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The alignment of serial-section electron microscopy (ssEM) images is critical for efforts in neuroscience that seek to reconstruct neuronal circuits. However, each ssEM plane contains densely packed structures that vary from one section to…
Electrical Capacitance Tomography (ECT) is an imaging technique providing the distribution of permittivity in a medium by the mean of electrodes. As for any imaging systems, the reachable spatial resolution is a key parameter. In this paper…
A promising direction for recovering the lost information in low-resolution headshot images is utilizing a set of high-resolution exemplars from the same identity. Complementary images in the reference set can improve the generated headshot…
Feature matching is a crucial task in the field of computer vision, which involves finding correspondences between images. Previous studies achieve remarkable performance using learning-based feature comparison. However, the pervasive…
Scanning Electron Microscopy (SEM) experiments provide detailed insights into material microstructures, enabling high-resolution imaging as well as crystallographic analysis through advanced techniques like Electron Backscatter Diffraction…
Scanning Electron Microscopy (SEM) is indispensable in modern materials science, enabling high-resolution imaging across a wide range of structural, chemical, and functional investigations. However, SEM imaging remains constrained by…
A possibility of a few MeV electron beam diagnostics (Lorentz factor ~ 10) using polarization characteristics of the optical transition radiation (OTR) have been considered. Determinaton of the electron beam divergence have been performed…
Multi-MeV flash radiography is often used as the primary diagnostic technique for high energy and density (HED) physics experiments. Primary X-ray which is attenuated by the object offers density information of the object. For a thick metal…
Scanning transmission electron microscopy (STEM) has become the technique of choice for quantitative characterization of atomic structure of materials, where the minute displacements of atomic columns from high-symmetry positions can be…
Scanning tunneling microscopy is the method of choice for characterizing charge density waves by imaging the variation in atomic-scale contrast of the surface. Due to the measurement principle of scanning tunneling microscopy, the…
To satisfy the rigorous requirements of precise edge detection in critical high-accuracy measurements, this article proposes a series of efficient approaches for localizing subpixel edge. In contrast to the fitting based methods, which…
In brain oncology, it is routine to evaluate the progress or remission of the disease based on the differences between a pre-treatment and a post-treatment Positron Emission Tomography (PET) scan. Background adjustment is necessary to…
Precise control of light-matter interactions at the nanoscale lies at the heart of nanophotonics. Experimental examination at this length scale is challenging, however, since the corresponding electromagnetic near-field is often confined…
In radiation beam-profile measurements, an accurate positioning of the detector with high position resolution is essential. For this purpose, we built a scanning device capable of moving a detector in three dimensions using mainly parts…
The method of maximum likelihood estimation (MLE) is a widely used statistical approach for estimating the values of one or more unknown parameters of a probabilistic model based on observed data. In this tutorial, I briefly review the…
Scanning transmission electron microscopy (STEM) combined with electron energy loss spectroscopy (EELS) has become a standard technique to map localized surface plasmon resonances with a nanometer spatial and a sufficient energy resolution…
4D-STEM, in which the 2D diffraction plane is captured for each 2D scan position in the scanning transmission electron microscope (STEM) using a pixelated detector, is complementing and increasingly replacing existing imaging approaches.…
Coherent spin resonance techniques, such as nuclear and electron spin resonance spectroscopy, have revolutionized non-invasive imaging by providing spectrally resolved information about spin dynamics. Motivated by the recent emergence of…
High-resolution transmission electron microscopy (HRTEM) is crucial for observing material's structural and morphological evolution at Angstrom scales, but the electron beam can alter these processes. Devices such as CMOS-based…
We consider the spin-exchange (SE) cross section in electron scattering from $^3$He\,{\scriptsize II}, which drives the hyperfine-changing \hbox{3.46 cm} (8.665 GHz) line transition. Both the analytical quantum defect method --- applicable…