Related papers: Is AFM-IR a photothermal technique?
Atomic Force Microscopy - Infrared (AFM-IR) spectroscopy allows spectroscopic studies in the mid-infrared spectral region with a spatial resolution better than 50 nm. We show that the high spatial resolution can be used to perform…
The contrast formation mechanism in Nanoscale Infrared Spectroscopy (Nano-IR or AFM-IR) is analyzed for the boundary between two layers with different light absorption, thermal and elastic parameters. Analytical results derived in the…
This article reviews the progress of atomic force microscopy (AFM) in ultra-high vacuum, starting with its invention and covering most of the recent developments. Today, dynamic force microscopy allows to image surfaces of conductors…
Infrared (IR) nanospectroscopy by photothermal induced resonance (PTIR) is a novel experimental technique that combines the nanoscale resolution granted by atomic force microscopy (AFM) and the chemical labelling made possible by IR…
Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable…
Infrared (IR) spectroscopy, a well established tool for chemical analysis of diverse materials, has significant potential in biomedical applications. While the spatial resolution of traditional IR spectroscopy is limited by the wavelength…
Atomic force microscopy (AFM) is widely used to measure surface topography of solid, soft, and living matter at the nanoscale. Moreover, by mapping forces as a function of distance to the surface, AFM can provide a wealth of information…
Optical photothermal microscopy is a powerful, emerging method that overcomes the diffraction limit in infrared hyperspectral imaging by utilizing a visible probe laser beam to detect local temperature-induced modulation at the visible…
We propose a new method to investigate interactions involved in atomic force microscopy (AFM). It is a dynamical method relying on the growth of oscillations via parametric resonance. With this method the second and third derivatives of the…
Photothermal microscopy is an emerging tool for measuring light-matter interactions with single-molecule sensitivity. It is generally believed that the spectral acquisition speed in photothermal microscopy is limited by the slow thermal…
Mid-infrared photo-induced force microscopy (IR-PiFM/PiF-IR) enables high-resolution chemical imaging of surfaces with lateral resolution less than 5 nm. Here are some answers to questions about the physical background, practical handling…
IR spectroscopy has been widely used for chemical identification and quantitative analysis of reactions occurring in a specific time and space domains by measuring an average signal of the entire system1. Achieving IR measurements with…
In this article, we present a deflection measurement setup for Atomic Force Microscopy (AFM). It is based on a quadrature phase differential interferometer: we measure the optical path difference between a laser beam reflecting above the…
Infrared (IR) images are widely used in many fields such as medical imaging, object tracking, astronomy and military purposes for securing borders. Infrared images can be captured day or night based on the type of capturing device. The…
IR absorption spectroscopy of hemoglobin was performed using an IR optical parametric oscillator laser and a commercial atomic force microscope in a novel experimental arrangement based on the use of a bottom-up excitation alignment. This…
Fourier-transform infrared spectroscopy (FTIR) has matured into a versatile technique with relevance for environmental monitoring, pharmaceutical research, and food safety applications. However, compared to other spectroscopic methods, it…
Photothermal-Induced Resonance (PTIR) is increasingly used in the measurement of infrared absorption spectra of sub-micrometer objects. The technique measures IR absorption spectra by relying on the photothermal effect induced by a rapid…
We present an approach for improving spatial frequency sampling in active incoherent millimeter-wave (AIM) imaging systems using frequency diversity. AIM imaging relies on active transmission of spatio-temporally incoherent signals to…
Atomic Force Microscopy (AFM) allows to reconstruct the topography of surface with a resolution in the nanometer range. The exceptional resolution attainable with the AFM makes this instrument a key tool in nanoscience and technology. The…
Atomic force microscopy (AFM) enables high-resolution imaging and quantitative force measurement, which is critical for understanding nanoscale mechanical, chemical, and biological interactions. In dynamic AFM modes, however, interaction…