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The scanning electron microscopy (SEM) is probably one the most fascinating examination approach that has been used since more than two decades to detailed inspection of micro scale objects. Most of the scanning electron microscopes could…
The achievable instrumental performance of a scanning transmission electron microscope (STEM) is determined by the size and shape of the incident electron probe. The most important optical factor in achieving the optimum probe profile is…
Plasmonics, the science and technology of the interaction of light with metallic objects, is fundamentally changing the way we can detect, generate and manipulate light. Although the field is progressing swiftly, thanks to the availability…
Cathodoluminescence, i.e. the radiation caused by the interaction of high-energy electron beams with matter, has gained a major interest in the analysis of minerals, semiconductors, and plasmonic resonances in nanoparticles. This radiation…
Characterization and control of the transverse phase space of high-brightness electron beams is required at free-electron lasers or electron diffraction experiments for emittance measurement and beam optimization as well as at advanced…
Proton radiography is a new scatheless diagnostic tool, and which provides a potential development direction for advanced hydrotesting. Recently a low energy proton radiography system has been developed at CAEP. This system has been…
Characterizing the shape and evolution of pulsar radio emission beams is important for understanding the observed emission. The various attempts by earlier workers investigating beam shapes have resulted in widely different conclusions.…
New forms of electron beams have been intensively investigated recently, including vortex beams carrying orbital angular momentum, as well as Airy beams propagating along a parabolic trajectory. Their traits may be harnessed for…
Research in semiconductor physics has advanced to the study of two-dimensional (2D) materials where the surface controls electronic transport. A scanning probe microscope (SPM) is an ideal tool to image electronic motion in these devices by…
Electron energy loss spectroscopy is consolidating as a powerful tool to explore electronic (as well as vibrational) excitations of matter, including molecules. Performed in a scanning transmission electron microscope, this technique is…
An updated study of measuring the W mass from a polarized threshold scan at ILC is presented with an emphasis on evaluating scan strategies that control experimental systematics. Highly longitudinally polarized beams of electrons and…
Optical devices based on photonic crystals such as waveguides, lenses and beam-shapers, have received considerable theoretical and experimental attention in recent years. The production of these devices has been facilitated by the wide…
A novel method to measure the beam-beam interaction in e+e- colliders is presented.
In this article, we share our experience related to the new photo-injector commissioning at the SPARC\_LAB test facility. The new photo-injector was installed into an existing machine and our goal was not only to improve the final beam…
Examining and controlling the interaction between semiconductor quantum qubits and their environment can boost semiconductor quantum technologies, which have many applications in table-top quantum computing hardware. Electron beams in…
A lot of work on clamped circular, square and rectangular shaped capacitive pressure sensor has been carried out. However, to the best of our knowledge, no elaborate work has been performed on mathematical formulation and simulation of…
During the recent years of LHC operation, we analysed the situation of beam instrumentation and the need to optimize it for beam-beam studies. The most important beam instrumentation devices will be highlighted and modifications or…
The scanning electron microscope (SEM) delivers high resolution, high depth of focus and an image quality as if microscopic objects are seen by the naked eye. This makes it not only a powerful scientific instrument, but a tool inherently…
We present a numerical method to model electric field sensitive scanning probe microscopy measurements which allows for a tip of arbtrary shape and invokes image charges to exactly account for a sample dielectric overlayer. The method is…
This paper presents first results on the line profile shapes from a circumstellar envelope in bulk motion as modified by a microlensing event. Only geometrically and optically thin spherical shells in uniform expansion or rotation are…