Related papers: Measurement of electromagnetic radiation force usi…
We report a simple demonstration of radiation pressure on a table-top experiment. Utilizing dynamic force microscopy in ambient environment, the resonant motion of a cm-sized cantilever driven by an amplitude-modulated diode laser is…
A sensitive photoacoustic detection approach employing a silicon cantilever is investigated for power measurement of electromagnetic radiation. The technique which is actuated by pressure waves generated through radiation-induced heat,…
We describe a method for feedback-regulation of a microcantilever's response using optical radiation pressure. One laser measures the position of the cantilever and another laser applies a force that is a phase-shifted function of that…
A force measurement technique has been developed that utilizes a clamped fiber optic element both as a cantilever and as a highly sensitive probe of the static and dynamic displacement of a sample that is mounted near its free end. Light…
We investigate the possibility of an electromechanical which-path interferometer, in which electrons travelling through an Aharonov-Bohm ring incorporating a quantum dot in one of the arms are dephased by an interaction with the fundamental…
Atomic Force Microscopy (AFM) methods utilizing resonant mechanical vibrations of cantilevers in contact with a sample surface have shown sensitivities as high as few picometers for detecting surface displacements. Such a high sensitivity…
We report on the measurement of the Casimir force between conducting surfaces in a parallel configuration. The force is exerted between a silicon cantilever coated with chromium and a similar rigid surface and is detected looking at the…
We describe a transducer for low-temperature atomic force microscopy based on electromechanical coupling due to a strain-dependent kinetic inductance of a superconducting nanowire. The force sensor is a bending triangular plate (cantilever)…
Capacitance measurements are crucial for probing the electrical properties of materials. In this study, we develop and implement a capacitance measurement technique optimized for pulsed magnetic fields. Our approach employs an…
Electrostatic force microscopy at cryogenic temperatures is used to probe the electrostatic interaction of a conductive atomic force microscopy tip and electronic charges trapped in localized states in an insulating layer on a…
In this article, we present a deflection measurement setup for Atomic Force Microscopy (AFM). It is based on a quadrature phase differential interferometer: we measure the optical path difference between a laser beam reflecting above the…
In this work, the force due to radiation pressure is measured with sub-10 pN sensitivity, corresponding to less than 2 mW of optical power. The apparatus adds homemade reflectors to a commercial Cavendish balance, which consists of a…
The Transient Fluctuation Theorem is used to calibrate an Atomic Force Microscope by measuring the fluctuations of the work performed by a time dependent force applied between a collo{\"i}dal probe and the surface. From this measure one can…
We introduce a micromachined force scale for laser power measurement by means of radiation pressure sensing. With this technique, the measured laser light is not absorbed and can be utilized while being measured. We employ silicon…
We describe a laser interferometer experiment for the undergraduate teaching laboratory that achieves picometer sensitivity in a hands-on table-top instrument. In addition to providing an introduction to interferometer physics and optical…
A mechanical electroscope based on a change in the resonant frequency of a cantilever one micron in size in the presence of charge has recently been fabricated. We derive the decoherence rate of a charge superposition during measurement…
We demonstrate an alternative to Kelvin Probe Force Microscopy for imaging surface potential. The open-loop, single-pass technique applies a low-frequency AC voltage to the atomic force microscopy tip while driving the cantilever near its…
An atom interferometer using a Bose-Einstein condensate of $^{87}$Rb atoms is utilized for the measurement of magnetic field gradients. Composite optical pulses are used to construct a spatially symmetric Mach-Zehnder geometry. Using a…
Electrostatic force microscopy at cryogenic temperatures was used to probe the electrostatic interaction between a conductive atomic force microscopy tip and electronic charges trapped in an InAs quantum dot. Measurement of the…
Using a boundary element method to calculate the electromagnetic fields and the Maxwell stress tensor method to compute the electromagnetic forces, we investigate electromagnetic wave induced forces acting on a pair of identical metal…