English
Related papers

Related papers: Quantifying Phase Magnitudes of Open-Source Focuse…

200 papers

This paper discusses the reconstruction of partially sampled spectrum-images to accelerate the acquisition in scanning transmission electron microscopy (STEM). The problem of image reconstruction has been widely considered in the literature…

Image and Video Processing · Electrical Eng. & Systems 2020-02-05 Etienne Monier , Thomas Oberlin , Nathalie Brun , Xiaoyan Li , Marcel Tencé , Nicolas Dobigeon

In photon upconverting core-shell nanoparticles, structure strongly dictates performance. Conventional imaging in scanning transmission electron microscopy has sufficient resolution to probe the atomic structure of these nanoparticles, but…

Atomic-resolution imaging with scanning transmission electron microscopy is a powerful tool for characterizing the nanoscale structure of materials, in particular features such as defects, local strains, and symmetry-breaking distortions.…

We study an approach to solving the phase retrieval problem as it arises in a phase-less imaging modality known as ptychography. In ptychography, small overlapping sections of an unknown sample (or signal, say $x_0\in \mathbb{C}^d$) are…

Numerical Analysis · Mathematics 2019-10-09 Brian Preskitt , Rayan Saab

In the scanning transmission electron microscope, both phase imaging of beam-sensitive materials and characterisation of a material's functional properties using in-situ experiments are becoming more widely available. As the practicable…

Materials Science · Physics 2024-09-20 Julie Marie Bekkevold , Jonathan J. P. Peters , Ryo Ishikawa , Naoya Shibata , Lewys Jones

We present \code{phaser}, an open-source Python package that provides a unified interface to both conventional and gradient descent-based ptychographic algorithms. Features such as mixed-state probe, probe position correction, and…

Computational Physics · Physics 2025-07-21 Colin Gilgenbach , Menglin Zhu , James M. LeBeau

The use of differential phase contrast (DPC) in scanning transmission electron microscopy (STEM) has shown much promise for directly investigating the functional properties of a material system, leveraging the natural coupling between the…

Materials Science · Physics 2025-12-04 Rafael V. Ferreira , Sebastian Calderon V. , Paulo J. Ferreira

Electron ptychography has recently achieved unprecedented resolution, offering valuable insights across diverse material systems, including in three dimensions. However, high-quality ptychographic reconstruction is computationally expensive…

Materials Science · Physics 2025-08-07 Chia-Hao Lee , Steven E. Zeltmann , Dasol Yoon , Desheng Ma , David A. Muller

Three-dimensional atomic resolution imaging using transmission electron microscopes is a unique capability that requires challenging experiments. Linear electron tomography methods are limited by the missing wedge effect, requiring a high…

Computational Physics · Physics 2024-07-30 Shengboy You , Andrey Romanov , Philipp Pelz

X-ray near field holography has proven to be a powerful 2D and 3D imaging technique with applications ranging from biomedical research to material sciences. To reconstruct meaningful and quantitative images from the measurement intensities,…

Image and Video Processing · Electrical Eng. & Systems 2024-03-04 Jens Lucht , Leon M. Lohse , Thorsten Hohage , Tim Salditt

We consider the imaging problem of the reconstruction of a three-dimensional object via optical diffraction tomography under the assumptions of the Born approximation. Our focus lies in the situation that a rigid object performs an…

Numerical Analysis · Mathematics 2024-07-11 Robert Beinert , Michael Quellmalz

Scanning transmission electron microscopy (STEM) is the most widespread adopted tool for atomic scale characterization of two-dimensional (2D) materials. Many 2D materials remain susceptible to electron beam damage, despite the standardized…

Materials Science · Physics 2021-08-11 Sytze de Graaf , Majid Ahmadi , Ivan Lazić , Eric G. T. Bosch , Bart J. Kooi

4D-STEM, in which the 2D diffraction plane is captured for each 2D scan position in the scanning transmission electron microscope (STEM) using a pixelated detector, is complementing and increasingly replacing existing imaging approaches.…

Instrumentation and Detectors · Physics 2022-07-27 Colum M. O'Leary , Benedikt Haas , Christoph T. Koch , Peter D. Nellist , Lewys Jones

Electron ptychography describes a family of algorithms which are used to enable the reconstruction of complex specimen transmission functions of a sample in order to obtain both phase and amplitude information, as applied within the realms…

Optics · Physics 2025-03-17 L. Clark , P. D. Nellist

Phase retrieval is a nonlinear inverse problem that arises in a wide range of imaging modalities, from electron microscopy to Fourier ptychography. In particular, the reconstruction is facilitated when the sensing matrix is i.i.d. random,…

The technique known as 4D-STEM has recently emerged as a powerful tool for the local characterization of crystalline structures in materials, such as cathode materials for Li-ion batteries or perovskite materials for photovoltaics. However,…

A real-time image reconstruction method for scanning transmission electron microscopy (STEM) is proposed. With an algorithm requiring only the center of mass (COM) of the diffraction pattern at one probe position at a time, it is able to…

Materials Science · Physics 2021-12-15 Chu-Ping Yu , Thomas Friedrich , Daen Jannis , Sandra Van Aert , Johan Verbeeck

Coded-illumination can enable quantitative phase microscopy of transparent samples with minimal hardware requirements. Intensity images are captured with different source patterns and a non-linear phase retrieval optimization reconstructs…

Signal Processing · Electrical Eng. & Systems 2019-02-07 Michael R. Kellman , Emrah Bostan , Nicole Repina , Laura Waller

Characterizing the phase space distribution of particle beams in accelerators is a central part of accelerator understanding and performance optimization. However, conventional reconstruction-based techniques either use simplifying…

Scanning transmission electron microscopy (STEM) has a broad range of applications in materials characterization, including real-space imaging, spectroscopy, and diffraction, at length scales from the micron to sub-{\AA}ngstr\"om. The…

Instrumentation and Detectors · Physics 2022-06-07 Bryan D Esser , Joanne Etheridge