Related papers: Simulation-based Super-Resolution EBSD for Measure…
With the decreasing sizes of integrated-circuit components, the semiconductor industry is in growing need of high-throughput strain mapping techniques that offer high precision and spatial resolution, with desired industry goals of…
Ultrafast electron diffraction (UED) instruments typically operate at kHz or lower repetition rates and rely on indirect detection of electrons. However, these experiments encounter limitations because they are required to use electron…
The combination of the high-order accurate spectral difference discretization on unstructured grids with subgrid-scale modelling is investigated for large eddy simulation of a muffler at Re = 4.64 10^4 and low Mach number. The subgrid-scale…
To obtain the best resolution for any measurement there is an ever-present challenge to achieve maximal differentiation between signal and noise over as fine of sampling dimensions as possible. In diffraction science these issues are…
The microscopic distribution of strain and stress plays a crucial role for the performance, safety, and lifetime of components in aeronautics, automotive and critical infrastructure [1]. While non-destructive methods for measuring the…
The present article proposes a data analysis method for experimentally-derived measurements, which consists of an auto-optimization procedure and a sensitivity analysis. The method was applied to the results of a total-reflection…
We study spectral algorithms in the setting where kernels are learned from data. We introduce the effective span dimension (ESD), an alignment-sensitive complexity measure that depends jointly on the signal, spectrum, and noise level…
Ultrafast electron diffraction (UED) is a powerful method for studying time-resolved structural changes. Currently, space charge induced temporal broadening prevents obtaining high brightness electron pulses with sub-100 fs durations…
There has been immense progress recently in the visual quality of Stable Diffusion-based Super Resolution (SD-SR). However, deploying large diffusion models on computationally restricted devices such as mobile phones remains impractical due…
We couple a laser-based, space-resolved dynamic light scattering apparatus to a universal testing machine for mechanical extensional tests. We perform simultaneous optical and mechanical measurements on polyether ether ketone, a…
High-throughput analysis of multidimensional transmission electron microscopy (TEM) datasets remains a significant challenge, limiting the broader impact on strategic materials research. Conventional workflows typically involve sequential,…
Active stereovision systems for the 3D measurement of surfaces rely on the sequential projection of different fringe patterns onto the scene to robustly and accurately generate 3D surface data. This limits the temporal resolution to the…
We demonstrate a neutron tomography technique with sub-micrometer spatial resolution. Our method consists of measuring neutron diffraction spectra using a double crystal diffractometer as a function of sample rotation and then using a phase…
Scanning precession electron diffraction (SPED) is a powerful technique for investigating strain. While extensive literature exists analysing strain under high convergence angle conditions there are few systematic studies describing work…
Material processing with femtosecond lasers has attracted enormous attention because of its potential for technology and industrial applications. In parallel, time-resolved x-ray diffraction has been successfully used to study ultrafast…
Microwave reflectance probed photoconductivity (or $\mu$-PCD) measurement represents a contactless and non-invasive method to characterize impurity content in semiconductors. Major drawbacks of the method include a difficult separation of…
Accurately indexing pseudosymmetric materials has long proven challenging for electron backscatter diffraction. The recent emergence of intensity-based indexing approaches promises an enhanced ability to resolve pseudosymmetry compared to…
The locally varying tetragonality in martensite grains of a high-carbon steel (1.2 mass percent C) was resolved by electron backscatter diffraction (EBSD) with a spatial resolution in the order of 100nm. Compared to spatially integrating…
Compressed sensing can increase resolution, and decrease electron dose and scan time of electron microscope point-scan systems with minimal information loss. Building on a history of successful deep learning applications in compressed…
As opposed to metasurfaces, metagratings represent themselves sparse arrangements of scatterers. Established rigorous analytical models allow metagratings to overcome performance of metasurfaces in beam steering applications while handling…