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This paper explores a novel research direction where a digital twin is leveraged to assist the beamforming design for an integrated sensing and communication (ISAC) system. In this setup, a base station designs joint communication and…

Signal Processing · Electrical Eng. & Systems 2024-12-11 Shuaifeng Jiang , Ahmed Alkhateeb

Due to their radiation hardness, kilohertz frame rates, and high dynamic range, hybrid pixel detectors have recently expanded their application range to electron diffraction and recently also electron imaging. However, these detectors…

Realizing the potential gains of large-scale MIMO systems requires the accurate estimation of their channels or the fine adjustment of their narrow beams. This, however, is typically associated with high channel acquisition/beam sweeping…

Signal Processing · Electrical Eng. & Systems 2023-01-19 Shuaifeng Jiang , Ahmed Alkhateeb

Four-dimensional scanning transmission electron microscopy (4D-STEM) provides rich, atomic-scale insights into materials structures. However, extracting specific physical properties - such as polarization directions essential for…

Four-dimensional scanning transmission electron microscopy (4D-STEM) is one of the most rapidly growing modes of electron microscopy imaging. The advent of fast pixelated cameras and the associated data infrastructure have greatly…

Applications · Statistics 2019-08-27 Xin Li , Ondrej Dyck , Stephen Jesse , Andrew R. Lupini , Sergei V. Kalinin , Mark P. Oxley

We describe a method to detect twin-beam multiphoton entanglement based on a beam splitter and weak nonlinearities. For the twin-beam four-photon entanglement, we explore a symmetry detector. It works not only for collecting two-pair…

Quantum Physics · Physics 2020-08-04 Yingqiu He , Dong Ding , Fengli Yan , Ting Gao

The appearance of direct electron detectors marked a new era for electron diffraction. Their high sensitivity and low noise opens the possibility to extend electron diffraction from transmission electron microscopes (TEM) to lower energies…

Applied Physics · Physics 2025-02-18 Nikita Denisov , Andrey Orekhov , Johan Verbeeck

Micro scanning mirrors (MSM) extend the range and field of view of LiDARs, medical imaging devices, and laser projectors. However, a new class of soft-hinged MSMs contains out-of-plane translation in addition to the 2 degree-of-freedom…

Robotics · Computer Science 2023-11-27 Di Wang , Xiaoyu Duan , Shu-Hao Yeh , Jun Zou , Dezhen Song

Aberration corrected scanning transmission electron microscopes (STEM) enable to determine local strain fields, composition and bonding states at atomic resolution. The precision to locate atomic columns is often obstructed by scan…

Applied Physics · Physics 2019-01-16 Benjamin Berkels , Christian H. Liebscher

Collaborative robotic industrial cells are workspaces where robots collaborate with human operators. In this context, safety is paramount, and for that a complete perception of the space where the collaborative robot is inserted is…

Robotics · Computer Science 2022-10-20 Daniela Rato , Miguel Oliveira , Vítor Santos , Manuel Gomes , Angel Sappa

In many industries, the scale and complexity of systems can present significant barriers to the development of accurate digital twin models. This paper introduces a novel methodology and a modular computational tool utilizing machine…

Computational Engineering, Finance, and Science · Computer Science 2025-09-23 Deniz Karanfil , Bahram Ravani

Accurately calibrating light field camera is essential to its applications. Rapid progress has been made in this area in the past decades. In this paper, detailed analysis was first performed towards the state of the art projection models…

Computer Vision and Pattern Recognition · Computer Science 2021-03-11 Dongyang Jin , Saiping Zhang , Xiao Huo , Wei Zhang , Fuzheng Yang

High-throughput 2D and 3D scanning electron microscopy, which relies on automation and dependable control algorithms, requires high image quality with minimal human intervention. Classical focus and astigmatism correction algorithms attempt…

Instrumentation and Detectors · Physics 2023-05-10 Philipp Johannes Schubert , Rangoli Saxena , Joergen Kornfeld

The arrival of direct electron detectors (DED) with high frame-rates in the field of scanning transmission electron microscopy has enabled many experimental techniques that require collection of a full diffraction pattern at each scan…

Materials Science · Physics 2021-08-11 Philipp M. Pelz , Ian Johnson , Colin Ophus , Peter Ercius , Mary C. Scott

Embodying the principle of simulation intelligence, digital twin (DT) systems construct and maintain a high-fidelity virtual model of a physical system. This paper focuses on ray tracing (RT), which is widely seen as an enabling technology…

Signal Processing · Electrical Eng. & Systems 2024-05-16 Clement Ruah , Osvaldo Simeone , Jakob Hoydis , Bashir Al-Hashimi

Precise measurements from sensors are crucial, but data is usually collected from low-cost, low-tech systems, which are often inaccurate. Thus, they require further calibrations. To that end, we first identify three requirements for…

Machine Learning · Computer Science 2024-12-31 Seokho Ahn , Hyungjin Kim , Sungbok Shin , Young-Duk Seo

The use of electron mirrors in aberration correction and surface-sensitive microscopy techniques such as low-energy electron microscopy has been established. However, in this work, by implementing an easy to construct, fully electrostatic…

The simulation of transmission electron microscopy (TEM) images or diffraction patterns is often required to interpret their contrast and extract specimen features. This is especially true for high-resolution phase-contrast imaging of…

Materials Science · Physics 2021-03-30 Jacob Madsen , Timothy J. Pennycook , Toma Susi

Bias estimation or sensor registration is an essential step in ensuring the accuracy of global tracks in multisensor-multitarget tracking. Most previously proposed algorithms for bias estimation rely on local measurements in centralized…

Methodology · Statistics 2016-03-23 Ehsan Taghavi , R. Tharmarasa , T. Kirubarajan , Yaakov Bar-Shalom , Mike McDonald

This work builds on the previous introduction [1] of a coupled experimental-computational system devised to fully characterize the thermal behavior of complex 3D submicron electronic devices. The new system replaces the laser-based surface…

Materials Science · Physics 2007-09-13 Peter E. Raad , Pavel L. Komarov , M. Burzo