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Related papers: Automated Semiconductor Defect Inspection in Scann…

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In industrial vision, the anomaly detection problem can be addressed with an autoencoder trained to map an arbitrary image, i.e. with or without any defect, to a clean image, i.e. without any defect. In this approach, anomaly detection…

Image and Video Processing · Electrical Eng. & Systems 2020-11-05 Anne-Sophie Collin , Christophe De Vleeschouwer

Additive Manufacturing (AM) is transforming the manufacturing sector by enabling efficient production of intricately designed products and small-batch components. However, metal parts produced via AM can include flaws that cause inferior…

Computer Vision and Pattern Recognition · Computer Science 2024-11-05 Duy Nhat Phan , Sushant Jha , James P. Mavo , Erin L. Lanigan , Linh Nguyen , Lokendra Poudel , Rahul Bhowmik

Light guide plates are essential optical components widely used in a diverse range of applications ranging from medical lighting fixtures to back-lit TV displays. An essential step in the manufacturing of light guide plates is the quality…

Image and Video Processing · Electrical Eng. & Systems 2022-04-26 Carol Xu , Mahmoud Famouri , Gautam Bathla , Mohammad Javad Shafiee , Alexander Wong

Nowadays, modern electron microscopes deliver images at atomic scale. The precise atomic structure encodes information about material properties. Thus, an important ingredient in the image analysis is to locate the centers of the atoms…

Computer Vision and Pattern Recognition · Computer Science 2017-09-13 Benjamin Berkels , Benedikt Wirth

In semiconductor manufacturing, lithography has often been the manufacturing step defining the smallest possible pattern dimensions. In recent years, progress has been made towards high-NA (Numerical Aperture) EUVL…

Computer Vision and Pattern Recognition · Computer Science 2023-11-22 Vic De Ridder , Bappaditya Dey , Victor Blanco , Sandip Halder , Bartel Van Waeyenberge

A Single Ensemble Empirical Mode Decomposition (SEEMD) is proposed for locating the damage in rolling element bearings. The SEEMD does not require a number of ensembles from the addition or subtraction of noise every time while processing…

Signal Processing · Electrical Eng. & Systems 2025-02-13 Yaakoub Berrouche , Govind Vashishtha , Sumika Chauhan , Radoslaw Zimroz

In this work we train a neural network to identify impurities in the experimental images obtained by the scanning tunneling microscope measurements. The neural network is first trained with large number of simulated data and then the…

Strongly Correlated Electrons · Physics 2020-12-02 Ce Wang , Haiwei Li , Zhenqi Hao , Xintong Li , Cangwei Zou , Peng Cai , Yayu Wang , Yi-Zhuang You , Hui Zhai

Automated f ault detection and monitoring in engineering are critical but frequently difficult owing to the necessity for collecting and labeling large amounts of defective samples . We present an unsupervised method that uses the high end…

Computer Vision and Pattern Recognition · Computer Science 2024-07-10 Ahmed Maged , Herman Shen

Reliable photovoltaic (PV) power generation requires timely detection of module defects that may reduce energy yield, accelerate degradation, and increase lifecycle operation and maintenance costs during field operation. Electroluminescence…

Artificial Intelligence · Computer Science 2026-04-07 Haoyu He , Yu Duan , Wenzhen Liu , Hanyuan Hang , Boyu Qin , Qiantu Tuo , Xiaoke Yang , Rui Li

The medical imaging literature has witnessed remarkable progress in high-performing segmentation models based on convolutional neural networks. Despite the new performance highs, the recent advanced segmentation models still require large,…

Image and Video Processing · Electrical Eng. & Systems 2020-02-13 Nima Tajbakhsh , Laura Jeyaseelan , Qian Li , Jeffrey Chiang , Zhihao Wu , Xiaowei Ding

Deep neural networks (DNNs) have been shown to over-fit a dataset when being trained with noisy labels for a long enough time. To overcome this problem, we present a simple and effective method self-ensemble label filtering (SELF) to…

Computer Vision and Pattern Recognition · Computer Science 2019-10-07 Duc Tam Nguyen , Chaithanya Kumar Mummadi , Thi Phuong Nhung Ngo , Thi Hoai Phuong Nguyen , Laura Beggel , Thomas Brox

One significant drawback of a spectroscopic ellipsometry (SE) technique is its time-consuming and often complicated analysis procedure necessary to assess the optical functions of thin-film and bulk samples. Here, to solve this inherent…

Overhead line inspection greatly benefits from defect recognition using visible light imagery. Addressing the limitations of existing feature extraction techniques and the heavy data dependency of deep learning approaches, this paper…

Computer Vision and Pattern Recognition · Computer Science 2023-12-08 Weixi Wang , Xichen Zhong , Xin Li , Sizhe Li , Xun Ma

Label noise is a common problem in real-world datasets, affecting both model training and validation. Clean data are essential for achieving strong performance and ensuring reliable evaluation. While various techniques have been proposed to…

Machine Learning · Computer Science 2025-10-21 Henrique Pickler , Jorge K. S. Kamassury , Danilo Silva

Noisy images processing is a fundamental task of computer vision. The first example is the detection of faint edges in noisy images, a challenging problem studied in the last decades. A recent study introduced a fast method to detect faint…

Computer Vision and Pattern Recognition · Computer Science 2021-10-06 Nati Ofir , Yosi Keller

Scanning transmission electron microscopy (STEM) has become the technique of choice for quantitative characterization of atomic structure of materials, where the minute displacements of atomic columns from high-symmetry positions can be…

Materials Science · Physics 2021-10-05 Kevin M. Roccapriore , Nicole Creange , Maxim Ziatdinov , Sergei V. Kalinin

Traditional supervised medical image segmentation models require large amounts of labeled data for training; however, obtaining such large-scale labeled datasets in the real world is extremely challenging. Recent semi-supervised…

Computer Vision and Pattern Recognition · Computer Science 2025-05-26 Yunyao Lu , Yihang Wu , Reem Kateb , Ahmad Chaddad

Anomaly detection refers to the task of finding unusual instances that stand out from the normal data. In several applications, these outliers or anomalous instances are of greater interest compared to the normal ones. Specifically in the…

Image and Video Processing · Electrical Eng. & Systems 2020-01-14 Manpreet Singh Minhas , John Zelek

With the increasing adoption of metal additive manufacturing (AM), researchers and practitioners are turning to data-driven approaches to optimise printing conditions. Cross-sectional images of melt tracks provide valuable information for…

Computer Vision and Pattern Recognition · Computer Science 2024-10-02 Aagam Shah , Reimar Weissbach , David A. Griggs , A. John Hart , Elif Ertekin , Sameh Tawfick

Images captured from the real world are often affected by different types of noise, which can significantly impact the performance of Computer Vision systems and the quality of visual data. This study presents a novel approach for defect…

Computer Vision and Pattern Recognition · Computer Science 2024-05-14 Mohsen Hami , Mahdi JameBozorg