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Related papers: Defect Detection Network In PCB Circuit Devices Ba…

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With the high density of printed circuit board (PCB) design and the high speed of production, the traditional PCB defect detection model is difficult to take into account the accuracy and computational cost, and cannot meet the requirements…

Computer Vision and Pattern Recognition · Computer Science 2025-07-24 Li Pingzhen , Xu Sheng , Chen Jing , Su Chengyue

With the rapid growth of the PCB manufacturing industry, there is an increasing demand for computer vision inspection to detect defects during production. Improving the accuracy and generalization of PCB defect detection models remains a…

Computer Vision and Pattern Recognition · Computer Science 2024-07-23 Bowen Liu , Dongjie Chen , Xiao Qi

The integration of large-scale circuits and systems emphasizes the importance of automated defect detection of electronic components. The YOLO image detection model has been used to detect PCB defects and it has become a typical AI-assisted…

Computer Vision and Pattern Recognition · Computer Science 2025-07-08 Hengyi Zhu , Linye Wei , He Li

To coupe with the difficulties in the process of inspection and classification of defects in Printed Circuit Board (PCB), other researchers have proposed many methods. However, few of them published their dataset before, which hindered the…

Computer Vision and Pattern Recognition · Computer Science 2019-01-25 Weibo Huang , Peng Wei

This paper addresses the critical bottleneck of infrared (IR) data scarcity in Printed Circuit Board (PCB) defect detection by proposing a cross-modal data augmentation framework integrating CycleGAN and YOLOv8. Unlike conventional methods…

Computer Vision and Pattern Recognition · Computer Science 2026-05-05 Chao Yang , Haoyuan Zheng , Yue Ma

In semiconductor manufacturing, the wafer dicing process is central yet vulnerable to defects that significantly impair yield - the proportion of defect-free chips. Deep neural networks are the current state of the art in (semi-)automated…

Computer Vision and Pattern Recognition · Computer Science 2024-07-31 Zhining Hu , Tobias Schlosser , Michael Friedrich , André Luiz Vieira e Silva , Frederik Beuth , Danny Kowerko

In the photolithographic process vital to semiconductor manufacturing, various types of defects appear during EUV pattering. Due to ever-shrinking pattern size, these defects are extremely small and cause false or missed detection during…

Since the defect detection of conventional industry components is time-consuming and labor-intensive, it leads to a significant burden on quality inspection personnel and makes it difficult to manage product quality. In this paper, we…

Computer Vision and Pattern Recognition · Computer Science 2025-10-07 Wei-Lung Mao , Chun-Chi Wang , Po-Heng Chou , Yen-Ting Liu

This article compares the performance of six prominent object detection algorithms, YOLOv11, RetinaNet, Fast R-CNN, YOLOv8, RT-DETR, and DETR, on the NEU-DET surface defect detection dataset, comprising images representing various metal…

Computer Vision and Pattern Recognition · Computer Science 2025-10-28 Arpan Maity , Tamal Ghosh

Insulators are crucial insulation components and structural supports in power grids, playing a vital role in the transmission lines. Due to temperature fluctuations, internal stress, or damage from hail, insulators are prone to injury.…

Computer Vision and Pattern Recognition · Computer Science 2025-02-12 Zhenyue Wang , Guowu Yuan , Hao Zhou , Yi Ma , Yutang Ma , Dong Chen

In recent years, Printed Circuit Boards (PCB) have become the backbone of a large number of consumer electronic devices leading to a surge in their production. This has made it imperative to employ automatic inspection systems to identify…

Computer Vision and Pattern Recognition · Computer Science 2013-10-25 Sahil Sikka , Karan Sikka , M. K. Bhuyan , Yuji Iwahori

The field of object detection using Deep Learning (DL) is constantly evolving with many new techniques and models being proposed. YOLOv7 is a state-of-the-art object detector based on the YOLO family of models which have become popular for…

Computer Vision and Pattern Recognition · Computer Science 2023-06-08 Enrique Dehaerne , Bappaditya Dey , Sandip Halder , Stefan De Gendt

Steel pipes are widely used in high-risk and high-pressure scenarios such as oil, chemical, natural gas, shale gas, etc. If there is some defect in steel pipes, it will lead to serious adverse consequences. Applying object detection in the…

Computer Vision and Pattern Recognition · Computer Science 2021-11-23 Dingming Yang , Yanrong Cui , Zeyu Yu , Hongqiang Yuan

Surface defects on Printed Circuit Boards (PCBs) directly compromise product reliability and safety. However, achieving high-precision detection is challenging because PCB defects are typically characterized by tiny sizes, high texture…

Computer Vision and Pattern Recognition · Computer Science 2026-01-19 Meng Han

Anomaly detection is nowadays increasingly used in industrial applications and processes. One of the main fields of the appliance is the visual inspection for surface anomaly detection, which aims to spot regions that deviate from…

Computer Vision and Pattern Recognition · Computer Science 2026-03-10 Niccolò Ferrari , Michele Fraccaroli , Evelina Lamma

The escalating economic losses in agriculture due to deer intrusion, estimated to be in the hundreds of millions of dollars annually in the U.S., highlight the inadequacy of traditional mitigation strategies such as hunting, fencing, use of…

Computer Vision and Pattern Recognition · Computer Science 2026-03-27 Bishal Adhikari , Jiajia Li , Eric S. Michel , Jacob Dykes , Te-Ming Paul Tseng , Mary Love Tagert , Dong Chen

In this paper, we propose a YOLO-based deep learning (DL) model for automatic defect detection to solve the time-consuming and labor-intensive tasks in industrial manufacturing. In our experiments, the images of metal sheets are used as the…

Computer Vision and Pattern Recognition · Computer Science 2025-10-06 Po-Heng Chou , Chun-Chi Wang , Wei-Lung Mao

Mass-produced optical lenses often exhibit defects that alter their scattering properties and compromise quality standards. Manual inspection is usually adopted to detect defects, but it is not recommended due to low accuracy, high error…

Computer Vision and Pattern Recognition · Computer Science 2025-02-12 Habib Yaseen

This paper proposes a novel fault diagnosis approach based on generative adversarial networks (GAN) for imbalanced industrial time series where normal samples are much larger than failure cases. We combine a well-designed feature extractor…

Machine Learning · Computer Science 2022-06-17 Wenqian Jiang , Cheng Cheng , Beitong Zhou , Guijun Ma , Ye Yuan

Printed Circuit boards (PCBs) are one of the most important stages in making electronic products. A small defect in PCBs can cause significant flaws in the final product. Hence, detecting all defects in PCBs and locating them is essential.…

Image and Video Processing · Electrical Eng. & Systems 2020-08-31 Saeed Khalilian , Yeganeh Hallaj , Arian Balouchestani , Hossein Karshenas , Amir Mohammadi
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