Related papers: Enhancing Test Efficiency through Automated ATPG-A…

Modern IC complexity drives test pattern growth, with the majority of patterns targeting a small set of hard-to-detect (HTD) faults. This motivates new ATPG algorithms to improve test effectiveness specifically for HTD faults. This paper…

The scan-based testing has been widely used as a Design-for-Test (DfT) mechanism for most recent designs. It has gained importance not only in manufacturing testing but also in online testing and debugging. However, the multiplexer-based…

Logic Locking is a well-accepted protection technique to enable trust in the outsourced design and fabrication processes of integrated circuits (ICs) where the original design is modified by incorporating additional key gates in the…

This paper presents LiFT, a lightweight, fully quantized 3D object detection algorithm for LiDAR data, optimized for real-time inference on FPGA platforms. Through an in-depth analysis of FPGA-specific limitations, we identify a set of…

The massive scale of modern AI accelerators presents critical challenges to traditional fault assessment methodologies, which face prohibitive computational costs and provide poor coverage of critical failure modes. This paper introduces…

Multi-site testing is a popular and effective way to increase test throughput and reduce test costs. We present a test throughput model, in which we focus on wafer testing, and consider parameters like test time, index time, abort-on-fail,…

The R&D activity presented is focused on the development of new modules for the upgrade of the ATLAS pixel system at the High Luminosity LHC (HL-LHC). The performance after irradiation of n-in-p pixel sensors of different active thicknesses…

Ptychography is a popular imaging technique that combines diffractive imaging with scanning microscopy. The technique consists of a coherent beam that is scanned across an object in a series of overlapping positions, leading to reliable and…

Manufacturers struggle to produce low-cost, robust and complex components at manufacturing lot-size one. Additive processes like Fused Filament Fabrication (FFF) inexpensively produce complex geometries, but defects limit viability in…

Visual Parameter-Efficient Fine-Tuning (PEFT) has become a powerful alternative for full fine-tuning so as to adapt pre-trained vision models to downstream tasks, which only tunes a small number of parameters while freezing the vast…

Existing parameter-efficient fine-tuning (PEFT) methods have achieved significant success on vision transformers (ViTs) adaptation by improving parameter efficiency. However, the exploration of enhancing inference efficiency during…

As the complexity of the scan algorithm is dependent on the number of design registers, large SoC scan designs can no longer be verified in RTL simulation unless partitioned into smaller sub-blocks. This paper proposes a methodology to…

We present a simple self-supervised method to enhance the performance of ViT features for dense downstream tasks. Our Lightweight Feature Transform (LiFT) is a straightforward and compact postprocessing network that can be applied to…

General aviation fault diagnosis and efficient maintenance are critical to flight safety; however, deploying deep learning models on resource-constrained edge devices poses dual challenges in computational capacity and interpretability.…

This paper provides a comprehensive review of mechanical equipment fault diagnosis methods, focusing on the advancements brought by Transformer-based models. It details the structure, working principles, and benefits of Transformers,…

As integrated circuit technologies continue to scale toward advanced process nodes, the continual reduction in node capacitance and supply voltage has made digital systems increasingly vulnerable to soft errors. Although traditional…

Test time adaptation (TTA) equips deep learning models to handle unseen test data that deviates from the training distribution, even when source data is inaccessible. While traditional TTA methods often rely on entropy as a confidence…

Transformers and large language models (LLMs), powered by the attention mechanism, have transformed numerous AI applications, driving the need for specialized hardware accelerators. A major challenge in these accelerators is efficiently…

The advanced complex electronic systems increasingly demand safer and more secure hardware parts. Correspondingly, fault injection became a major verification milestone for both safety- and security-critical applications. However, fault…

Robotic laboratory automation has traditionally relied on carefully engineered motion pipelines and task-specific hardware interfaces, resulting in high design cost and limited flexibility. While recent imitation learning techniques can…