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An exact analytical solution based on the method of images has been obtained for the description of the electrostatic field in the system comrising of atomic force microscope (AFM)tip, dielectric, and conductor. The solution provides a step…

Materials Science · Physics 2007-05-23 Sergei F. Lyuksyutov , Ruslan A. Sharipov , Grigori Sigalov , Pavel B Paramonov

The behavior of ferroelectricity at the nanoscale is the focus of increasing research activity because of intense interest in the fundamental nature of spontaneous order in condensed-matter systems and because of the many practical…

Ferroelectric materials possess spontaneous polarization that can be used for multiple applications. Owing to a long term development for reducing the sizes of devices, the preparation of ferroelectric materials and devices are entering…

Electron tomography offers important three-dimensional (3D) structural information which cannot be observed by two-dimensional imaging. By combining annular dark field scanning transmission electron microscopy (ADF-STEM) with aberration…

Materials Science · Physics 2023-06-29 Juhyeok Lee , Moosung Lee , YongKeun Park , Colin Ophus , Yongsoo Yang

Atomic force microscopy (AFM) is widely used to measure surface topography of solid, soft, and living matter at the nanoscale. Moreover, by mapping forces as a function of distance to the surface, AFM can provide a wealth of information…

Cryo-electron microscopy (cryo-EM) is a powerful technique in structural biology and drug discovery, enabling the study of biomolecules at high resolution. Significant advancements by structural biologists using cryo-EM have led to the…

Biomolecules · Quantitative Biology 2024-12-05 Yi Zhou , Yilai Li , Jing Yuan , Quanquan Gu

Atomic Force Microscopy (AFM) has a great potential as a tool to characterize mechanical and morphological properties of living cells; these properties have been shown to correlate with cells' fate and patho-physiological state in view of…

Soft Condensed Matter · Physics 2017-06-21 Luca Puricelli , Massimiliano Galluzzi , Carsten Schulte , Alessandro Podestà , Paolo Milani

Scanning transmission electron microscopy (STEM) has advanced rapidly in the last decade thanks to the ability to correct the major aberrations of the probe forming lens. Now atomic-sized beams are routine, even at accelerating voltages as…

A realization of the force-induced remnant magnetization spectroscopy (FIRMS) technique of specific biomolecular binding is presented where detection is accomplished with wide-field optical and diamond-based magnetometry using an ensemble…

Instrumentation and Detectors · Physics 2020-01-08 Sean Lourette , Lykourgos Bougas , Metin Kayci , Shoujun Xu , Dmitry Budker

We use a numerical electromagnetic simulation software to investigate a filtering device consisting of a small dimensional microstrips embedded with a thin layer of ferromagnetic material and we compare our results to experimental results.…

Materials Science · Physics 2008-02-20 Jonah N. Gollub , Bijoy Kuanr , Zibigniew Celinski , Robert Camley , David R. Smith

Direct observation of nanoscale transformations in three dimensions (3D) is essential for understanding materials evolution under operating conditions, yet dynamic electron tomography remains limited by slow tilt series acquisition and by…

Understanding and manipulating two-dimensional materials for real-world applications remains challenging due to a lack of effective and high-throughput characterization techniques. Soft X-ray time-of-flight photoemission electron microscopy…

Materials Science · Physics 2025-12-22 Aashwin Mishra , Daniel Ratner , Quynh Nguyen

The magnetic properties of arrays of nanowires (NWs) and nanotubes (NTs), 150 nm in diameter, electrodeposited inside nanoporous polycarbonate membranes are investigated. The comparison of the nanoscopic magnetic force microscopy (MFM)…

Materials Science · Physics 2014-07-30 M. R. Tabasum , F. Zighem , J. De La Torre Medina , A. Encinas , L. Piraux , B. Nysten

Electrostatic forces are among the most common interactions in nature and omnipresent at the nanoscale. Scanning probe methods represent a formidable approach to study these interactions locally. The lateral resolution of such images is,…

Mesoscale and Nanoscale Physics · Physics 2023-12-22 Christian Wagner , F. Stefan Tautz

Hafnium oxide (HfO2)-based ferroelectrics offer remarkable promise for memory and logic devices in view of their compatibility with traditional silicon CMOS technology, high switchable polarization, good endurance and thickness scalability.…

Applied Physics · Physics 2020-04-29 Liam Collins , Umberto Celano

Despite decades of research, the ultimate goal of nanotechnology--top-down manipulation of individual atoms--has been directly achieved with only one technique: scanning probe microscopy. In this Review, we demonstrate that scanning…

*To be published in Springer Handbook of Surface Science (Springer Verlag) [Preprint]* The capability to display images containing chemical, magnetic and structural information and to perform spectroscopy and diffraction from a {\mu}m-sized…

Mesoscale and Nanoscale Physics · Physics 2018-12-06 Alessandro Sala

Ferroelectric thin films present a powerful platform for next generation computing and memory applications. However, domain morphology and dynamics in buried ferroelectric stacks have remained underexplored, despite the importance for real…

Materials Science · Physics 2025-08-29 Megan O. Hill Landberg , Bixin Yan , Huaiyu Chen , Efe Ipek , Morgan Trassin , Jesper Wallentin

Characterization and control of the transverse phase space of high-brightness electron beams is required at free-electron lasers or electron diffraction experiments for emittance measurement and beam optimization as well as at advanced…

Electrical and electromagnetic (EM) methods can be diagnostic geophysical imaging tools for monitoring applications, such as carbon capture and storage or hydraulic fracturing. In these settings, it is common that steel-cased wells and…

Geophysics · Physics 2022-03-29 Lindsey J. Heagy , Douglas W. Oldenburg
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