Related papers: Thermal noise calibration of functionalized cantil…
We demonstrate how the ineluctable presence of thermal noise alters the measurement of forces acting on microscopic and nanoscopic objects. We quantify this effect exemplarily for a Brownian particle near a wall subjected to gravitational…
Electrostatic force microscopy at cryogenic temperatures is used to probe the electrostatic interaction of a conductive atomic force microscopy tip and electronic charges trapped in localized states in an insulating layer on a…
Piezoresponse Force Microscopy is a powerful but delicate nanoscale technique that measures the mechanical response resulting from the application of a highly localized electric field. Though mechanical response is normally due to…
The torsion pendulum is a prevailing instrument for measuring small forces acting on a solid body or those between solid bodies. While it offers powerful advantages, the measurement precision suffers from thermal noises of the suspending…
A new method is introduced for calibrating lateral force as measured by an atomic force microscope (AFM), making use of both an interferometric detector and an optical beam detector on the same instrument. The method may be implemented…
Determining sensor parameters is a prerequisite for quantitative force measurement. Here we report a direct, high-precision calibration method for quartz tuning fork(TF) sensors that are popular in the feld of nanomechanical measurement. In…
Planar, double-torsional oscillators are especially suitable for short-range macroscopic force search experiments, since they can be operated at the limit of instrumental thermal noise. As a study of this limit, we report a measurement of…
We present a theoretical framework for the dynamic calibration of the higher eigenmode parameters (stiffness and optical lever responsivity) of a cantilever. The method is based on the tip-surface force reconstruction technique and does not…
We measure the mechanical thermal noise of soft silicon atomic force microscopy cantilevers. Using an interferometric setup, we have a resolution down to 1E-14 m/rtHz on a wide spectral range (3 Hz to 1E5 Hz). The low frequency behavior…
We describe a transducer for low-temperature atomic force microscopy based on electromechanical coupling due to a strain-dependent kinetic inductance of a superconducting nanowire. The force sensor is a bending triangular plate (cantilever)…
We present a simple theoretical framework to describe the thermal noise of a microscopic mechanical beam in a viscous fluid: we use the Sader approach to describe the effect of the surrounding fluid (added mass and viscous drag), and the…
Atomic force microscopy is an important tool for characterizing surface acoustic waves, in particular for high frequencies, where the wavelength is too short to be resolved by laser interferometry. A caveat is, that the cantilever…
Atomic Force Microscopy (AFM) methods utilizing resonant mechanical vibrations of cantilevers in contact with a sample surface have shown sensitivities as high as few picometers for detecting surface displacements. Such a high sensitivity…
Temperature estimation plays a vital role across natural sciences. A standard approach is provided by probe thermometry, where a probe is brought into contact with the sample and examined after a certain amount of time has passed. In many…
Scanning Thermal Microscopy (SThM) is a scanning probe technique aimed at quantitative characterization of local thermal properties at the length scale down to tens of nanometers. With many probe designs and approaches to interpretation of…
We investigate the capillary force that applies on a tilted cylinder as a function of its dipping angle i, using a home-built tilting Atomic Force Microscope (AFM) with custom made probes. A micrometric-size rod is glued at the end of an…
The use of atomic force microscopy on nanomechanical measurements requires accurate calibration of the cantilever's spring constant ($k_c$) and the optical lever sensitivity ($OLS$). The thermal method, based on the cantilever's thermal…
Piezoelectric quartz tuning forks have been employed as the force sensor in a dynamic mode scanning force microscope operating at temperatures down to 1.7 K at He-gas pressures of typically 5 mbar. An electrochemically etched tungsten tip…
Quantifying the temperature of microdevices is critical for probing nanoscale energy transport.Such quantification is often accomplished by integrating resistance thermometers into microdevices. However, such thermometers frequently become…
Recently, a non-thermal excess noise, compatible with the theoretical prediction provided by collapse models, was measured in a millikelvin nanomechanical cantilever experiment [Vinante et al., Phys. Rev. Lett. 119, 110401 (2017)]. We…