Related papers: A Machine Learning Approach to Predicting Single E…

As the deployment of artifical intelligence (AI) algorithms at edge devices becomes increasingly prevalent, enhancing the robustness and reliability of autonomous AI-based perception and decision systems is becoming as relevant as precision…

High energy particles from cosmic rays or packaging materials can generate a glitch or a current transient (single event transient or SET) in a logic circuit. This SET can eventually get captured in a register resulting in a flip of the…

Effects of Single Event Upsets (SEU) and Single Event Transients (SET) are studied in the FE-I4B chip of the innermost layer of the ATLAS pixel system. SEU/SET affect the FE-I4B Global Registers as well as the settings for the individual…

Designing integrated circuits in radiation environments such as the High Luminosity LHC (HL-LHC) is challenging. Integrated circuits will be exposed to radiation-induced Single Event Effects (SEE). In deep sub-micron technology devices, the…

Deep Neural Network has proved its potential in various perception tasks and hence become an appealing option for interpretation and data processing in security sensitive systems. However, security-sensitive systems demand not only high…

Deep Neural Network (DNN) accelerators are extensively used to improve the computational efficiency of DNNs, but are prone to faults through Single-Event Upsets (SEUs). In this work, we present an in-depth analysis of the impact of SEUs on…

Very deep submicron and nanometer technologies have increased notably integrated circuit (IC) sensitiveness to radiation. Soft errors are currently appearing into ICs working at earth surface. Hardened circuits are currently required in…

Neural Networks (NNs) are increasingly used in the last decade in several demanding applications, such as object detection and classification, autonomous driving, etc. Among different computing platforms for implementing NNs, FPGAs have…

In large-scale datacenters, memory failure is a common cause of server crashes, with Uncorrectable Errors (UEs) being a major indicator of Dual Inline Memory Module (DIMM) defects. Existing approaches primarily focus on predicting UEs using…

Reliability has been a major concern in embedded systems. Higher transistor density and lower voltage supply increase the vulnerability of embedded systems to soft errors. A Single Event Upset (SEU), which is also called a soft error, can…

Heavy ions induced single event upset (SEU) sensitivity of three-dimensional integrated SRAMs are evaluated by using Monte Carlo sumulation methods based on Geant4. The cross sections of SEUs and Multi Cell Upsets (MCUs) for 3D SRAM are…

The AMD UltraScale+ XCZU9EG device is a Multi-Processor System-on-Chip (MPSoC) with embedded Programmable Logic (PL) that excels in many Edge (e.g., automotive or avionics) and Cloud (e.g., data centres) terrestrial applications. However,…

Single-event upset (SEU) fault tolerance for systems-on-chip (SoCs) in radiation-heavy environments is often addressed by architectural fault-tolerance approaches protecting individual SoC components (e.g., cores, memories) in isolation.…

A new physics-based model for analytical calculation of Soft Error Rate (SER) in digital memory circuits under the influence of heavy ions in space orbits is proposed. This method is based on parameters that are uniquely determined from the…

In contemporary times, the increasing complexity of the system poses significant challenges to the reliability, trustworthiness, and security of the SACRES. Key issues include the susceptibility to phenomena such as instantaneous voltage…

Over past years, the easy accessibility to the large scale datasets has significantly shifted the paradigm for developing highly accurate prediction models that are driven from Neural Network (NN). These models can be potentially impacted…

While the capabilities of generative foundational models have advanced rapidly in recent years, methods to prevent harmful and unsafe behaviors remain underdeveloped. Among the pressing challenges in AI safety, machine unlearning (MU) has…

The advanced complex electronic systems increasingly demand safer and more secure hardware parts. Correspondingly, fault injection became a major verification milestone for both safety- and security-critical applications. However, fault…

SRAM-based FPGAs are increasingly popular in the aerospace industry due to their field programmability and low cost. However, they suffer from cosmic radiation induced Single Event Upsets (SEUs). In safety-critical applications, the…

We present experimental results of the cross-section related to cosmic-ray irradiation at ground level for minimum-sized six-transistors (6T) and eight-transistors (8T) bit-cells SRAM memories implemented on a 65 nm CMOS standard…