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The defect morphology is an essential aspect of the evolution of crystals' microstructure and its response to stress. Existing methods either only report defect concentration or characterize only some of the defect morphologies. The need…

Computational Physics · Physics 2021-04-21 Utkarsh Bhardwaj , Andrea E. Sand , Manoj Warrier

Chemical disorder, originating from the mixed occupation of crystallographic sites by multiple elements, is widespread in alloys, ceramics, and compositionally complex materials, where short- and long-range orderings can strongly influence…

Materials Science · Physics 2026-05-20 Jiayu Peng , Peichen Zhong

Near-surface nitrogen-vacancy centres are critical to many diamond-based quantum technologies such as information processors and nanosensors. Surface defects play an important role in the design and performance of these devices. The…

New production techniques have emerged that have made it possible to produce metal parts with more complex shapes, making the quality control process more difficult. This implies that the visual and superficial analysis has become even more…

Computer Vision and Pattern Recognition · Computer Science 2022-03-01 Francisco Javier Yagüe , Jose Francisco Diez-Pastor , Pedro Latorre-Carmona , Cesar Ignacio Garcia Osorio

Additive manufacturing (AM) is an emerging digital manufacturing technology to produce complex and freeform objects through a layer-wise deposition. High deposition rate robotic AM (HDRRAM) processes, such as cold spray additive…

Computer Vision and Pattern Recognition · Computer Science 2025-11-11 Subash Gautam , Alejandro Vargas-Uscategui , Peter King , Hans Lohr , Alireza Bab-Hadiashar , Ivan Cole , Ehsan Asadi

Artificial Intelligence has gained a lot of attention recently, it has been utilized in several fields ranging from daily life activities, such as responding to emails and scheduling appointments, to manufacturing and automating work…

Software Engineering · Computer Science 2026-02-02 Mohammed O. Alannsary

In the photolithographic process vital to semiconductor manufacturing, various types of defects appear during EUV pattering. Due to ever-shrinking pattern size, these defects are extremely small and cause false or missed detection during…

Periorbital distances are critical markers for diagnosing and monitoring a range of oculoplastic and craniofacial conditions. Manual measurement, however, is subjective and prone to intergrader variability. Automated methods have been…

Determining crystal structures from powder X-ray diffraction (PXRD) has been a significant challenge in materials science, particularly when experimental data contain noise or the target structure has a high complexity. While recent AI…

Materials Science · Physics 2026-05-26 Kaixiang Su , Osman Goni Ridwan , Hongfei Xue , Qiang Zhu

Traditional Statistical Process Control methodologies face several challenges when monitoring defects in complex geometries, such as those of products obtained via Additive Manufacturing techniques. Many approaches cannot be applied in…

Applications · Statistics 2024-04-12 Sara Bonacina , Daniele Zago , Giovanna Capizzi , Bianca Maria Colosimo

The chemical vapor deposition of polycrystalline diamond (PCD) films is typically done on substrates seeded with diamond nanoparticles. Specular laser reflectance and a continuous film model have been used to monitor the thickness of these…

Materials Science · Physics 2023-01-31 David Vázquez-Cortés , Stoffel D. Janssens , Burhannudin Sutisna , Eliot Fried

Automatic defect detection for 3D printing processes, which shares many characteristics with change detection problems, is a vital step for quality control of 3D printed products. However, there are some critical challenges in the current…

Computer Vision and Pattern Recognition · Computer Science 2023-08-04 Yushuo Niu , Ethan Chadwick , Anson W. K. Ma , Qian Yang

The surface defect detection method based on visual perception has been widely used in industrial quality inspection. Because defect data are not easy to obtain and the annotation of a large number of defect data will waste a lot of…

Computer Vision and Pattern Recognition · Computer Science 2022-03-14 Qifan Jin , Li Chen

Visual defect detection is critical to ensure the quality of most products. However, the majority of small and medium-sized manufacturing enterprises still rely on tedious and error-prone human manual inspection. The main reasons include:…

Computer Vision and Pattern Recognition · Computer Science 2022-02-15 Zijian Kuang , Xinran Tie , Lihang Ying , Shi Jin

The task of industrial detection based on deep learning often involves solving two problems: (1) obtaining sufficient and effective data samples, (2) and using efficient and convenient model training methods. In this paper, we introduce a…

Computer Vision and Pattern Recognition · Computer Science 2024-07-08 Yangfan He , Xinyan Wang , Tianyu Shi

Industrial defect detection is vital for upholding product quality across contemporary manufacturing systems. As the expectations for precision, automation, and scalability intensify, conventional inspection approaches are increasingly…

Computer Vision and Pattern Recognition · Computer Science 2025-07-21 Yuqi Cheng , Yunkang Cao , Haiming Yao , Wei Luo , Cheng Jiang , Hui Zhang , Weiming Shen

Anomaly detection describes methods of finding abnormal states, instances or data points that differ from a normal value space. Industrial processes are a domain where predicitve models are needed for finding anomalous data instances for…

Machine Learning · Computer Science 2022-09-26 Alexander Zeiser , Bas van Stein , Thomas Bäck

The presence of atomic-scale defects at multilayer interfaces significantly degrades performance in CdTe-based photovoltaic technologies. The ability to accurately predict and understand defect formation mechanisms during overlayer growth…

In this study, we show that diffusion models can be used in industrial scenarios to improve the data augmentation procedure in the context of surface defect detection. In general, defect detection classifiers are trained on ground-truth…

Computer Vision and Pattern Recognition · Computer Science 2024-06-04 Luigi Capogrosso , Federico Girella , Francesco Taioli , Michele Dalla Chiara , Muhammad Aqeel , Franco Fummi , Francesco Setti , Marco Cristani

Utilizing Convolutional Neural Networks (CNNs), Recurrent Neural Networks (RNNs), and Generative Adversarial Networks (GANs), our system introduces an innovative approach to defect detection in manufacturing. This technology excels in…

Computer Vision and Pattern Recognition · Computer Science 2023-11-09 Arti Kumbhar , Amruta Chougule , Priya Lokhande , Saloni Navaghane , Aditi Burud , Saee Nimbalkar