Related papers: Interface and spectrum multiplexing ptychographic …
Ptychography is a well-studied phase imaging method that makes non-invasive imaging possible at a nanometer scale. It has developed into a mainstream technique with various applications across a range of areas such as material science or…
Coherent diffractive imaging is unique as the only route for achieving diffraction-limited spatial resolution in the extreme ultraviolet and X-ray regions, limited only by the wavelength of the light. Recently, advances in coherent short…
Ptychography involves a sample being illuminated by a coherent, localised probe of illumination. When the probe interacts with the sample, the light is diffracted and a diffraction pattern is detected. Then the probe or sample is shifted…
Fourier ptychographic microscopy allows for the collection of images with a high space-bandwidth product at the cost of temporal resolution. In Fourier ptychographic microscopy, the light source of a conventional widefield microscope is…
Ptychography is a coherent diffraction imaging method that uses phase retrieval techniques to reconstruct complex-valued images. It achieves this by sequentially illuminating overlapping regions of a sample with a coherent beam and…
There is widespread interest in estimating the fluorescence properties of natural materials in an image. However, the separation between reflected and fluoresced components is difficult, because it is impossible to distinguish reflected and…
In this work, we present and investigate the novel blind inverse problem of position-blind ptychography, i.e., ptychographic phase retrieval without any knowledge of scan positions, which then must be recovered jointly with the image. The…
Optical-resolution fluorescence imaging through and within complex samples presents a significant challenge due to random light scattering, with substantial implications across multiple fields. While significant advancements in coherent…
We introduce a novel method for using reflectance to identify materials. Reflectance offers a unique signature of the material but is challenging to measure and use for recognizing materials due to its high-dimensionality. In this work,…
One of the most prominent challenges in the field of diffractive imaging is the phase retrieval (PR) problem: In order to reconstruct an object from its diffraction pattern, the inverse Fourier transform must be computed. This is only…
We present a physically intuitive matrix approach for wave imaging and characterization in scattering media. The experimental proof-of-concept is performed with ultrasonic waves, but this approach can be applied to any field of wave physics…
The scientific community has witnessed tremendous expansion of research on layered (i.e. two-dimensional, 2D) materials, with increasing recent focus on applications to photonics. Layered materials are particularly exciting for manipulating…
We report the implementation of a fully on-chip, lensless microscopy technique termed optofluidic ptychography. This imaging modality complements the miniaturization provided by microfluidics and allows the integration of ptychographic…
This article presents a method to perform diffraction tomography in a standard microscope that includes an LED array for illumination. After acquiring a sequence of intensity-only images of a thick sample, a ptychography-based…
Optical Diffraction Tomography (ODT) is a powerful non-invasive imaging technique widely used in biological and medical applications. While significant progress has been made in transmission configuration, reflection ODT remains challenging…
Diffraction tomography (DT) has been widely explored in transmission-mode configurations, enabling high-resolution, label-free 3D imaging. However, industrial metrology applications, such as semiconductor inspection, typically involve…
We report a novel lensless on-chip microscopy platform based on near-field blind ptychographic modulation. In this platform, we place a thin diffuser in between the object and the image sensor for light wave modulation. By blindly scanning…
Lensless imaging is a popular research field for the advantages of small size, wide field-of-view and low aberration in recent years. However, some traditional lensless imaging methods suffer from slow convergence, mechanical errors and…
A method of scanning mid-IR-laser microscopy has recently been proposed for the investigation of large-scale electrically and recombination-active defects in semiconductors and non-destructive inspection of semiconductor materials and…
The wavefront is scrambled when coherent light propagates through a random scattering medium and which makes direct use of the conventional optical methods ineffective. In this paper, we propose and demonstrate a structured light…