Related papers: Three-dimensional Hard X-ray Ptychographic Reflect…
X-ray diffraction with high spatial resolution is commonly used to characterize (poly-)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly…
Achieving high-fidelity 3D surface reconstruction while preserving fine details remains challenging, especially in the presence of materials with complex reflectance properties and without a dense-view setup. In this paper, we introduce a…
Neutron reflectometry (NR) has emerged as a unique technique for the investigation of structure and magnetism of thin films of both biologically relevant and magnetic materials. The advantage of NR with respect to many other…
The epitaxial growth of complex oxide thin films provide three avenues to generate unique properties: the ability to influence the 3-dimensional structure of the film, the presence of a surface, and the generation of an interface. In all…
X-ray interaction with matter is an energy-dependent process that is contingent on the atomic structure of the constituent material elements. The most advanced models to capture this relationship currently rely on Monte Carlo (MC)…
Ptychography is an imaging technique in which a localized illumination scans overlapping regions of an object and generates a set of diffraction intensities used to computationally reconstruct its complex-valued transmission function. We…
We present the development of extended diffraction tomography, a new approach to the solution of the linear seismic waveform inversion problem. This method has several appealing features, such as the use of arbitrary depth-dependent…
Established x-ray diffraction methods allow for high-resolution structure determination of crystals, crystallized protein structures or even single molecules. While these techniques rely on coherent scattering, incoherent processes like…
In conventional x-ray ptychography, diffraction data is collected by scanning a sample through a monochromatic, and spatially coherent, x-ray beam. A high-resolution image is then retrieved using an iterative algorithm. Combined with a scan…
Serial section electron microscopy (ssEM) is a widely used technique for obtaining volumetric information of biological tissues at nanometer scale. However, accurate 3D reconstructions of identified cellular structures and volumetric…
Increasing miniaturization and complexity of nanostructures require innovative metrology solutions with high throughput that can assess complex 3D structures in a non-destructive manner. EUV scatterometry is investigated for the…
Hierarchical biomaterials embody nature's intricate design principles, offering advanced functionalities through the complex, multi-level organization of their molecular and nanosized building blocks. However, the comprehensive…
Ptychographic extreme ultraviolet (EUV) diffractive imaging has emerged as a promising candidate for the next-generation metrology solutions in the semiconductor industry, as it can image wafer samples in reflection geometry at the…
Reconstructing the three-dimensional (3D) geometry of object surfaces is essential for robot perception, yet vision-based approaches are generally unreliable under low illumination or occlusion. This limitation motivates the design of a…
Sophisticated thin film growth techniques increasingly rely on the addition of a plasma component to open or widen a processing window, particularly at low temperatures. However, the addition of the plasma into the growth environment also…
X-ray ptychography is a data-intensive imaging technique expected to become ubiquitous at next-generation light sources delivering many-fold increases in coherent flux. The need for real-time feedback under accelerated acquisition rates…
We report a computational 3D microscopy technique, termed Fourier ptychographic diffraction tomography (FPDT), that iteratively stitches together numerous variably illuminated, low-resolution images acquired with a low-numerical aperture…
Recovering the radiometric properties of a scene (i.e., the reflectance, illumination, and geometry) is a long-sought ability of computer vision that can provide invaluable information for a wide range of applications. Deciphering the…
The microscopic distribution of strain and stress plays a crucial role for the performance, safety, and lifetime of components in aeronautics, automotive and critical infrastructure [1]. While non-destructive methods for measuring the…
As a promising lensless imaging method for distance objects, intensity interferometry imaging (III) had been suffering from the unreliable phase retrieval process, hindering the development of III for decades. Recently, the introduction of…