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This paper summarizes our work on experimentally characterizing, mitigating, and recovering read disturb errors in multi-level cell (MLC) NAND flash memory, which was published in DSN 2015, and examines the work's significance and future…

Hardware Architecture · Computer Science 2018-05-10 Yu Cai , Yixin Luo , Saugata Ghose , Erich F. Haratsch , Ken Mai , Onur Mutlu

3D NAND flash memory with advanced multi-level cell techniques provides high storage density, but suffers from significant performance degradation due to a large number of read-retry operations. Although the read-retry mechanism is…

Hardware Architecture · Computer Science 2021-04-21 Jisung Park , Myungsuk Kim , Myoungjun Chun , Lois Orosa , Jihong Kim , Onur Mutlu

3D NAND flash memory with advanced multi-level cell techniques provides high storage density, but suffers from significant performance degradation due to a large number of read-retry operations. Although the read-retry mechanism is…

Hardware Architecture · Computer Science 2021-03-15 Jisung Park , Myungsuk Kim , Myoungjun Chun , Lois Orosa , Jihong Kim , Onur Mutlu

Raw bit errors are common in NAND flash memory and will increase in the future. These errors reduce flash reliability and limit the lifetime of a flash memory device. We aim to improve flash reliability with a multitude of low-cost…

Hardware Architecture · Computer Science 2018-08-16 Yixin Luo

A primary source of increased read time on NAND flash comes from the fact that in the presence of noise, the flash medium must be read several times using different read threshold voltages for the decoder to succeed. This paper proposes an…

Information Theory · Computer Science 2022-02-14 Borja Peleato , Rajiv Agarwal , John Cioffi , Minghai Qin , Paul H. Siegel

NAND flash memory is ubiquitous in everyday life today because its capacity has continuously increased and cost has continuously decreased over decades. This positive growth is a result of two key trends: (1) effective process technology…

Hardware Architecture · Computer Science 2018-01-08 Yu Cai , Saugata Ghose , Erich F. Haratsch , Yixin Luo , Onur Mutlu

NAND flash memory is ubiquitous in everyday life today because its capacity has continuously increased and cost has continuously decreased over decades. This positive growth is a result of two key trends: (1) effective process technology…

Hardware Architecture · Computer Science 2017-09-25 Yu Cai , Saugata Ghose , Erich F. Haratsch , Yixin Luo , Onur Mutlu

Increasing storage density exacerbates DRAM read disturbance, a circuit-level vulnerability exploited by system-level attacks. Unfortunately, existing defenses are either ineffective or prohibitively expensive. Efficient mitigation is…

Cryptography and Security · Computer Science 2024-08-28 Abdullah Giray Yağlıkçı

Read disturbance in modern DRAM chips is a widespread phenomenon and is reliably used for breaking memory isolation, a fundamental building block for building robust systems. RowHammer and RowPress are two examples of read disturbance in…

Due to increasing cache sizes and large leakage consumption of SRAM device, conventional SRAM caches contribute significantly to the processor power consumption. Recently researchers have used non-volatile memory devices to design caches,…

Hardware Architecture · Computer Science 2014-05-01 Sparsh Mittal

This paper summarizes our work on experimentally characterizing, mitigating, and recovering data retention errors in multi-level cell (MLC) NAND flash memory, which was published in HPCA 2015, and examines the work's significance and future…

Hardware Architecture · Computer Science 2018-05-09 Yu Cai , Yixin Luo , Erich F. Haratsch , Ken Mai , Saugata Ghose , Onur Mutlu

Modern DRAM chips are subject to read disturbance errors. State-of-the-art read disturbance mitigations rely on accurate and exhaustive characterization of the read disturbance threshold (RDT) (e.g., the number of aggressor row activations…

We experimentally demonstrate the effects of read disturbance (RowHammer and RowPress) and uncover the inner workings of undocumented read disturbance defense mechanisms in High Bandwidth Memory (HBM). Detailed characterization of six real…

Quad-level cell (QLC) flash offers significant benefits in cost and capacity, but its limited reliability leads to frequent read retries, which severely degrade read performance. A common strategy in high-density flash storage is to program…

Hardware Architecture · Computer Science 2025-08-28 Yanyun Wang , Dingcui Yu , Yina Lv , Yunpeng Song , Yumiao Zhao , Liang Shi

Flash-based disk caches, for example Bcache and Flashcache, has gained tremendous popularity in industry in the last decade because of its low energy consumption, non-volatile nature and high I/O speed. But these cache systems have a worse…

Operating Systems · Computer Science 2023-11-16 Chaos Dong , Fang Wang , Jianshun Zhang

Although NAND flash memory has achieved continuous capacity improvements via advanced 3D stacking and multi-level cell technologies, these innovations introduce new reliability challenges, particularly lateral charge spreading (LCS), absent…

Hardware Architecture · Computer Science 2025-11-11 Omin Kwon , Kyungjun Oh , Jaeyong Lee , Myungsuk Kim , Jihong Kim

State-of-the-art DRAM read disturbance mitigations rely on the read disturbance threshold (RDT) (e.g., the number of aggressor row activations needed to induce the first read disturbance bitflip) to securely and performance- and…

Hardware Architecture · Computer Science 2026-03-16 Ataberk Olgun , F. Nisa Bostanci , Ismail Emir Yuksel , Haocong Luo , Minesh Patel , A. Giray Yaglikci , Onur Mutlu

Sparse neural retrievers, such as DeepImpact, uniCOIL and SPLADE, have been introduced recently as an efficient and effective way to perform retrieval with inverted indexes. They aim to learn term importance and, in some cases, document…

Information Retrieval · Computer Science 2023-04-26 Carlos Lassance , Simon Lupart , Hervé Dejean , Stéphane Clinchant , Nicola Tonellotto

The practical NAND flash memory suffers from various non-stationary noises that are difficult to be predicted. Furthermore, the data retention noise induced channel offset is unknown during the readback process. This severely affects the…

Information Theory · Computer Science 2019-07-10 Zhen Mei , Kui Cai , Xuan He

The increased memory demands of workloads is putting high pressure on Last Level Caches (LLCs). Unfortunately, there is limited opportunity to increase the capacity of LLCs due to the area and power requirements of the underlying SRAM…

Hardware Architecture · Computer Science 2021-12-21 Apostolos Kokolis , Namrata Mantri , Shrikanth Ganapathy , Josep Torrellas , John Kalamatianos
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