resolution microscopy is a key technology for structural biology that offers high imaging contrast and live-cell compatibility. Minimal (fluorescence) photons flux microscopy, or MINFLUX, is an emerging super-resolution…

Optics · Physics 2025-08-29 Lukas Scheiderer , Zach Marin , Jonas Ries

We report the development of an instrument combining an ultrafast, high-repetition-rate, polarization-tunable monochromatic extreme ultraviolet (XUV, 21.6 eV) beamline and a next-generation momentum microscope endstation. This setup enables…

Solving crystal structures from powder X-ray diffraction (XRD) is a central challenge in materials characterization. In this work, we study the powder XRD-to-structure mapping using gradient descent optimization, with the goal of recovering…

Materials Science · Physics 2025-12-04 Nofit Segal , Akshay Subramanian , Mingda Li , Benjamin Kurt Miller , Rafael Gomez-Bombarelli

X-ray crystallography (XC) is an experimental technique used to determine three-dimensional crystalline structures. The acquired data in XC, called diffraction patterns, is the Fourier magnitudes of the unknown crystalline structure. To…

Image and Video Processing · Electrical Eng. & Systems 2019-07-09 Samuel Pinilla , Jorge Bacca , Cesar Vargas , Juan Carlos Poveda-Jaramillo , Henry Arguello

Serial crystallography experiments routinely produce thousands of diffraction patterns from crystals in random orientations. To turn this stream of images into a usable dataset, each pattern must be indexed before integration and merging…

Computational Physics · Physics 2025-12-01 Marc M Nasser , Frédéric Poitevin , Kevin M Dalton

X-ray dark-field imaging enables a spatially-resolved visualization of ultra-small-angle X-ray scattering. Using phantom measurements, we demonstrate that a material's effective dark-field signal may be reduced by modification of the…

Light-sheet microscopes must compromise between field of view, optical sectioning, resolution, and detection efficiency. High-numerical-aperture (NA) detection objective lenses provide high resolution but their narrow depth of field fails…

Scanning transmission electron microscopy (STEM) has a broad range of applications in materials characterization, including real-space imaging, spectroscopy, and diffraction, at length scales from the micron to sub-{\AA}ngstr\"om. The…

Instrumentation and Detectors · Physics 2022-06-07 Bryan D Esser , Joanne Etheridge

This work is concerned with optical imaging in strongly diffusive environments. We consider a typical setting in optical coherence tomography where a sample is probed by a collection of wavefields produced by a laser and propagating through…

Optics · Physics 2024-12-10 Randy Bartels , Olivier Pinaud , Maxine Varughese

Information multiplexing is important for biomedical imaging and chemical sensing. In this paper, we report a microscopy imaging technique, termed state-multiplexed Fourier ptychography (FP), for information multiplexing and coherent-state…

Optics · Physics 2014-05-12 Siyuan Dong , Radhika Shiradkar , Pariksheet Nanda , Guoan Zheng

Sensitive to scattering from unresolved sample structures, the dark-field channel in full-field X-ray imaging provides complementary information to that offered by conventional attenuation and phase-contrast methods. A range of experimental…

X-ray ptychography is one of the versatile techniques for nanometer resolution imaging. The magnitude of the diffraction patterns is recorded on a detector and the phase of the diffraction patterns is estimated using phase retrieval…

Image and Video Processing · Electrical Eng. & Systems 2021-05-21 Prasan Shedligeri , Florian Schiffers , Semih Barutcu , Pablo Ruiz , Aggelos K Katsaggelos , Oliver Cossairt

Dynamical diffraction effects in single crystals produce highly monochromatic parallel X-ray beams with a mutual separation of a few micrometer and a time-delay of a few fs -the so-called echoes. This ultrafast diffraction effect is used at…

Powder X-ray diffraction (pXRD) experiments are a cornerstone for materials structure characterization. Despite their widespread application, analyzing pXRD diffractograms still presents a significant challenge to automation and a…

Fourier Ptychographic Microscopy (FPM) is a computational imaging method that is able to super-resolve features beyond the diffraction-limit set by the objective lens of a traditional microscope. This is accomplished by using synthetic…

Signal Processing · Electrical Eng. & Systems 2019-04-09 Michael Kellman , Emrah Bostan , Michael Chen , Laura Waller
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