Related papers: Scanning diffraction imaging without stable illumi…
We demonstrate a neutron tomography technique with sub-micrometer spatial resolution. Our method consists of measuring neutron diffraction spectra using a double crystal diffractometer as a function of sample rotation and then using a phase…
Ptychography currently seems the most natural and effective method of approaching the diffraction limit of optical resolution. Schematic diagram of a ptychography microscope does not contain refractive or focusing elements. It includes a…
Strain and defects in crystalline materials are responsible for the distinct mechanical, electric and magnetic properties of a desired material, making their study an essential task in material characterization, fabrication and design.…
Ptychography has rapidly grown in the fields of X-ray and electron imaging for its unprecedented ability to achieve nano or atomic scale resolution while simultaneously retrieving chemical or magnetic information from a sample. A…
Ptychography is an emerging imaging technique that is able to provide wavelength-limited spatial resolution from specimen with extended lateral dimensions. As a scanning microscopy method, a typical two-dimensional image requires a number…
Image Phase Alignment Super-Sampling (ImPASS) is a computational imaging algorithm for converting a sequence of displaced low-resolution images into a single high-resolution image. The method consists of a unique combination of Phase…
Scattering scanning near-field optical microscopy enables optical imaging and characterization of plasmonic devices with nanometer-scale resolution well below the diffraction limit. This technique enables developers to probe and understand…
We introduce a novel reflection-mode diffraction tomography technique that enables simultaneous recovery of forward and backward scattering information for high-resolution 3D refractive index reconstruction. Our technique works by imaging a…
Investigating the structure of matter at the nanoscale non destructively is a key capability enabled by X-ray imaging. One of the most powerful nano-imaging methods is X-ray ptychography, a coherent diffraction imaging technique that has…
I propose a spatial-mode demultiplexing (SPADE) measurement scheme for the far-field imaging of spatially incoherent optical sources. For any object too small to be resolved by direct imaging under the diffraction limit, I show that SPADE…
Fourier ptychographic microscopy (FPM) is a recently developed imaging modality that uses angularly varying illumination to extend a system performance beyond the limit defined by its optical elements. The FPM technique applies a novel…
Fourier ptychographic (FP) microscope is a coherent imaging method that can synthesize an image with a higher bandwidth using multiple low-bandwidth images captured at different spatial frequency regions. The method's demand for multiple…
Fourier Ptychography is a recently proposed imaging technique that yields high-resolution images by computationally transcending the diffraction blur of an optical system. At the crux of this method is the phase retrieval algorithm, which…
Ptychography is a coherent diffraction imaging method that uses phase retrieval techniques to reconstruct complex-valued images. It achieves this by sequentially illuminating overlapping regions of a sample with a coherent beam and…
One of the most powerful approaches to imaging at the nanometer or subnanometer length scale is coherent diffraction imaging using X-ray sources. For amorphous (non-crystalline) samples, the raw data can be interpreted as the modulus of the…
In this work, we propose using camera arrays coupled with coherent illumination as an effective method of improving spatial resolution in long distance images by a factor of ten and beyond. Recent advances in ptychography have demonstrated…
Fourier ptychography is a recently explored imaging method for overcoming the diffraction limit of conventional cameras with applications in microscopy and yielding high-resolution images. In order to splice together low-resolution images…
We present a method to determine the static aberrations in a nearly diffraction-limited spectrograph introduced, for example, by alignment or manufacturing errors. We consider an instrument with two stages separated by a slit or image…
Microscopes face a trade-off between spatial resolution, field-of-view, and frame rate -- improving one of these properties typically requires sacrificing the others, due to the limited spatiotemporal throughput of the sensor. To overcome…
Transmission electron microscopes use electrons with wavelengths of a few picometers, potentially capable of imaging individual atoms in solids at a resolution ultimately set by the intrinsic size of an atom. Unfortunately, due to…