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Depth profiling of graphene with high-resolution ion beam analysis is a practical method for analysis of monolayer thicknesses of graphene. Not only is the energy resolution sufficient to resolve graphene from underlying SiC, but by use of…

Materials Science · Physics 2011-08-11 M. Copel , S. Oida , A. Kasry , A. A. Bol , J. B. Hannon , R. M. Tromp

Effects of electron-beam processing on the structure and mechanical properties of poly-ether-ether ketone (PEEK) were studied by XRD and tribological tests. An ambiguous change in the mechanical properties of the irradiated samples was…

We employ scanning probe microscopy to reveal atomic structures and nanoscale morphology of graphene-based electronic devices (i.e. a graphene sheet supported by an insulating silicon dioxide substrate) for the first time. Atomic resolution…

Materials Science · Physics 2008-11-05 Masa Ishigami , J. H. Chen , W. G. Cullen , M. S. Fuhrer , E. D. Williams

This contribution investigates the connection between Isogeometric Analysis (IgA) and the Partial Element Equivalent Circuit (PEEC) method for electrostatic problems. We demonstrate that using the spline-based geometry concepts from IgA…

Computational Engineering, Finance, and Science · Computer Science 2022-09-30 Riccardo Torchio , Maximilian Nolte , Sebastian Schöps , Albert E. Ruehli

Skeleton-based action recognition has achieved remarkable performance with the development of graph convolutional networks (GCNs). However, most of these methods tend to construct complex topology learning mechanisms while neglecting the…

Computer Vision and Pattern Recognition · Computer Science 2024-11-21 Zeyu Liang , Hailun Xia , Naichuan Zheng , Huan Xu

Low-energy electron microscopy (LEEM) was used to measure the reflectivity of low-energy electrons from graphitized SiC(0001). The reflectivity shows distinct quantized oscillations as a function of the electron energy and graphite…

Materials Science · Physics 2009-11-13 H. Hibino , H. Kageshima , F. Maeda , M. Nagase , Y. Kobayashi , H. Yamaguchi

The aim of this work is to investigate feasibility of the ion beam analysis techniques for monitoring swift heavy ion track formation. First, use of the in situ Rutherford backscattering spectroscopy in channeling mode to observe damage…

The irradiation behavior of graphite is essential for its applications in nuclear industry. However, the differences between graphite's behaviors are not well understood because of the very limited knowledge of microstructural differences…

Applied Physics · Physics 2021-03-12 Qing Huang , Xinqing Han , Peng Liu , Jianjian Li , Guanhong Lei , Cheng Li

We define a class of Euclidean distances on weighted graphs, enabling to perform thermodynamic soft graph clustering. The class can be constructed form the "raw coordinates" encountered in spectral clustering, and can be extended by means…

Machine Learning · Statistics 2010-09-15 François Bavaud

Graphite is an example of a layered material that can be bent to form fullerenes which promise important applications in electronic nanodevices. The spheroidal geometry of a slightly elliptically deformed sphere was used as a possible…

Materials Science · Physics 2009-11-13 R. Pincak

The existing combinatorial methods for iso-surface computation are efficient for pure visualization purposes, but it is known that the resulting iso-surfaces can have holes, and topological problems like missing or wrong connectivity can…

Computational Geometry · Computer Science 2014-02-14 Abdulaziz Ali , Dieter Bothe

Deep inelastic scattering at low x can be described by essentially only two fitted parameters. The interpretation of J/Psi photoproduction in terms of the gluon structure function is elaborated upon.

High Energy Physics - Phenomenology · Physics 2007-05-23 D. Schildknecht

The history-dependent behaviors of classical plasticity models are often driven by internal variables evolved according to phenomenological laws. The difficulty to interpret how these internal variables represent a history of deformation,…

Machine Learning · Computer Science 2023-01-04 Nikolaos N. Vlassis , WaiChing Sun

The irradiation represents a useful tool for determining the characteristics of defects in semiconductors as well as a method to evaluate their degradation, fact with important technological consequences. In this contribution, starting from…

Instrumentation and Detectors · Physics 2008-11-26 Sorina Lazanu , Ionel Lazanu

Beamstrahlung will constitute an important source of background in a pixel vertex detector at the future International Linear Collider. Electron and positron tracks of this origin impact the pixel planes at angles generally larger than…

Instrumentation and Detectors · Physics 2015-05-13 L. Maczewski , M. Adamus , J. Ciborowski , G. Grzelak , P. Luzniak P. Niezurawski A. Zarnecki

Experimental studies of microdosimetry in therapeutic ion beams have been performed using several detectors. The differences among them lie on the shapes, the site sizes, and the material. Coin-shaped solid-state detectors made of silicon…

Instrumentation and Detectors · Physics 2020-05-11 Giulio Magrin

Statistical models on infinite graphs may exhibit inhomogeneous thermodynamic behaviour at macroscopic scales. This phenomenon is of geometrical origin and may be properly described in terms of spectral partitions into subgraphs with well…

Statistical Mechanics · Physics 2015-06-24 R. Burioni , D. Cassi , C. Destri

We employ Faraday and Kerr effect spectroscopy in the infrared range to investigate the electronic structure of Ga1-xMnxAs near the Fermi energy. The band structure of this archetypical dilute-moment ferromagnetic semiconductor has been a…

Strongly Correlated Electrons · Physics 2015-05-13 G. Acbas , M. -H. Kim , M. Cukr , V. Novak , M. A. Scarpulla , O. D. Dubon , T. Jungwirth , Jairo Sinova , J. Cerne

The interplay between topological defects, such as dislocations or disclinations, and the electronic degrees of freedom in graphene has been extensively studied. In the literature, for the study of this kind of problems, it is in general…

Strongly Correlated Electrons · Physics 2023-06-07 Nicolás Fernández , Pierre Pujol , Mario Solís , Teofilo Vargas

An accurate description of spatial variations in the energy levels of patterned semiconductor substrates on the micron and sub-micron scale as a function of local doping is an important technological challenge for the microelectronics…

Materials Science · Physics 2017-03-31 N Barrett , L F Zagonel , O Renault , A Bailly