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Quantitative phase microscopy (QPM), a technique combining phase imaging and microscopy, enables visualization of the 3D topography in reflective samples, as well as the inner structure or refractive index distribution of transparent and…
The magnetic properties of arrays of nanowires (NWs) and nanotubes (NTs), 150 nm in diameter, electrodeposited inside nanoporous polycarbonate membranes are investigated. The comparison of the nanoscopic magnetic force microscopy (MFM)…
Atomic force microscopy (AFM) is a key tool for characterising nanoscale structures, with functionalised tips now offering detailed images of the atomic structure. In parallel, AFM simulations using the particle probe model provide a…
Existing depth sensors are imperfect and may provide inaccurate depth values in challenging scenarios, such as in the presence of transparent or reflective objects. In this work, we present a general framework that leverages polarization…
Proximity ferroelectricity is a novel paradigm for inducing ferroelectricity, where a non-ferroelectric polar material, which is unswitchable with an external field below the dielectric breakdown field, becomes a practically switchable…
The increasing complexity and scale of photonic and electromagnetic devices demand efficient and accurate numerical solvers. In this work, we develop a parallel overlapping domain decomposition method (DDM) based on the finite-difference…
Atomic force microscopy (AFM) enables nanoscale characterization and has been widely applied to a broad range of systems. Over the past two decades, advances in high-speed AFM have enabled not only the imaging of static structures but also…
Emergent functionalities of structural and topological defects in ferroelectric materials underpin an extremely broad spectrum of applications ranging from domain wall electronics to high dielectric and electromechanical responses. Many of…
In single molecule orientation localization microscopy, valuable information about the orientation and longitudinal position of each molecule is often encoded in the shape of the point spread function (PSF). This shape, though, can be…
Atomic force microscopy (AFM) is a powerful tool to investigate interaction forces at the micro and nanoscale. Cantilever stiffness, dimensions and geometry of the tip can be chosen according to the requirements of the specific application,…
We demonstrate the application of Atomic Force Microscopy (AFM) based optical force microscopy to map the optical near-fields with nanometer resolution, limited only by the AFM probe geometry. We map the electric field distributions of…
In this paper we present a new machine learning workflow with unsupervised learning techniques to identify domains within atomic force microscopy images obtained from polymer films. The goal of the workflow is to identify the spatial…
Tapping mode atomic force microscopy is a standard technique for inspection and analysis at the nanometer scale. The understanding of the non-linear dynamics of the system due to the tip sample interaction is an important prerequisite for a…
Data driven approaches have the potential to make modeling complex, nonlinear physical phenomena significantly more computationally tractable. For example, computational modeling of fracture is a core challenge where machine learning…
Recent developments in x-ray science provide methods to probe deeply embedded mesoscale grain structures and spatially resolve them using dark field x-ray microscopy (DFXM). Extending this technique to investigate weak diffraction signals…
Atomic-resolution imaging with scanning transmission electron microscopy is a powerful tool for characterizing the nanoscale structure of materials, in particular features such as defects, local strains, and symmetry-breaking distortions.…
Atomic Force Microscopy (AFM) allows to reconstruct the topography of surface with a resolution in the nanometer range. The exceptional resolution attainable with the AFM makes this instrument a key tool in nanoscience and technology. The…
Here, we review the basic concepts and applications of the phase-field-crystal (PFC) method, which is one of the latest simulation methodologies in materials science for problems, where atomic- and microscales are tightly coupled. The PFC…
Scanning probe microscopy is one of the most versatile windows into the nanoworld, providing imaging access to a variety of sample properties, depending on the probe employed. Tunneling probes map electronic properties of samples, magnetic…
Vision Foundation Models (VFMs) have become the cornerstone of modern computer vision, offering robust representations across a wide array of tasks. While recent advances allow these models to handle varying input sizes during training,…