Related papers: electronCT -- An Imaging Technique Using Very-high…
Electron energy-loss spectroscopy (EELS) can measure similar information to X-ray, UV-Vis, and IR spectroscopies but with atomic resolution and increased scattering cross sections. Recent advances in electron monochromators have expanded…
A sensitive photoacoustic detection approach employing a silicon cantilever is investigated for power measurement of electromagnetic radiation. The technique which is actuated by pressure waves generated through radiation-induced heat,…
We apply tomography, a general method for reconstructing 3-D distributions from multiple projections, to reconstruct the momentum distribution of electrons produced via strong field photoionization. The projections are obtained by rotating…
Electron tomography is a technique used in both materials science and structural biology to image features well below optical resolution limit. In this work, we present a new algorithm for reconstructing the three-dimensional(3D)…
A novel approach is proposed, where energy filtered electrons, carrying both chemical identity and electrical information, serve as fine and flexible electrodes in direct electrical measurements. The method, termed 'chemically resolved…
There exist two groups of electron microscopy methods that are capable of providing three-dimensional (3D) structural information of an object, i.e., electron tomography and depth sectioning. Electron tomography is capable of resolving…
A special beam line for high energy electron radiography is designed, including achromat and imaging systems. The requirement of the angle and position correction on the target from imaging system can be approximately realized by fine…
Precise manipulation of high brightness electron beams requires detailed knowledge of the particle phase space shape and evolution. As ultrafast electron pulses become brighter, new operational regimes become accessible with emittance…
Scanning electron microscopy (SEM) is a versatile technique used to image samples at the nanoscale. Conventional imaging by this technique relies on finding the average intensity of the signal generated on a detector by secondary electrons…
The application of PhotoEmission Electron Microscopy (PEEM) and Low Energy Electron Microscopy (LEEM) techniques to the study of the electronic and chemical structure of ferroelectric materials is reviewed. Electron optics in both…
A new instrument for high resolution imaging of fast-neutrons is presented here. It is designed for energy selective radiography in nanosecond-pulsed broad-energy (1 - 10 MeV) neutron beams. The device presented here is based on hydrogenous…
Extreme Ultraviolet (EUV) lithography is the state-of-the-art process in semiconductor fabrication, yet its spatial resolution is fundamentally limited by the ``blur'' originating from absorption of photons at 92 eV, which induce physical…
Electron spectrometry is traditionally challenging due to the difficulty of correctly reconstructing the original energy of the detected electrons. Silicon Drift Detectors, extensively used for X-ray spectrometry, are a promising technology…
Spectroscopic photoemission microscopy is a well-established method to investigate the electronic structure of surfaces. In modern photoemission microscopes the electron optics allows imaging of the image plane, momentum plane, or…
The Electrical Resistance Tomography (ERT) technique is applied to the measurement of sheet conductance maps of both uniform and patterned conductive thin films. Images of the sheet conductance spatial distribution, and local conductivity…
The toolbox for imaging molecules is well-equipped today. Some techniques visualize the geometrical structure, others the electron density or electron orbitals. Molecules are many-body systems for which the correlation between the…
Focused beams of electrons, which act as both sources, and sensors of electric fields, can be used to characterise the electric response of complex photonic systems by locally probing the induced optical near fields. This functionality can…
Detector-based spectral computed tomography is a recent dual-energy CT (DECT) technology that offers the possibility of obtaining spectral information. From this spectral data, different types of images can be derived, amongst others…
In quantum mechanics, entanglement and correlations are not just a mere sporadic curiosity, but rather common phenomena at the basis of an interacting quantum system. In electron microscopy, such concepts have not been extensively explored…
Photon-counting computed tomography (PCCT) with energy discrimination capabilities hold great potentials to improve the limitations of the conventional CT, including better signal-to-noise ratio (SNR), improved contrast-to-noise ratio…