Recent developments in x-ray science provide methods to probe deeply embedded mesoscale grain structures and spatially resolve them using dark field x-ray microscopy (DFXM). Extending this technique to investigate weak diffraction signals such as magnetic systems, quantum materials and thin films proves challenging due to available detection methods and incident x-ray flux at the sample. We present a direct detection method focusing on DFXM studies in the hard x-ray range of 10s of keV and above capable of approaching nanoscale resolution. Additionally, we compare this direct detection scheme with routinely used scintillator based optical detection and achieve an order of magnitude improvement in exposure times allowing for imaging of weakly diffracting ordered systems.
@article{arxiv.2212.07303,
title = {Full-Field Nanoscale X-ray Diffraction-Contrast Imaging using Direct Detection},
author = {Elliot Kisiel and Ishwor Poudyal and Peter Kenesei and Mark Engbretson and Arndt Last and Rourav Basak and Ivan Zaluzhnyy and Uday Goteti and Robert Dynes and Antonino Miceli and Alex Frano and Zahir Islam},
journal= {arXiv preprint arXiv:2212.07303},
year = {2023}
}