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In this study, we present an innovative methodology to classify quantum phases within the ANNNI (Axial Next-Nearest Neighbor Ising) model by combining Quantum Machine Learning (QML) techniques with the Shapley Additive Explanations (SHAP)…

Scattering scanning near-field optical microscopy (s-SNOM) is a promising technique for overcoming Abbe diffraction limit and substantially enhancing the spatial resolution in spectroscopic imaging. The s-SNOM works by exposing an atomic…

Quantum Physics · Physics 2024-03-22 Soheil Khajavi , Zahra Shaterzadeh-Yazdi , Ali Eghrari , Mohammad Neshat

Tapping mode atomic force microscopy is a standard technique for inspection and analysis at the nanometer scale. The understanding of the non-linear dynamics of the system due to the tip sample interaction is an important prerequisite for a…

Instrumentation and Detectors · Physics 2007-05-23 Robert W. Stark

Here, we review the basic concepts and applications of the phase-field-crystal (PFC) method, which is one of the latest simulation methodologies in materials science for problems, where atomic- and microscales are tightly coupled. The PFC…

Field ion microscopy (FIM) allows to image individual surface atoms by exploiting the effect of an intense electric field. Widespread use of atomic resolution imaging by FIM has been hampered by a lack of efficient image processing/data…

Rapid construction of phase diagrams is a central tenet of combinatorial materials science with accelerated materials discovery efforts often hampered by challenges in interpreting combinatorial x-ray diffraction datasets, which we address…

This study presents an advanced numerical framework that integrates experimentally acquired Atomic Force Microscope (AFM) data into high-fidelity simulations for adhesive rough contact problems, bridging the gap between experimental physics…

Computational Engineering, Finance, and Science · Computer Science 2025-04-04 Maria Rosaria Marulli , Jacopo Bonari , Pasqualantonio Pingue , Marco Paggi

The frequency-domain approach (FDA) to transient analysis of the boundary element method, although is appealing for engineering applications, is computationally expensive. This paper proposes a novel adaptive frequency sampling (AFS)…

Numerical Analysis · Mathematics 2016-02-09 Jinyou Xiao , Junjie Rong , Wenjing Ye , Chuanzeng Zhang

Accurate and efficient characterization of nanoparticles (NPs), particularly regarding particle size distribution, is essential for advancing our understanding of their structure-property relationships and facilitating their design for…

Materials Science · Physics 2024-10-03 Arda Genc , Justin Marlowe , Anika Jalil , Libor Kovarik , Phillip Christopher

Atomic-resolution imaging on molten metal/solid interfaces at temperatures above 200 {\deg}C was achieved using a high-temperature, high-speed atomic force microscope (AFM) equipped with a qPlus sensor. A tip-scanning high-speed Quadpod…

Instrumentation and Detectors · Physics 2026-04-08 Yuto Nishiwaki , Toru Utsunomiya , Takashi Ichii

Directly imaging all atoms constituting a material and, maybe more importantly, crystalline defects that dictate materials' properties, remains a formidable challenge. Here, we propose a new approach to chemistry-sensitive field-ion…

Efforts to map atomic-scale chemistry at low doses with minimal noise using electron microscopes are fundamentally limited by inelastic interactions. Here, fused multi-modal electron microscopy offers high signal-to-noise ratio (SNR)…

Recent advances in mechanical-diode based ultrasonic force microscopy techniques are reviewed. The potential of Ultrasonic Force Microscopy (UFM) for the study of material elastic properties is explained in detail. Advantages of the…

Applied Physics · Physics 2019-01-23 M. Teresa Cuberes

In this work, we report the integration of an atomic force microscope (AFM) into a helium ion microscope (HIM). The HIM is a powerful instrument, capable of sub-nanometer resolution imaging and machining of nanoscale structures, while the…

Instrumentation and Detectors · Physics 2020-04-02 Santiago H. Andany , Gregor Hlawacek , Stefan Hummel , Charlène Brillard , Mustafa Kangül , Georg E. Fantner

Fourier ptychographic microscopy (FPM) is a recently developed imaging modality that uses angularly varying illumination to extend a system performance beyond the limit defined by its optical elements. The FPM technique applies a novel…

Optics · Physics 2014-05-02 Xiaoze Ou , Roarke Horstmeyer , Changhuei Yang , Guoan Zheng

The near-field scanning optical microscopic (NSOM) imaging of Au nanoparticles with size in the sub-wavelength limit (<wavelength/2N.A.) is reported. The NSOM imaging technique can resolve the objects which is beyond the scope of optical…

Materials Science · Physics 2017-05-23 Prajit Dhara , A. K. Sivadasan

Knowledge of surface forces is the key to understanding a large number of processes in fields ranging from physics to material science and biology. The most common method to study surfaces is dynamic atomic force microscopy (AFM). Dynamic…

Mesoscale and Nanoscale Physics · Physics 2013-02-06 Daniel Platz , Daniel Forchheimer , Erik A. Tholen , David B. Haviland

The detection of special nuclear materials (SNM) in commercial cargoes is a major objective in the field of nuclear security. In this work we investigate the use of two-neutron time-correlations from photo-fission using the Prompt Neutrons…

Instrumentation and Detectors · Physics 2019-02-04 R. A. Soltz , A. Danagoulian , E. P. Hartouni , M. S. Johnson , S. A. Sheets , A. Glenn , S. E. Korbly , R. J. Ledoux

Amorphous, glass, and glass-ceramic materials practically always include a significant number (more than eight) of crystalline phases, with the contents of the latter ranging from a few wt.% to several hundredths or tenths of wt.%. The…

Atom probe tomography (APT) is a burgeoning characterization technique that provides compositional mapping of materials in three-dimensions at near-atomic scale. Since its significant expansion in the past 30 years, we estimate that one…

Materials Science · Physics 2025-04-22 Yue Li , Ye Wei , Alaukik Saxena , Markus Kühbach , Christoph Freysoldt , Baptiste Gault