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InSb nanoflags represent an interesting platform for quantum transport and have recently been exploited in the study of hybrid planar Josephson junctions. Due to the uncovered semiconductor surface, they are also good candidates for surface…

Understanding the ultrafast dynamics and transport of photoexcited carriers in topological insulators is crucial for the optical manipulation of spins and may shed light on the nature of topological excitons. Here we investigate…

Mesoscale and Nanoscale Physics · Physics 2025-02-07 Rodrigo Becerra Silva , Jay Huang , Bob Minyu Wang , Ziyi Song , Henry Clark Travaglini , Dong Yu

Self-consistent, mean-field description of charge injection into a dielectric medium is modified to account for discreteness of charge carriers. The improved scheme includes both the Schottky barrier lowering due to the individual image…

Materials Science · Physics 2010-03-11 Yu. A. Genenko , S. V. Yampolskii , C. Melzer , K. Stegmaier , H. von Seggern

We have measured the optically injected excess carrier lifetime in silicon using photoexcited muon spin spectroscopy. Positive muons implanted deep in a wafer can interact with the excess carriers and directly probe the bulk carrier…

Materials Science · Physics 2017-12-06 K. Yokoyama , J. S. Lord , J. Miao , P. Murahari , A. J. Drew

Carrier multiplication (CM) describes a strong charge-carrier interaction process in semiconductor colloidal nanocrystals (NCs), wherein two band-edge excitons are simultaneously created by an absorbed photon with at least twice the bandgap…

Optics · Physics 2026-04-07 Zhen Zhang , Encheng Sun , Jian Li , Chunfeng Zhang , Fengrui Hu , Min Xiao , Xiaoyong Wang

Radiation-induced photocurrent in semiconductor devices can be simulated using complex physics-based models, which are accurate, but computationally expensive. This presents a challenge for implementing device characteristics in high-level…

Computational Physics · Physics 2020-08-31 Joshua Hanson , Pavel Bochev , Biliana Paskaleva

Hyperdoping, overcoming the solubility limit of dopants in a crystalline semiconductor, is a fertile method for the enhancement of the electrical, structural and optical devices' performances and for the exploration of exotic phases such as…

Transient Photoluminescence Microscopy (TPLM) allows for the direct visualization of carrier transport in semiconductor materials with sub nanosecond and few nanometer resolution. The technique is based on measuring changes in the spatial…

Nanoscale optoelectronic components achieve functionality via spatial variation in electronic structure induced by composition, defects, and dopants. To dynamically change the local band alignment and influence defect states, a scanning…

Applied Physics · Physics 2025-02-20 Yen-Po Liu , Jonatan Fast , Yang Chen , Ren Zhe , Adam Burke , Rainer Timm , Heiner Linke , Anders Mikkelsen

Exciton diffusion plays a vital role in the function of many organic semiconducting opto-electronic devices, where an accurate description requires precise control of heterojunctions. This poses a challenging problem because the…

Computational Physics · Physics 2020-12-10 Liyao Lyu , Zhiwen Zhang , Jingrun Chen

The route towards manipulation of the optoelectronic properties of matter beyond the current limits of electronics starts from a comprehensive study of the ultrafast dynamics triggered by interaction with light. Among them, a fundamental…

We present a novel optical transient absorption and reflection microscope based on a diffraction-limited pump pulse in combination with a wide-field probe pulse, for the spatio-temporal investigation of ultrafast population transport in…

The open-ended coaxial probe (OECP) technique is one of the most commonly used methods for the characterization of homogeneous media properties, especially in the biomedical sciences. However, when considering inhomogeneous media, the…

Applied Physics · Physics 2024-10-01 Rotem Gal-Katzir , Emily Porter , Yarden Mazor

The fixed node diffusion Monte Carlo (DMC) method has attracted interest in recent years as a way to calculate properties of solid materials with high accuracy. However, the framework for the calculation of properties such as total…

Materials Science · Physics 2016-01-20 Jaehyung Yu , Lucas K. Wagner , Elif Ertekin

By considering the changes in the interface charge-carrier densities of a single-carrier device as a function of injection-barrier heights and comparing these to the equilibrium, background charge-carrier density of a device with Ohmic…

Mesoscale and Nanoscale Physics · Physics 2022-10-26 Jason A. Röhr

We perform broadband phase sensitive measurements of the reflection coefficient from 45 MHz up to 20 GHz employing a vector network analyzer with a 2.4 mm coaxial sensor which is terminated by the sample under test. While the material…

Materials Science · Physics 2008-05-12 Elvira Ritz , Martin Dressel

Light transport in strongly scattering porous photocatalytic materials governs the spatial distribution of absorbed photons and therefore the generation of charge carriers driving photocatalytic reactions. Yet translating measured optical…

Optics · Physics 2026-03-16 Renaud A. L. Vallée , Rénal Backov

Nonintrusive measurements of plasma properties are essential to evaluate, and numerically simulate, the in-flight performance of electric propulsion systems. As a logical first step in the development of new diagnostic techniques, this work…

Plasma Physics · Physics 2023-04-05 Adam R. Patel , Sashin L. B. Karunarathne , Nicholas Babusis , Alexey Shashurin

A critical challenge for the integration of the optoelectronics is that photodetectors have relatively poor sensitivities at the nanometer scale. It is generally believed that a large electrodes spacing in photodetectors is required to…

Mesoscale and Nanoscale Physics · Physics 2015-01-27 Yufei Cao , Kaiming Cai , Pingan Hu , Lixia Zhao , Tengfei Yan , Xinhui Zhang , Xiaoguang Wu , Kaiyou Wang , Houzhi Zheng

The growing diffusion of integrated photonic technologies requires fast and non-invasive quality control techniques for mass-production. We present a general diagnostic technique for sub-ps imaging of photonic circuits combining wide-field…

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