Related papers: Information in 4D-STEM: Where it is, and How to Us…
Here a new microscopic method is proposed to image and characterize very thin samples like few-layer materials, organic molecules, and nanostructures with nanometer or sub-nanometer resolution using electron beams of energies lower than 20…
Strain governs not only the mechanical response of materials but also their electronic, optical, and catalytic properties. For this reason, the measurement of the 3D strain field is crucial for a detailed understanding and for further…
Layered materials (LMs) are at the centre of an ever increasing research effort due to their potential use in a variety of applications. The presence of imperfections, such as bi- or multilayer areas, holes, grain boundaries, isotropic and…
3D Compton scattering imaging is an upcoming concept exploiting the scattering of photons induced by the electronic structure of the object under study. The so-called Compton scattering rules the collision of particles with electrons and…
Lorentz transmission electron microscopy (LTEM) is a powerful tool for high-resolution imaging of magnetic textures, including their dynamics under external stimuli and ultrafast nonequilibrium conditions. However, magnetic imaging is often…
Electronic charge transfer at the atomic scale can reveal fundamental information about chemical bonding, but is far more challenging to directly image than the atomic structure. The charge density is dominated by the atomic nuclei, with…
A real-time image reconstruction method for scanning transmission electron microscopy (STEM) is proposed. With an algorithm requiring only the center of mass (COM) of the diffraction pattern at one probe position at a time, it is able to…
The rigid-intensity-shift model of differential phase contrast scanning transmission electron microscopy (DPC-STEM) imaging assumes that the phase gradient imposed on the probe by the sample causes the diffraction pattern intensity to shift…
A unified method for three-dimensional reconstruction of objects from transmission images collected at multiple illumination directions is described. The method may be applicable to experimental conditions relevant to absorption-based,…
Here, we present a numerical post-processing method for removing the effect of anti-symmetric residual aberrations in high-resolution transmission electron microscopy (HRTEM) images of weakly scattering 2D-objects. The method is based on…
A forward model is presented to an inverse scattering problem that arises in the application of reflective Fourier ptychographic microscopy. The model allows us to determine the 3D distributions of refractive index for weakly scattering…
Diffraction tomography aims to recover an object's scattering potential from measured wave fields. In the classical setting, the object is illuminated by plane waves from many directions, and the Fourier diffraction theorem provides a…
Although defocus can be used to generate partial phase contrast in transmission electron microscope images, cryo-electron microscopy (cryo-EM) can be further improved by the development of phase plates which increase contrast by applying a…
In this paper, the scattering/transmission inside a step-modulated subwavelength metal slit is investigated in detail. We firstly investigate the scattering in a junction structure by two types of structural changes. The variation of…
We present annular dark field scanning transmission electron microscopy (ADF-STEM) as an efficient, fast, and non-destructive nanoscale tool for monitoring solid-state phase transition. Using metal-insulator transition in vanadium dioxide…
It has been argued that in atomic-resolution transmission electron microscopy (TEM) of sparse weakly scattering structures, such as small biological molecules, multiple electron scattering usually has only a small effect, while the…
Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a…
The recently developed information-theoretic approach to crystallographic symmetry classifications and quantifications in two dimensions (2D) from digital transmission electron and scanning probe microscope images is adapted for the…
Atomic-resolution scanning transmission electron microscopy (STEM) characterization requires precise tilting of the specimen to high symmetric zone axis, which is usually processed in reciprocal space by following the diffraction patterns.…
Electron microscopy is a powerful tool for visualizing the shapes of sub-nanometer objects. However, contrast is not in proportional to density distribution, and therefore achieving a quantitative understanding of specimens is not…