Related papers: Combining unsupervised and supervised learning in …
Austenitic 347H stainless steel offers superior mechanical properties and corrosion resistance required for extreme operating conditions such as high temperature. The change in microstructure due to composition and process variations is…
Many material properties are manifested in the morphological appearance and characterized with microscopic image, such as scanning electron microscopy (SEM). Polymer miscibility is a key physical quantity of polymer material and commonly…
With the increasing adoption of metal additive manufacturing (AM), researchers and practitioners are turning to data-driven approaches to optimise printing conditions. Cross-sectional images of melt tracks provide valuable information for…
Analyzing microscopy images to extract biological object properties (e.g., their morphological organization, temporal dynamics, and population density) is fundamental to various biomedical research. Yet conducting this manually is costly…
This paper provides a novel approach to stitching surface images of rotationally symmetric parts. It presents a process pipeline that uses a feature-based stitching approach to create a distortion-free and true-to-life image from a video…
Scanning tunnelling microscopy (STM) is a powerful technique for imaging surfaces with atomic resolution, providing insight into physical and chemical processes at the level of single atoms and molecules. A regular task of STM image…
To coupe with the difficulties in the process of inspection and classification of defects in Printed Circuit Board (PCB), other researchers have proposed many methods. However, few of them published their dataset before, which hindered the…
In the realm of industrial manufacturing, product inspection remains a significant bottleneck, with only a small fraction of manufactured items undergoing inspection for surface defects. Advances in imaging systems and AI can allow…
Scanning electron microscopy (SEM) is indispensable in diverse applications ranging from microelectronics to food processing because it provides large depth-of-field images with a resolution beyond the optical diffraction limit. However,…
The growing availability of sensors within semiconductor manufacturing processes makes it feasible to detect defective wafers with data-driven models. Without directly measuring the quality of semiconductor devices, they capture the…
The task of detecting and classifying damages in sewer pipes offers an important application area for computer vision algorithms. This paper describes a system, which is capable of accomplishing this task solely based on low quality and…
In the rapidly evolving field of optical engineering, precise alignment of multi-lens imaging systems is critical yet challenging, as even minor misalignments can significantly degrade performance. Traditional alignment methods rely on…
Recent advances in scanning transmission electron and scanning tunneling microscopies allow researchers to measure materials structural and electronic properties, such as atomic displacements and charge density modulations, at an Angstrom…
Statistical quality control in semiconductor manufacturing hinges on effective diagnostics of wafer bin maps, wherein a key challenge is to detect how defective chips tend to spatially cluster on a wafer--a problem known as spatial pattern…
Scanning transmission electron microscopy is a common tool used to study the atomic structure of materials. It is an inherently multimodal tool allowing for the simultaneous acquisition of multiple information channels. Despite its…
The growing complexity of particle detectors makes their construction and quality control a new challenge. We present studies that explore the use of deep learning-based computer vision techniques to perform quality checks of detector…
Here, we evaluate multislice electron ptychography as a tool to carry out depth-resolved atomic resolution characterization of point defects, using silicon carbide as a case study. Through multislice electron scattering simulations and…
With the development of computer-aided diagnosis (CAD) and image scanning technology, Whole-slide Image (WSI) scanners are widely used in the field of pathological diagnosis. Therefore, WSI analysis has become the key to modern digital…
Currently, analysis of microscopic In Situ Hybridization images is done manually by experts. Precise evaluation and classification of such microscopic images can ease experts' work and reveal further insights about the data. In this work,…
Automatic Defect Analysis and Qualification (ADAQ) is a collection of automatic workflows developed for high-throughput simulations of magneto-optical properties of point defect in semiconductors. These workflows handle the vast number of…