Related papers: Inferring scattering-type Scanning Near-Field Opti…
Plasmonic nanoparticles generate strongly localized and enhanced light field through localized surface plasmon resonance, thereby playing a central role in plasmonics and nanophotonics. Because the optical properties of plasmonic…
Super-resolution microscopy, or nanoscopy, enables the use of fluorescent-based molecular localization tools to study molecular structure at the nanoscale level in the intact cell, bridging the mesoscale gap to classical structural biology…
A novel method for measuring the surface coverage of randomly distributed cylindrical nanoparticles such as nanorods and nanowires, using atomic force microscopy (AFM), is presented. The method offers several advantages over existing…
Analyzing atomically resolved images is a time-consuming process requiring solid experience and substantial human intervention. In addition, the acquired images contain a large amount of information such as crystal structure, presence and…
Tapping mode atomic force microscopy (AFM), also known as amplitude modulated (AM) or AC mode, is a proven, reliable and gentle imaging mode with widespread applications. Over the several decades that tapping mode has been in use,…
Three-dimensional atomic force microscopy (3D-AFM) has been a powerful tool to probe the atomic-scale structure of solid-liquid interfaces. As a nanoprobe moves along the 3D volume of interfacial liquid, the probe-sample interaction force…
Scanning near-field optical microscopy is one of the most effective techniques for spectroscopy of nanoscale systems. However, inferring optical constants from the measured near-field signal can be challenging because of a complicated and…
Imaging dynamical processes at interfaces and on the nanoscale is of great importance throughout science and technology. While light-optical imaging techniques often cannot provide the necessary spatial resolution, electron-optical…
We propose a scanning magnetic microscope which has a photoluminescence nanoprobe implanted in the tip of an AFM or STM, or NSOM, and exhibits optically detected magnetic resonance (ODMR). The proposed spin microscope has nanoscale lateral…
Spintronic devices offer a promising avenue for the development of nanoscale, energy-efficient artificial neurons for neuromorphic computing. It has previously been shown that with antiferromagnetic (AFM) oscillators, ultra-fast spiking…
Tapping mode atomic force microscopy is a standard technique for inspection and analysis at the nanometer scale. The understanding of the non-linear dynamics of the system due to the tip sample interaction is an important prerequisite for a…
We developed the models and algorithms to describe two main artefacts of AFM: (i) broadening effect and (ii) decreased heights of profiles for individual objects adsorbed on a hard substrate. It was shown how to measure elastic properties…
Apertureless scanning near-field optical microscopy (a-SNOM) is typically limited to ~10 nm resolution by the tip apex size. We demonstrate that ~1-nm resolution can be achieved under continuous-wave (CW) illumination by exploiting Fano…
In this work, we report the integration of an atomic force microscope (AFM) into a helium ion microscope (HIM). The HIM is a powerful instrument, capable of sub-nanometer resolution imaging and machining of nanoscale structures, while the…
The manipulation and control of nanoscale magnetic spin textures is of rising interest as they are potential foundational units in next-generation computing paradigms. Achieving this requires a quantitative understanding of the spin texture…
Widefield microscopy methods applied to optically thick specimens are faced with reduced contrast due to spatial crosstalk, in which the signal at each point is the result of a superposition from neighboring points that are simultaneously…
Scattering-type scanning near-field optical microscopy (s-SNOM) enables sub-diffraction spectroscopy, featuring high sensitivity to small spatial permittivity variations of the sample surface. However, due to the near-field probe-sample…
Scanning X-ray nanodiffraction microscopy is a powerful technique for spatially resolving nanoscale structural morphologies by diffraction contrast. One of the critical challenges in experimental nanodiffraction data analysis is posed by…
Well-ordered stepped semiconductor surfaces attract intense attention owing to the regular arrangements of their atomic steps that makes them perfect templates for the growth of one- dimensional systems, e.g. nanowires. Here, we report on…
Scanning probe microscopy is one of the most versatile windows into the nanoworld, providing imaging access to a variety of sample properties, depending on the probe employed. Tunneling probes map electronic properties of samples, magnetic…