Related papers: Inferring scattering-type Scanning Near-Field Opti…

Microscopy has been key to tremendous advances in science, technology, and medicine, revealing structure and dynamics across time and length scales. However, combining high spatial and temporal resolution in a non-invasive, label-free…

Here we report nonlinear focal modulation microscopy (NFOMM) to achieve super-resolution imaging. Abandoning the previous persistence on minimizing the size of Gaussian emission pattern by directly narrowing (e.g. Minimizing the detection…

Molecular self-assembly, the function of biomembranes, and the performance of organic solar cells rely on molecular interactions on the nanoscale. The understanding and design of such intrinsic or engineered heterogeneous functional soft…

Atomic Force Microscopy - Infrared (AFM-IR) spectroscopy allows spectroscopic studies in the mid-infrared spectral region with a spatial resolution better than 50 nm. We show that the high spatial resolution can be used to perform…

Extending super-resolution imaging techniques to objects hidden in strongly scattering media potentially revolutionize the technical analysis for much broader categories of samples, such as biological tissues. The main challenge is the…

Scanning electron microscopy (SEM) is indispensable in diverse applications ranging from microelectronics to food processing because it provides large depth-of-field images with a resolution beyond the optical diffraction limit. However,…

Atomic force microscopy (AFM) with molecule-functionalized tips has emerged as the primary experimental technique for probing the atomic structure of organic molecules on surfaces. Most experiments have been limited to nearly planar…

Since the invention of the atomic force microscope (AFM) in 1986, there has been a drive to apply this scanning probe technique or a form of this technique to various disciplines in nanoscale science. Magnetic force microscopy (MFM) is a…

Microscopies have become pillars of our characterization tools to observe biological systems and assemblies. Correlative and synchronous use of different microscopies relies on the fundamental assumption of non-interference during images…

Atomic force microscopy (AFM) enables high-resolution imaging and quantitative force measurement, which is critical for understanding nanoscale mechanical, chemical, and biological interactions. In dynamic AFM modes, however, interaction…

Atomic force microscopy (AFM) is one of the most promising methods for investigating the structure of materials at the micro and nanoscale levels, as well as their local physical-mechanical properties. The experimental data obtained with…

The atomic force microscope (AFM) is a versatile, high-resolution tool used to characterize the topography and material properties of a large variety of specimens at nano-scale. The interaction of the micro-cantilever tip with the specimen…

In this paper we consider the application of electromagnetic theory to the analysis of the Scanning Near-field Optical Microscope (SNOM) in order to predict experimentally observable quantities such as the transmission or reflection…

Efficient machine learning inference is essential for the rapid adoption of artificial intelligence across various domains.On-chip optical computing has emerged as a transformative solution for accelerating machine learning tasks, owing to…

The increasing use of two-dimensional (2D) materials in nanoelectronics demands robust metrology techniques for electrical characterization, especially for large-scale production. While atomic force microscopy (AFM) techniques like…

We propose a novel method for ultra-sensitive infrared (IR) vibrational spectroscopy of molecules with nanoscale footprints by combining the tip enhancement of the scattering-type scanning near-field optical microscope (s-SNOM) and the…

In recent years several methods to overcome diffraction limit in the far field microscopy have been demonstrated. Still the problem of superresolution is reliably solved only for fluorescent microscopy, giving a resolution of up to 20-30nm.…

We present the design and experimental results of a near-field scanning microwave microscope (NSMM) working at a frequency of 1GHz. Our microscope is unique in that the sensing probe is separated from the excitation electrode to…

Time-resolved scanning near-field optical microscopy (tr-SNOM) enables the measurement of the dynamic optical response of functional surfaces beyond the diffraction limit. Experimental challenges are imposed both by the use of a pulsed…

Structured metallic tips are increasingly important for optical spectroscopies such as tip-enhanced Raman spectroscopy (TERS), with plasmonic resonances frequently cited as a mechanism for electric field enhancement. We probe the local…