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Ultrafast electron diffraction/microscopy technique enables us to investigate the nonequilibrium dynamics of crystal structures in the femtosecond-nanosecond time domain. However, the electron diffraction intensities are in general…

Materials Science · Physics 2024-07-10 Toshiya Shiratori , Jumpei Koga , Takahiro Shimojima , Kyoko Ishizaka , Asuka Nakamura

Multi-pass transmission electron microscopy (MPTEM) has been proposed as a way to reduce damage to radiation-sensitive materials. For the field of cryo-electron microscopy (cryo-EM), this would significantly reduce the number of projections…

In this second part of a series we attempt to construct an empirical model that can mimick all experimental observations made regarding the role of an alternative interleaved scan pattern in STEM imaging on the beam damage in a specific…

Materials Science · Physics 2021-05-03 D. Jannis , A. Velazco , A. Béché , J. Verbeeck

Correctly perceiving micro-expression is difficult since micro-expression is an involuntary, repressed, and subtle facial expression, and efficiently revealing the subtle movement changes and capturing the significant segments in a…

Computer Vision and Pattern Recognition · Computer Science 2020-10-20 Jiateng Liu , Wenming Zheng , Yuan Zong

We develop new efficient online algorithms for detecting transient sparse signals in TEM video sequences, by adopting the recently developed framework for sequential detection jointly with online convex optimization [1]. We cast the problem…

Applications · Statistics 2017-11-01 Y. Cao , S. Zhu , Y. Xie , J. Key , J. Kacher , R. R. Unocic , C. M. Rouleau

The rigid-intensity-shift model of differential phase contrast scanning transmission electron microscopy (DPC-STEM) imaging assumes that the phase gradient imposed on the probe by the sample causes the diffraction pattern intensity to shift…

Instrumentation and Detectors · Physics 2018-04-25 L. Clark , H. G. Brown , D. M. Paganin , M. J. Morgan , T. Matsumoto , N. Shibata , T. C. Petersen , S. D. Findlay

On- and off-axis electron energy loss spectroscopy (EELS) is a powerful method for probing local electronic structure on single atom level. However, many materials undergo electron-beam induced transformation during the scanning…

Materials Science · Physics 2023-10-23 Kevin M. Roccapriore , Riccardo Torsi , Joshua Robinson , Sergei V. Kalinin , Maxim Ziatdinov

We introduce a novel reflection-mode diffraction tomography technique that enables simultaneous recovery of forward and backward scattering information for high-resolution 3D refractive index reconstruction. Our technique works by imaging a…

Optics · Physics 2025-02-12 Tongyu Li , Jiabei Zhu , Yi Shen , Lei Tian

Image rescaling aims to learn the optimal low-resolution (LR) image that can be accurately reconstructed to its original high-resolution (HR) counterpart, providing an efficient image processing and storage method for ultra-high definition…

Computer Vision and Pattern Recognition · Computer Science 2025-03-11 Ce Wang , Zhenyu Hu , Wanjie Sun , Zhenzhong Chen

Lattice strain measurement of nanoscale semiconductor devices is crucial for the semiconductor industry as strain substantially improves the electrical performance of transistors. High resolution scanning transmission electron microscopy…

We present annular dark field scanning transmission electron microscopy (ADF-STEM) as an efficient, fast, and non-destructive nanoscale tool for monitoring solid-state phase transition. Using metal-insulator transition in vanadium dioxide…

Despite advancements in electron backscatter diffraction (EBSD) detector speeds, the acquisition rates of 4-Dimensional (4D) EBSD data, i.e., a collection of 2-dimensional (2D) diffraction maps for every position of a convergent electron…

Signal Processing · Electrical Eng. & Systems 2023-08-02 Zoë Broad , Daniel Nicholls , Jack Wells , Alex W. Robinson , Amirafshar Moshtaghpour , Robert Masters , Louise Hughes , Nigel D. Browning

Understanding the relationship between atomic structure (order) and chemical composition (chemistry) is critical for advancing materials science, yet traditional spectroscopic techniques can be slow and damaging to sensitive samples.…

Materials Science · Physics 2025-08-29 Mridul Kumar , Yevgeny Rakita

The accuracy of the information that can be extracted from electron diffraction patterns is often limited by the presence of optical distortions. Existing distortion characterization techniques typically require knowledge of the reciprocal…

The achievable instrumental performance of a scanning transmission electron microscope (STEM) is determined by the size and shape of the incident electron probe. The most important optical factor in achieving the optimum probe profile is…

Materials Science · Physics 2020-09-01 Matthew Weyland , David A. Muller

Diffusion models have recently emerged as a powerful technique in image generation, especially for image super-resolution tasks. While 2D diffusion models significantly enhance the resolution of individual images, existing diffusion-based…

Computer Vision and Pattern Recognition · Computer Science 2024-11-27 Bohao Chen , Yanchao Zhang , Yanan Lv , Hua Han , Xi Chen

Efficient imaging of biomolecules, 2D materials and electromagnetic fields depends on retrieval of the phase of transmitted electrons. We demonstrate a method to measure phase in a scanning transmission electron microscope using a…

Image diffusion distillation achieves high-fidelity generation with very few sampling steps. However, applying these techniques directly to video diffusion often results in unsatisfactory frame quality due to the limited visual quality in…

Computer Vision and Pattern Recognition · Computer Science 2024-10-29 Yuanhao Zhai , Kevin Lin , Zhengyuan Yang , Linjie Li , Jianfeng Wang , Chung-Ching Lin , David Doermann , Junsong Yuan , Lijuan Wang

Scanning transmission electron microscopy (STEM) provides high-resolution visualization of atomic structures as well as various functional imaging modes utilizing phase contrast. In this study we introduce a semicircular aperture in STEM…

Analysis of distortions of the crystal lattice within individual mineral grains is central to the investigation of microscale processes that control and record tectonic events. These distortions are generally combinations of lattice…

Materials Science · Physics 2019-06-04 David Wallis , Lars N. Hansen , T. Ben Britton , Angus J. Wilkinson