Effects of Single Event Upsets (SEU) and Single Event Transients (SET) are studied in the FE-I4B chip of the innermost layer of the ATLAS pixel system. SEU/SET affect the FE-I4B Global Registers as well as the settings for the individual pixels, causing, among other things, occupancy losses, drops in the low voltage currents, noisy pixels, and silent pixels. Quantitative data analysis and simulations indicate that SET dominate over SEU on the load line of the memory. Operational issues and mitigation techniques are presented.
@article{arxiv.2004.14116,
title = {Measurements of Single Event Upset in ATLAS IBL},
author = {G. Balbi and M. Barbero and R. Beccherle and M. Bindi and P. Breugnon and P. Butti and D. Cinca and J. Dickinson and D. Ferrere and D. Fougeron and M. Garcia-Sciveres and J. Garcia Pascual and A. Gaudiello and C. Gemme and N. Giangiacomi and T. Hemperek and L. Jeanty and O. Kepka and M. Kocian and K. Lantzsch and P. Liu and C. Martin and A. Mekkaoui and M. Menouni and K. Potamianos and A. Rozanov and Y. Takubo and M. Wensing},
journal= {arXiv preprint arXiv:2004.14116},
year = {2020}
}