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A promising practical application of entanglement is metrology, where quantum states can be used to make measurements beyond the shot noise limit. Here we consider how metrology schemes could be realised using atomic Bose-Einstein…

Quantum Physics · Physics 2015-05-27 J. A. Dunningham , J. J. Cooper , D. W. Hallwood

Using the phenomena of linear and circular birefringence we propose a device that can alter general elliptical polarization of a beam by a predetermined amount, thereby allowing conversion between linearly-polarized light and circularly…

Optics · Physics 2015-05-28 A. A. Rangelov

Entanglement properties are routinely used to characterize phases of quantum matter in theoretical computations. For example the spectrum of the reduced density matrix, or so-called "entanglement spectrum", has become a widely used…

Mesoscale and Nanoscale Physics · Physics 2018-08-29 Kenny Choo , Curt W. von Keyserlingk , Nicolas Regnault , Titus Neupert

Quantum entanglement is a resource in quantum metrology that can be distributed to two orthogonal physical quantities for the enhancement of their joint measurement sensitivity, as demonstrated in quantum dense metrology. On the other hand,…

Quantum Physics · Physics 2019-04-11 Yuhong Liu , Nan Huo , Jiamin Li , Liang Cui , Xiaoying Li , Z. Y. Ou

Recent experimental progress in quantum optics has enabled measurement of single photons on ultrafast timescales, beyond the resolution limit of single photon detectors. The energy-time degree of freedom has emerged as a promising avenue…

We apply a pulsed-light interferometer to measure both the intensity and the phase of light that is transmitted through a strongly scattering disordered material. From a single set of measurements we obtain the time-resolved intensity,…

Disordered Systems and Neural Networks · Physics 2009-11-10 I. M. Vellekoop , P. Lodahl , A. Lagendijk

High-speed generation and efficient entanglement detection on a photonic chip are essential for quantum information applications but hard to achieve due to common photonic chips' material properties and limited component performance. In…

Quantum metrology experiments in atomic physics and quantum optics have demonstrated measurement accuracy beyond the shot-noise limit via multi-particle entanglement. At the same time, electron microscopy, an essential tool for…

Optical low-coherence reflectometry is capable of unambiguously measuring positions of stacked, partially reflective layers in a sample object. It relies on the low coherence of the light source and the absolute distances are obtained from…

Quantum Physics · Physics 2020-04-07 Manuel Unternährer , André Stefanov

Nonlinear frequency conversion provides an elegant method to detect photons in a spectral range which differs from the pump wavelength, making it highly attractive for photons with inherently low energy. Aside from the intensity of the…

Optics · Physics 2022-02-10 Tobias Pfeiffer , Jens Klier , Georg von Freymann , Daniel Molter

Preparation of a non-classically correlated state is the first step of any quantum-enhanced interferometric protocol. An efficient method is the one-axis twisting, which entangles a collection of initially uncorrelated particles by means of…

Quantum Physics · Physics 2015-10-28 K. Gietka , P. Szankowski , T. Wasak , J. Chwedenczuk

Material classification is a fundamental problem in computer vision and plays a crucial role in scene understanding. Previous studies have explored various material recognition methods based on reflection properties such as color, texture,…

Computer Vision and Pattern Recognition · Computer Science 2026-03-24 Ryota Maeda , Naoki Arikawa , Yutaka No , Shinsaku Hiura

Precise measurements in optical and atomic systems often rely on differential interferometry. This method allows to handle large and correlated phase noise contributions -- such as environmental vibrations, thermal fluctuations, or…

Quantum Physics · Physics 2025-03-25 Luca Pezzè , Andrea Santoni , Chiara Mazzinghi , Marco Fattori , Augusto Smerzi

We developed a specific numerical fitting procedure, based on the least squares method, to calculate the parameters of the polarization ellipse by only using a single polarizer and a detection device for measuring the outgoing intensities.

Optics · Physics 2007-05-23 Aleksandar Gjurchinovski

The paper investigates the ellipsometric method of measuring the magneto-optical parameter and optical constants in one experiment at affixed angle of the light incidence in ferromagnetics. The influence of the magnetization modulation on…

Optics · Physics 2009-09-17 Otar Bakradze* , Zurab Alimbarashvili , Rusiko Janelidze

The polarization of light conveys crucial information about the spatial ordering and optical properties of a specimen. However, precise polarization measurement in challenging conditions, including constrained spaces, low light levels, and…

Optics · Physics 2026-03-10 Martin Bielak , Dominik Vašinka , Miroslav Ježek

Recent theoretical studies in quantum spectroscopy have emphasized the potential of non-classical correlations in entangled photon pairs for selectively targeting specific nonlinear optical processes in nonlinear optical responses. However,…

Chemical Physics · Physics 2026-04-21 Yuta Fujihashi , Ozora Iso , Ryosuke Shimizu , Akihito Ishizaki

We show how entanglement can be used to improve the estimation of an unknown transformation. Using entanglement is always of benefit, in improving either the precision or the stability of the measurement. Examples relevant for applications…

Quantum Physics · Physics 2019-05-15 G. Mauro D'Ariano , Paoloplacido Lo Presti , Matteo G. A. Paris

Optical-window birefringence is frequently a major obstacle in experiments measuring changes in the polarization state of light traversing a sample under investigation. It can contribute a signal indistinguishable from that due to the…

Optics · Physics 2010-08-03 B. K. Park , A. O. Sushkov , D. Budker

The precision physics program of the ILC requires precise knowledge of the state of beam polarisation. In fact the Compton polarimeters intended for the ILC will have to measure the polarisation with error a factor of 2 smaller than the…

Instrumentation and Detectors · Physics 2014-11-20 Christoph Bartels , Anthony Hartin , Christian Helebrant , Daniela Kaefer , Jenny List