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In this research work, we have demonstrated the application of Mask-RCNN (Regional Convolutional Neural Network), a deep-learning algorithm for computer vision and specifically object detection, to semiconductor defect inspection domain.…

Computer Vision and Pattern Recognition · Computer Science 2022-11-07 Bappaditya Dey , Enrique Dehaerne , Kasem Khalil , Sandip Halder , Philippe Leray , Magdy A. Bayoumi

Atomic defects in wide band gap materials show great promise for development of a new generation of quantum information technologies, but have been hampered by the inability to produce and engineer the defects in a controlled way. The…

Diamond and diamond color centers have become prime hardware candidates for solid state-based technologies in quantum information and computing, optics, photonics and (bio)sensing. The synthesis of diamond materials with specific…

Materials Science · Physics 2026-01-15 Zhi Jiang , Marco Peres , Carlo Bradac , Gil Gonçalves

Grading and quality control of Piarom dates, a premium and high-value variety cultivated predominantly in Iran, present significant challenges due to the complexity and variability of defects, as well as the absence of specialized automated…

Computer Vision and Pattern Recognition · Computer Science 2024-10-25 Nasrin Azimi , Danial Mohammad Rezaei

The properties of liquid crystals can be modelled using an order parameter which describes the variability of the local orientation of rod-like molecules. Defects in the director field can arise due to external factors such as applied…

Numerical Analysis · Mathematics 2019-10-08 Craig S. MacDonald , John A. Mackenzie , Alison Ramage

The process of segmenting point cloud data into several homogeneous areas with points in the same region having the same attributes is known as 3D segmentation. Segmentation is challenging with point cloud data due to substantial…

Computer Vision and Pattern Recognition · Computer Science 2025-04-24 Siddiqui Muhammad Yasir , Hyunsik Ahn

The development of computer vision and in-situ monitoring using visual sensors allows the collection of large datasets from the additive manufacturing (AM) process. Such datasets could be used with machine learning techniques to improve the…

Computer Vision and Pattern Recognition · Computer Science 2023-09-06 Xiao Liu , Alessandra Mileo , Alan F. Smeaton

The pretraining-finetuning paradigm is a crucial strategy in metallic surface defect detection for mitigating the challenges posed by data scarcity. However, its implementation presents a critical dilemma. Pretraining on natural image…

Computer Vision and Pattern Recognition · Computer Science 2026-05-27 Chuni Liu , Hongjie Li , Jiaqi Du , Yangyang Hou , Qian Sun , Lei Jin , Ke Xu

Maintaining sewer systems in large cities is important, but also time and effort consuming, because visual inspections are currently done manually. To reduce the amount of aforementioned manual work, defects within sewer pipes should be…

Computer Vision and Pattern Recognition · Computer Science 2024-04-10 Bach Ha , Birgit Schalter , Laura White , Joachim Koehler

Visual inspection for defect grading in agricultural supply chains is crucial but traditionally labor-intensive and error-prone. Automated computer vision methods typically require extensively annotated datasets, which are often unavailable…

Computer Vision and Pattern Recognition · Computer Science 2025-04-15 Manuel Knott , Divinefavour Odion , Sameer Sontakke , Anup Karwa , Thijs Defraeye

Defect detection plays a crucial role in infrared non-destructive testing systems, offering non-contact, safe, and efficient inspection capabilities. However, challenges such as low resolution, high noise, and uneven heating in infrared…

Computer Vision and Pattern Recognition · Computer Science 2023-11-20 Bozhen Hu , Bin Gao , Cheng Tan , Tongle Wu , Stan Z. Li

In the operation & maintenance (O&M) of photovoltaic (PV) plants, the early identification of failures has become crucial to maintain productivity and prolong components' life. Of all defects, cell-level anomalies can lead to serious…

Computer Vision and Pattern Recognition · Computer Science 2022-01-17 Urtzi Otamendi , Iñigo Martinez , Marco Quartulli , Igor G. Olaizola , Elisabeth Viles , Werther Cambarau

Supervised machine learning algorithms play a crucial role in optical quality control within industrial production. These approaches require representative datasets for effective model training. However, while non-defective components are…

Computer Vision and Pattern Recognition · Computer Science 2026-02-02 Dennis Sprute , Hanna Senke , Holger Flatt

Die casting plays a crucial role across various industries due to its ability to craft intricate shapes with high precision and smooth surfaces. However, surface defects remain a major issue that impedes die casting quality control.…

Computer Vision and Pattern Recognition · Computer Science 2026-02-06 Boxiang Zhang , Baijian Yang , Xiaoming Wang , Corey Vian

Droplet growth and size spectra play a crucial role in the microphysics of atmospheric clouds. However, it is challenging to represent droplet growth rate accurately in cloud-resolving models such as Large Eddy Simulations (LESs). The…

Fluid Dynamics · Physics 2024-10-21 Divyaprakash , Nikita N. Makwana , Amitabh Bhattacharya , Bipin Kumar

Deep learning methods have proven to outperform traditional computer vision methods in various areas of image processing. However, the application of deep learning in industrial surface defect detection systems is challenging due to the…

Computer Vision and Pattern Recognition · Computer Science 2021-09-24 Dominik Martin , Simon Heinzel , Johannes Kunze von Bischhoffshausen , Niklas Kühl

Due to the high complexity and technical requirements of industrial production processes, surface defects will inevitably appear, which seriously affects the quality of products. Although existing lightweight detection networks are highly…

Computer Vision and Pattern Recognition · Computer Science 2024-08-27 Xuyi Yu

The presence of gas pores in metal feedstock powder for additive manufacturing greatly affects the final AM product. Since current porosity analysis often involves lengthy X-ray computed tomography (XCT) scans with a full rotation around…

Computer Vision and Pattern Recognition · Computer Science 2024-08-06 Andreas Bjerregaard , David Schumacher , Jon Sporring

Image generation can solve insufficient labeled data issues in defect detection. Most defect generation methods are only trained on a single product without considering the consistencies among multiple products, leading to poor quality and…

Computer Vision and Pattern Recognition · Computer Science 2024-08-02 Qingfeng Shi , Jing Wei , Fei Shen , Zhengtao Zhang

Synthetic dataset generation in Computer Vision, particularly for industrial applications, is still underexplored. Industrial defect segmentation, for instance, requires highly accurate labels, yet acquiring such data is costly and…

Computer Vision and Pattern Recognition · Computer Science 2026-01-28 Emanuele Caruso , Alessandro Simoni , Francesco Pelosin
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