Related papers: Calibrating coordinate system alignment in a scann…
Most current single image camera calibration methods rely on specific image features or user input, and cannot be applied to natural images captured in uncontrolled settings. We propose directly inferring camera calibration parameters from…
Scanning Transmission Electron Microscopy (STEM) enables the observation of atomic arrangements at sub-angstrom resolution, allowing for atomically resolved analysis of the physical and chemical properties of materials. However, due to the…
3D single-pixel imaging (SPI) is a promising imaging technique that can be ffexibly applied to various wavebands. The main challenge in 3D SPI is that the calibration usually requires a large number of standard points as references, which…
Recently it has been shown that precise dose control and an increase in the overall acquisition speed of atomic resolution scanning transmission electron microscope (STEM) images can be achieved by acquiring only a small fraction of the…
Certifying quantum entanglement is a critical step towards realizing quantum-coherent applications of surface spin systems. In this work, we show that entanglement can be unambiguously shown in a scanning tunneling microscope (STM) with…
Development in lattice strain mapping using four-dimensional scanning transmission electron microscopy (4D-STEM) method now offers improved precision and feasibility. However, automatic and accurate diffraction analysis is still challenging…
In this paper, we propose a bistatic sensing-assisted beam tracking method for simultaneous communication and tracking of user vehicles navigating arbitrary-shaped road trajectories. Prior work on simultaneous communication and tracking…
Computerized tomography (CT) has been used for decades by medical professionals to detect and diagnose injuries and ailments. CT scanners are based on interesting physics, but due to their bulk, cost, and safety, hands on experience with a…
Atomic resolution imaging in transmission electron microscopy (TEM) and scanning TEM (STEM) of light elements in electron-transparent materials has long been a challenge. Biomolecular materials, for example, are rapidly altered when…
Effective channel estimation in sparse and high-dimensional environments is essential for next-generation wireless systems, particularly in large-scale MIMO deployments. This paper introduces a novel framework that leverages digital twins…
Integrated quantum photonic circuits are becoming increasingly complex. Accurate calibration of device parameters and detailed characterization of the prepared quantum states are critically important for future progress. Here we report on…
Camera calibration is a process of paramount importance in computer vision applications that require accurate quantitative measurements. The popular method developed by Zhang relies on the use of a large number of images of a planar grid of…
Calibration refers to the estimation of unknown parameters which are present in computer experiments but not available in physical experiments. An accurate estimation of these parameters is important because it provides a scientific…
Camera calibration is an important prerequisite towards the solution of 3D computer vision problems. Traditional methods rely on static images of a calibration pattern. This raises interesting challenges towards the practical usage of event…
The transmission electron microscope facilitates the highest-resolution imaging of any instrument ever created, and its limiting factor is no longer spatial resolution but dose efficiency. Low electron doses avoid sample damage but produce…
Driven by life-science applications, mega-electron-volt Scanning Transmission Electron Microscope (MeV-STEM) has been proposed to image thick biological samples. The high penetration of inelastic scattering signals of MeV electrons could…
Robot manipulation, especially bimanual manipulation, often requires setting up multiple cameras on multiple robot manipulators. Before robot manipulators can generate motion or even build representations of their environments, the cameras…
In this article, a new scanning electron microscopy (SEM) image composition technique is described, which can significantly reduce drift related image corruptions. Drift-distortion commonly causes blur and distortions in the SEM images.…
Scanning transmission electron microscopy (STEM) has been extensively used for imaging complex materials down to atomic resolution. The most commonly employed STEM modality, annular dark-field imaging, produces easily-interpretable…
High quality scanning transmission electron microscopy (STEM) data acquisition and analysis has become increasingly important due to the commercial demand for investigating the properties of complex materials such as battery cathodes;…