Multi-pass transmission electron microscopy (MPTEM) has been proposed as a way to reduce damage to radiation-sensitive materials. For the field of cryo-electron microscopy (cryo-EM), this would significantly reduce the number of projections needed to create a 3D model and would allow the imaging of lower-contrast, more heterogeneous samples. We have designed a 10 keV proof-of-concept MPTEM. The column features fast-switching gated electron mirrors which cause each electron to interrogate the sample multiple times. A linear approximation for the multi-pass contrast transfer function (CTF) is developed to explain how the resolution depends on the number of passes through the sample.
@article{arxiv.1904.11064,
title = {Design for a 10 KeV Multi-Pass Transmission Electron Microscope},
author = {Stewart A. Koppell and Marian Mankos and Adam J. Bowman and Yonatan Israel and Thomas Juffmann and Brannon B. Klopfer and Mark A. Kasevich},
journal= {arXiv preprint arXiv:1904.11064},
year = {2019}
}