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Related papers: Automated Semiconductor Defect Inspection in Scann…

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A common source of defects in manufacturing miniature Printed Circuits Boards (PCB) is the attachment of silicon die or other wire bondable components on a Liquid Crystal Polymer (LCP) substrate. Typically, a conductive glue is dispensed…

Computer Vision and Pattern Recognition · Computer Science 2020-02-26 Nikolaos Dimitriou , Lampros Leontaris , Thanasis Vafeiadis , Dimosthenis Ioannidis , Tracy Wotherspoon , Gregory Tinker , Dimitrios Tzovaras

The most established method of reconstructing neural circuits from animals involves slicing tissue very thin, then taking mosaics of electron microscope (EM) images. To trace neurons across different images and through different sections,…

Quantitative Methods · Quantitative Biology 2013-04-23 Louis K. Scheffer , Bill Karsh , Shiv Vitaladevun

In the domain of battery research, the processing of high-resolution microscopy images is a challenging task, as it involves dealing with complex images and requires a prior understanding of the components involved. The utilization of deep…

Computer Vision and Pattern Recognition · Computer Science 2025-03-19 Ganesh Raghavendran , Bing Han , Fortune Adekogbe , Shuang Bai , Bingyu Lu , William Wu , Minghao Zhang , Ying Shirley Meng

Modern Integrated-Circuit(IC) manufacturing introduces diverse, fine-grained defects that depress yield and reliability. Most industrial defect segmentation compares a test image against an external normal set, a strategy that is brittle…

Computer Vision and Pattern Recognition · Computer Science 2025-09-12 Botong Zhao , Qijun Shi , Shujing Lyu , Yue Lu

Defective surgical instruments pose serious risks to sterility, mechanical integrity, and patient safety, increasing the likelihood of surgical complications. However, quality control in surgical instrument manufacturing often relies on…

Computer Vision and Pattern Recognition · Computer Science 2025-10-17 Qurrat Ul Ain , Atif Aftab Ahmed Jilani , Zunaira Shafqat , Nigar Azhar Butt

Aberration-corrected Scanning Transmission Electron Microscopy (STEM) has become an essential tool in understanding materials at the atomic scale. However, tuning the aberration corrector to produce a sub-{\AA}ngstr\"om probe is a complex…

Recent advances in scanning transmission electron and scanning probe microscopies have opened exciting opportunities in probing the materials structural parameters and various functional properties in real space with angstrom-level…

The coherence of quantum dot qubits fabricated in semiconductors is often limited by charge noise from defects in gate dielectrics, which are material- and process-dependent. Characterizing these defects is an important step towards…

Solar photovoltaic (PV) modules are prone to damage during manufacturing, installation and operation which reduces their power conversion efficiency. This diminishes their positive environmental impact over the lifecycle. Continuous…

Computer Vision and Pattern Recognition · Computer Science 2025-08-04 Swayam Rajat Mohanty , Moin Uddin Maruf , Vaibhav Singh , Zeeshan Ahmad

More than a thousand 8" silicon sensors will be visually inspected to look for anomalies on their surface during the quality control preceding assembly into the High-Granularity Calorimeter for the CMS experiment at CERN. A deep…

Instrumentation and Detectors · Physics 2023-03-28 Sonja Grönroos , Maurizio Pierini , Nadezda Chernyavskaya

In line with the development of Industry 4.0, surface defect detection/anomaly detection becomes a topical subject in the industry field. Improving efficiency as well as saving labor costs has steadily become a matter of great concern in…

Computer Vision and Pattern Recognition · Computer Science 2023-06-14 Yajie Cui , Zhaoxiang Liu , Shiguo Lian

Fault detection and diagnosis of the interconnects are crucial for prognostics and health management (PHM) of electronics. Traditional methods, which rely on electronic signals as prognostic factors, often struggle to accurately identify…

Machine Learning · Computer Science 2024-10-08 Tae Yeob Kang , Haebom Lee , Sungho Suh

Detecting edges is a fundamental problem in computer vision with many applications, some involving very noisy images. While most edge detection methods are fast, they perform well only on relatively clean images. Indeed, edges in such…

Computer Vision and Pattern Recognition · Computer Science 2021-10-06 Nati Ofir , Meirav Galun , Boaz Nadler , Ronen Basri

A method of scanning mid-IR-laser microscopy has recently been proposed for the investigation of large-scale electrically and recombination-active defects in semiconductors and non-destructive inspection of semiconductor materials and…

Materials Science · Physics 2011-05-17 O. V. Astafiev , V. P. Kalinushkin , V. A. Yuryev

Transmission electron microscope (TEM) images are often corrupted by noise, hindering their interpretation. To address this issue, we propose a deep learning-based approach using simulated images. Using density functional theory…

Materials Science · Physics 2025-01-22 Jinwoong Chae , Sungwook Hong , Sungkyu Kim , Sungroh Yoon , Gunn Kim

Utilizing Convolutional Neural Networks (CNNs), Recurrent Neural Networks (RNNs), and Generative Adversarial Networks (GANs), our system introduces an innovative approach to defect detection in manufacturing. This technology excels in…

Computer Vision and Pattern Recognition · Computer Science 2023-11-09 Arti Kumbhar , Amruta Chougule , Priya Lokhande , Saloni Navaghane , Aditi Burud , Saee Nimbalkar

The alignment of serial-section electron microscopy (ssEM) images is critical for efforts in neuroscience that seek to reconstruct neuronal circuits. However, each ssEM plane contains densely packed structures that vary from one section to…

Computer Vision and Pattern Recognition · Computer Science 2017-12-06 Inwan Yoo , David G. C. Hildebrand , Willie F. Tobin , Wei-Chung Allen Lee , Won-Ki Jeong

Software quality is one of the essential aspects of a software. With increasing demand, software designs are becoming more complex, increasing the probability of software defects. Testers improve the quality of software by fixing defects.…

Software Engineering · Computer Science 2020-11-18 Mitt Shah , Nandit Pujara

Software testing is one of the important ways to ensure the quality of software. It is found that testing cost more than 50% of overall project cost. Effective and efficient software testing utilizes the minimum resources of software.…

Machine Learning · Computer Science 2020-09-01 Ali Nawaz , Attique Ur Rehman , Muhammad Abbas

In computer-aided diagnosis (CAD) focused on microscopy, denoising improves the quality of image analysis. In general, the accuracy of this process may depend both on the experience of the microscopist and on the equipment sensitivity and…

Image and Video Processing · Electrical Eng. & Systems 2021-05-04 Fabio Hernán Gil Zuluaga , Francesco Bardozzo , Jorge Iván Ríos Patiño , Roberto Tagliaferri