Related papers: Pink-Beam Dark Field X-ray Microscopy: Expanding 3…
Diffraction pattern analysis can be used to reveal the crystalline structure of materials, and this information is used to nano- and micro-structure of advanced engineering materials that enable modern life. For nano-structured materials…
Diffraction Anomalous Fine Structure (DAFS) spectroscopy uses resonant elastic x-rays scattering as an atomic, shell and site selective probe that gives information on the electronic structure and the local atomic environment as well as on…
Despite its wide use in medicine, ultrasound imaging faces several challenges related to its poor signal-to-noise ratio and several sources of noise and artefacts. Enhancing ultrasound image quality involves balancing concurrent factors…
It is a challenge for Phase Measurement Profilometry (PMP) to measure objects with a large range of reflectivity variation across the surface. Saturated or dark pixels in the deformed fringe patterns captured by the camera will lead to…
Microstructure characterisation has been greatly enhanced through the use of electron backscatter diffraction (EBSD), where rich maps are generated through analysis of the crystal phase and orientation in the scanning electron microscope…
Laser powder bed fusion (L-PBF) is a widely recognized additive manufacturing technology for producing intricate metal components with exceptional accuracy. A key challenge in L-PBF is the formation of complex microstructures affecting…
Powder X-ray diffraction (pXRD) experiments are a cornerstone for materials structure characterization. Despite their widespread application, analyzing pXRD diffractograms still presents a significant challenge to automation and a…
Manipulating transparent objects presents significant challenges due to the complexities introduced by their reflection and refraction properties, which considerably hinder the accurate estimation of their 3D shapes. To address these…
Non-destructive nano-imaging of the internal structure of solid matter is only feasible using hard X-rays due to their high penetration. The highest resolution images are achieved at synchrotron radiation sources (SRF), offering superior…
We introduce a single-frame diffractive imaging method called randomized probe imaging (RPI). In RPI, a sample is illuminated by a structured probe field containing speckles smaller than the sample's typical feature size. Quantitative…
Scanning transmission electron microscopy (STEM) has a broad range of applications in materials characterization, including real-space imaging, spectroscopy, and diffraction, at length scales from the micron to sub-{\AA}ngstr\"om. The…
Coherent X-ray diffraction microscopy is a method of imaging non-periodic isolated objects at resolutions only limited, in principle, by the largest scattering angles recorded. We demonstrate X-ray diffraction imaging with high resolution…
Localization microscopy enables imaging with resolutions that surpass the conventional optical diffraction limit. Notably, the MINFLUX method achieves super-resolution by shaping the excitation point-spread function (PSF) to minimize the…
Despite the huge advancement in knowledge discovery and data mining techniques, the X-ray diffraction (XRD) analysis process has mostly remained untouched and still involves manual investigation, comparison, and verification. Due to the…
A lens performs an approximately one-to-one mapping from the object to the image planes. This mapping in the image plane is maintained within a depth of field (or referred to as depth of focus, if the object is at infinity). This…
Molecular fluorescence microscopy is a leading approach to super-resolution and nanoscale imaging in life and material sciences. However, super-resolution fluorescence microscopy is often bottlenecked by system-specific calibrations and…
The rapid development of nanoscience and nanotechnology in the last two decades was stimulated by the emergence of scanning probe microscopy (SPM) techniques capable of accessing local material properties, including transport, mechanical,…
Diffusion models can be used as learned priors for solving various inverse problems. However, most existing approaches are restricted to linear inverse problems, limiting their applicability to more general cases. In this paper, we build…
X-ray beams with orbital angular momentum (OAM) are a promising tool for x-ray characterization techniques. Beams with OAM have a helicity--an azimuthally varying phase--which leads to a gradient of the light field. New material properties…
Diffusion Probabilistic Models (DPMs) have recently been employed for image deblurring, formulated as an image-conditioned generation process that maps Gaussian noise to the high-quality image, conditioned on the blurry input.…