Related papers: Soft Error Probability Estimation of Nano-scale Co…
In this paper, we present an accurate but very fast soft error rate (SER) estimation technique for digital circuits based on error propagation probability (EPP) computation. Experiments results and comparison of the results with the random…
Very deep submicron and nanometer technologies have increased notably integrated circuit (IC) sensitiveness to radiation. Soft errors are currently appearing into ICs working at earth surface. Hardened circuits are currently required in…
A new physics-based model for analytical calculation of Soft Error Rate (SER) in digital memory circuits under the influence of heavy ions in space orbits is proposed. This method is based on parameters that are uniquely determined from the…
Smaller feature size, higher clock frequency and lower power consumption are of core concerns of today's nano-technology, which has been resulted by continuous downscaling of CMOS technologies. The resultant 'device shrinking' reduces the…
The average symbol error probability (SEP) of a phase-quantized single-input multiple-output system with M-ary phase-shift keying modulation and maximum ratio combining (MRC) is analyzed under correlated Rayleigh fading and additive white…
Over past years, the easy accessibility to the large scale datasets has significantly shifted the paradigm for developing highly accurate prediction models that are driven from Neural Network (NN). These models can be potentially impacted…
High energy particles from cosmic rays or packaging materials can generate a glitch or a current transient (single event transient or SET) in a logic circuit. This SET can eventually get captured in a register resulting in a flip of the…
The ever-expanding scale of integrated circuits has brought about a significant rise in the design risks associated with radiation-resistant integrated circuit chips. Traditional single-particle experimental methods, with their iterative…
A single event upset (SEU) is a critical soft error that occurs in semiconductor devices on exposure to ionising particles from space environments. SEUs cause bit flips in the memory component of semiconductors. This creates a multitude of…
Soft errors have a significant impact on the circuit reliability at nanoscale technologies. At the architectural level, soft errors are commonly modeled by a probabilistic bit-flip model. In developing such abstract fault models, an…
This paper proposes new accurate approximations for average error probability (AEP) of a communication system employing either $M$-phase-shift keying (PSK) or differential quaternary PSK with Gray coding (GC-DQPSK) modulation schemes over…
Nanometer circuits are becoming increasingly susceptible to soft-errors due to alpha-particle and atmospheric neutron strikes as device scaling reduces node capacitances and supply/threshold voltage scaling reduces noise margins. It is…
In this work we propose an adaptive multilevel version of subset simulation to estimate the probability of rare events for complex physical systems. Given a sequence of nested failure domains of increasing size, the rare event probability…
This paper presents a detailed evaluation of the efficiency of software-only techniques to mitigate SEU and SET in microprocessors. A set of well-known rules is presented and implemented automatically to transform an unprotected program…
Designing integrated circuits in radiation environments such as the High Luminosity LHC (HL-LHC) is challenging. Integrated circuits will be exposed to radiation-induced Single Event Effects (SEE). In deep sub-micron technology devices, the…
In this paper, the average symbol error probability (SEP) of a phase-quantized single-input multiple-output (SIMO) system with M-ary phase-shift keying (PSK) modulation is analyzed under Rayleigh fading and additive white Gaussian noise. By…
A simple physical model for calculation of the ion-induced soft error rate in space environment has been proposed, based on the phenomenological cross section notion. Proposed numerical procedure is adapted to the multiple cell upset…
Solar Energetic Particle (SEP) events and their major subclass, Solar Proton Events (SPEs), can have unfavorable consequences on numerous aspects of life and technology, making them one of the most harmful effects of solar activity.…
A self-consistent procedure for the ion-induced soft error rate calculation in space environment taking into account Error Correcting Codes is proposed. The method is based on the partitioning of the multiple cell events into groups with…
Prediction of the Solar Energetic Particle (SEP) events garner increasing interest as space missions extend beyond Earth's protective magnetosphere. These events, which are, in most cases, products of magnetic reconnection-driven processes…