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We present an asymptotic analysis of the minimum probability of error (MPE) in inferring the correct hypothesis in a Bayesian multi-hypothesis testing (MHT) formalism using many pixels of data that are corrupted by signal dependent shot…
A coupled boundary spectral element method (BSEM) and spectral element method (SEM) formulation for the propagation of small-amplitude water waves over variable bathymetries is presented in this work. The wave model is based on the…
In a scanning transmission electron microscope (STEM), producing a high-resolution image generally requires an electron beam focused to the smallest point possible. However, the magnetic lenses used to focus the beam are unavoidably…
Region-based methods have proven necessary for improving segmentation accuracy of neuronal structures in electron microscopy (EM) images. Most region-based segmentation methods use a scoring function to determine region merging. Such…
Scanning electron microscopy (SEM) has been widely utilized in the field of materials science due to its significant advantages, such as large depth of field, wide field of view, and excellent stereoscopic imaging. However, at high…
We study the effect of a finite sample size, beam divergence and detector thickness on the resolution function of a MIEZE spectrometer. We provide a transparent analytical framework which can be used to determine the optimal trade-off…
A conventional method to determine beam parameters is using the profile measurements and converting them into the values of twiss parameters and beam emittance at a specified position. The beam information can be used to improve transverse…
Characterisation of rare microstructural features in scanning electron microscopy (SEM) requires imaging large areas at high resolution. This leads to prohibitively long acquisition times. We present an open-source Python framework that…
Spectral element methods (SEM), which are extensions of finite element methods (FEM), are important emerging techniques for solving partial differential equations in physics and engineering. SEM can potentially deliver better accuracy due…
The application of PhotoEmission Electron Microscopy (PEEM) and Low Energy Electron Microscopy (LEEM) techniques to the study of the electronic and chemical structure of ferroelectric materials is reviewed. Electron optics in both…
The numerical analysis of the diffraction features rendered by transmission electron microscopy (TEM) typically relies either on classical approximations (Monte Carlo simulations) or quantum paraxial tomography (the multislice method and…
Microstructure characterisation has been greatly enhanced through the use of electron backscatter diffraction (EBSD), where rich maps are generated through analysis of the crystal phase and orientation in the scanning electron microscope…
When exposure measurement error (EME), confounder measurement error (CME), or both are present, health effect estimates regarding exposure mixtures and critical exposure time-window may not represent the true effects. For example, in air…
Low voltage transmission electron microscopy (<=80 kV) has many applications in imaging beam-sensitive samples, such as metallic nanoparticles, which may become damaged at higher voltages. To improve resolution, spherical aberration can be…
Finding the distribution of vibro-acoustic energy in complex built-up structures in the mid-to-high frequency regime is a difficult task. In particular, structures with large variation of local wavelengths and/or characteristic scales pose…
The graph embedding (GE) methods have been widely applied for dimensionality reduction of hyperspectral imagery (HSI). However, a major challenge of GE is how to choose proper neighbors for graph construction and explore the spatial…
Contrast-Enhanced Ultra-Sound (CEUS) has become a viable method for non-invasive, dynamic visualization in medical diagnostics, yet Ultrasound Localization Microscopy (ULM) has enabled a revolutionary breakthrough by offering ten times…
In the first part of the paper a generalized theoretical approach towards beam coupling impedances and stretched-wire measurements is introduced. Applied to a circular symmetric setup, this approach allows to estimate the systematic…
We propose a novel Graph Neural Network-based method for segmentation based on data fusion of multimodal Scanning Electron Microscope (SEM) images. In most cases, Backscattered Electron (BSE) images obtained using SEM do not contain…
Image processing researchers commonly assert that "median filtering is better than linear filtering for removing noise in the presence of edges." Using a straightforward large-$n$ decision-theory framework, this folk-theorem is seen to be…