Modelling photothermal induced resonance microscopy: the role of interface thermal resistances
Abstract
Infrared (IR) nanospectroscopy by photothermal induced resonance (PTIR) is a novel experimental technique that combines the nanoscale resolution granted by atomic force microscopy (AFM) and the chemical labelling made possible by IR absorption spectroscopy. While the technique has developed enormously over the last decade from an experimental point of view, the theoretical modelling of the signal still varies significantly throughout the literature and misses a solid benchmark. Here, we report an analysis focused on the electromagnetic and thermal simulations of a PTIR experiment. Thanks to a control experiment where the signal is acquired as a function of the thickness of a polymer film and for different tip geometries, we find clear evidence that the interface thermal resistances play a key role in the determination of the measured signal and should therefore always be accounted for by any quantitative modelling.
Keywords
Cite
@article{arxiv.2111.07303,
title = {Modelling photothermal induced resonance microscopy: the role of interface thermal resistances},
author = {Francesco Rusconi and Marco Finazzi and John M. Stormonth-Darling and Gordon Mills and Michela Badioli and Leonetta Baldassarre and Michele Ortolani and Paolo Biagioni and Valeria Giliberti},
journal= {arXiv preprint arXiv:2111.07303},
year = {2021}
}