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This paper presents a comprehensive numerical analysis of super-resolution imaging using dielectric microparticles, employing the Finite-Difference Time-Domain (FDTD) method to elucidate the mechanisms that enable resolution enhancements…
Laser cutting of semiconductor wafers and transparent dielectrics has become a dominant process in manufacturing industries, encompassing a wide range of applications from flat display panels to microelectronic chips. Limited by the…
Optical phase-space functions describe spatial and angular information simultaneously; examples include light fields in ray optics and Wigner functions in wave optics. Measurement of phase-space enables digital refocusing, aberration…
Fourier ptychographic microscopy enables gigapixel-scale imaging, with both large field-of-view and high resolution. Using a set of low-resolution images that are recorded under varying illumination angles, the goal is to computationally…
The dielectric microsphere can be directly embedded into the traditional microscope, which can significantly improve the resolution of the microscope and provide a simple and feasible way to break through the diffraction limit of optical…
The number of publications of aperture-synthesis images based on optical long-baseline interferometry measurements has recently increased due to easier access to visible and infrared interferometers. The interferometry technique has now…
Diffraction microtomography in coherent light is foreseen as a promising technique to image transparent living samples in three dimensions without staining. Contrary to conventional microscopy with incoherent light, which gives…
Label-free microscopy exploits light scattering to obtain a three-dimensional image of biological tissues. However, light propagation is affected by aberrations and multiple scattering, which drastically degrade the image quality and limit…
Direct imaging of exoplanets requires very high contrast levels, which are obtained using coronagraphs. But residual quasi-static aberrations create speckles in the focal plane downstream of the coronagraph which mask the planet. This…
A lensless digital holography enables wide-field microscopic imaging without the limitations imposed by optical lens performance. However, conventional holographic imaging often relies on magnifying optical systems to compensate for the low…
Deconvolution is the most widely used aberration correction technique in microscopy, however most techniques assume that the aberrations are the same for each point in the image, which is rarely true. Methods for tracking spatially varying…
Compact direct electron detectors are becoming increasingly popular in electron microscopy applications including electron backscatter diffraction, as they offer an opportunity for low cost and accessible microstructural analysis. In this…
In two-dimensional spectrographs, the optical distortions in the spatial and dispersion directions produce variations in the sub-pixel sampling of the background spectrum. Using knowledge of the camera distortions and the curvature of the…
Layered materials (LMs) are at the centre of an ever increasing research effort due to their potential use in a variety of applications. The presence of imperfections, such as bi- or multilayer areas, holes, grain boundaries, isotropic and…
Besides being the foundational material for microelectronics, in optics, crystalline silicon has long been used for making infrared lenses and mirrors. More recently, silicon has become the key material to achieve large-scale integration of…
The resolution of photoacoustic imaging deep inside scattering media is limited by the acoustic diffraction limit. In this work, taking inspiration from super-resolution imaging techniques developed to beat the optical diffraction limit, we…
A large number of image super resolution algorithms based on the sparse coding are proposed, and some algorithms realize the multi-frame super resolution. In multi-frame super resolution based on the sparse coding, both accurate image…
Four-dimensional scanning transmission electron microscopy (4D-STEM) enables mapping of diffraction information with nanometer-scale spatial resolution, offering detailed insight into local structure, orientation, and strain. However, as…
Spectroscopic photoemission microscopy is a well-established method to investigate the electronic structure of surfaces. In modern photoemission microscopes the electron optics allows imaging of the image plane, momentum plane, or…
This study explores the use of synchrotron measurements as a nanometrology tool for blazed gratings. In grazing incidence geometry, one can measure both the conical diffraction and the diffuse scattering on the grating simultaneously in a…