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The properties of semiconductors and functional dielectrics are defined by their response in electric fields, which may be perturbed by defects and the strain they generate. In this work, we demonstrate how diffraction-based X-ray…

Materials Science · Physics 2024-11-12 Trygve Magnus Ræder , Urko Petralanda , Thomas Olsen , Hugh Simons

A non-invasive, in-situ calibration method for Total Internal Reflection Microscopy (TIRM) based on optical tweezing is presented which greatly expands the capabilities of this technique. We show that by making only simple modifications to…

Micro/nano electro-mechanical systems (MEMS/NEMS) are constantly attracting an increasing attention for their relevant technological applications in fields ranging from biology, medicine, ecology, energy to industry. Most of the…

Materials Science · Physics 2021-03-10 Omar Tricinci , Marco Carlotti , Andrea Desii , Fabian Meder , Virgilio Mattoli

Diffusion magnetic resonance imaging is an imaging technology designed to probe anatomical architectures of biological samples in an in vivo and non-invasive manner through measuring water diffusion. The contribution of this paper is…

A new tool providing material contrast control in scanning electron microscopy (SEM) is demonstrated. The approach is based on deep-UV illumination during SEM imaging and delivers a novel material based contrast as well as higher resolution…

Instrumentation and Detectors · Physics 2016-04-07 Gediminas Seniutinas , Armandas Balcytis , Saulius Juodkazis

We deal with the photoacoustic imaging modality using dielectric nanoparticles as contrast agents. Exciting the heterogeneous tissue, localized in a bounded domain $\Omega$, with an electromagnetic wave, at a given incident frequency,…

Analysis of PDEs · Mathematics 2020-03-09 Ahcene Ghandriche , Mourad Sini

Accurately determining the crystallographic structure of a material, organic or inorganic, is a critical primary step in material development and analysis. The most common practices involve analysis of diffraction patterns produced in…

Metasurfaces are planar optical elements that hold promise for overcoming the limitations of refractive and conventional diffractive optics1-3. Dielectric metasurfaces demonstrated thus far4-10 are limited to transparency windows at…

Atomic-resolution scanning transmission electron microscopy (STEM) characterization requires precise tilting of the specimen to high symmetric zone axis, which is usually processed in reciprocal space by following the diffraction patterns.…

Materials Science · Physics 2024-06-04 Jiake Wei , Zhangze Xu , Wenjie Shen , Bin Feng , Ryo Ishikawa , Naoya Shibata , Yuichi Ikuhara , Xuedong Bai

Three-dimensional (3D) imaging of thin, extended specimens at nanometer resolution is critical for applications in biology, materials science, advanced synthesis, and manufacturing. One route to 3D imaging is tomography, which requires a…

Instrumentation and Detectors · Physics 2023-10-23 Deepan Balakrishnan , See Wee Chee , Zhaslan Baraissov , Michel Bosman , Utkur Mirsaidov , N. Duane Loh

Cryo-electron microscopy (cryo-EM) enables single-particle analysis of biological macromolecules under strict low-dose imaging conditions, but the resulting micrographs often exhibit extremely low signal-to-noise ratios and weak particle…

Computer Vision and Pattern Recognition · Computer Science 2026-04-21 Xiaoqi Wu , Xueying Zhan , Wen Li , Junhao Wu , Xin Huang , Min Xu

Dielectric metasurfaces are two-dimensional structures composed of nano-scatterers that manipulate phase and polarization of optical waves with subwavelength spatial resolution, enabling ultra-thin components for free-space optics. While…

Optics · Physics 2017-01-26 Seyedeh Mahsa Kamali , Ehsan Arbabi , Amir Arbabi , Yu Horie , Andrei Faraon

Images captured in challenging environments often experience various forms of degradation, including noise, color cast, blur, and light scattering. These effects significantly reduce image quality, hindering their applicability in…

Computer Vision and Pattern Recognition · Computer Science 2025-06-26 Abbas Anwar , Mohammad Shullar , Ali Arshad Nasir , Mudassir Masood , Saeed Anwar

The use of electron mirrors in aberration correction and surface-sensitive microscopy techniques such as low-energy electron microscopy has been established. However, in this work, by implementing an easy to construct, fully electrostatic…

In this paper, we study the mathematical imaging problem of diffraction tomography (DT), which is an inverse scattering technique used to find material properties of an object by illuminating it with probing waves and recording the…

Numerical Analysis · Mathematics 2023-05-16 Florian Faucher , Clemens Kirisits , Michael Quellmalz , Otmar Scherzer , Eric Setterqvist

The cryo-electron microscope (cryo-EM) is increasingly popular these years. It helps to uncover the biological structures and functions of macromolecules. In this paper, we address image denoising problem in cryo-EM. Denoising the cryo-EM…

Computation · Statistics 2018-10-26 Yin Xian , Hanlin Gu , Wei Wang , Xuhui Huang , Yuan Yao , Yang Wang , Jian-Feng Cai

This article presents a method to perform diffraction tomography in a standard microscope that includes an LED array for illumination. After acquiring a sequence of intensity-only images of a thick sample, a ptychography-based…

Optics · Physics 2015-10-30 Roarke Horstmeyer , Changhuei Yang

Transparent and reflective objects, which are common in our everyday lives, present a significant challenge to 3D imaging techniques due to their unique visual and optical properties. Faced with these types of objects, RGB-D cameras fail to…

Computer Vision and Pattern Recognition · Computer Science 2025-09-22 Tianyu Sun , Dingchang Hu , Yixiang Dai , Guijin Wang

A shearing interferometer is presented which uses polarization control to shear the wavefront and to modulate the interference pattern. The shear is generated by spatial walk-off in a birefringent crystal. By adjusting the orientation of…

Optics · Physics 2012-12-11 Peter Beyersdorf , Mark Cordier

We show that two-dimensional arrays of thin metallic wires can guide transverse electromagnetic (TEM) waves and focus them to the spatial dimensions much smaller that the vacuum wavelength. This guiding property is retained for the tapered…

Optics · Physics 2009-11-13 G. Shvets , S. Trendafilov , J. B. Pendry , A. Sarychev