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Friction measurements in the range of several meters per second are still of great interests. With the atomic force microscopy (AFM), the oscilaltion situation of the quartz crystal resonators of 3MHz resonance frequency are studied. And…

Mesoscale and Nanoscale Physics · Physics 2013-12-11 Fengzhen Zhang , Othmar Marti , Stefan Walheim , Thomas Schimmel

Measuring the mechanical response of liquid interfaces without direct contact remains a major experimental challenge, particularly in liquid-liquid systems where no solid reference exists. Here, we develop a frequency-modulation atomic…

Soft Condensed Matter · Physics 2026-05-29 Lucie Corral , Christian Curtil , Medhi Lagaize , Marc Leonetti , Hubert R. Klein

We demonstrate the application of Atomic Force Microscopy (AFM) based optical force microscopy to map the optical near-fields with nanometer resolution, limited only by the AFM probe geometry. We map the electric field distributions of…

Recently, using an Atomic Force Microscope and a single cantilever excited at different frequencies it was shown that water nanomeniscus can exhibit a transition in mechanical responses when submitted to stimuli above few tens of kHz. The…

Soft Condensed Matter · Physics 2016-09-26 Simon Carpentier , Mario S. Rodrigues , Luca Costa , Miguel V. VItorino , Joel Chevrier

We propose a new method to investigate interactions involved in atomic force microscopy (AFM). It is a dynamical method relying on the growth of oscillations via parametric resonance. With this method the second and third derivatives of the…

Materials Science · Physics 2007-05-23 Franz-Josef Elmer

We report a systematic study to determine local elastic properties of surfaces combining atomic force microscope (AFM) with acoustic waves which is known as atomic force acoustic microscopy - AFAM. We describe the methodology of AFAM in…

Materials Science · Physics 2007-05-23 S. Banerjee , N. Gayathri , S. R. Shannigrahi , S. Dash , A. K. Tyagi , B. Raj

Interatomic-force measurements are regularly performed using frequency-modulation atomic force microscopy. This requires conversion of the observed shift in the resonant frequency of a force-sensing cantilever, to the actual force…

Applied Physics · Physics 2020-12-02 John Elie Sader

In this research, atomistic molecular dynamics simulations are combined with mesoscopic phase-field computational methods in order to investigate phase-transformation in polycrystalline Aluminum microstructure. In fact, microstructural…

Materials Science · Physics 2019-07-03 Mehrdad Yousefi

Since the invention of the atomic force microscope (AFM) in 1986, there has been a drive to apply this scanning probe technique or a form of this technique to various disciplines in nanoscale science. Magnetic force microscopy (MFM) is a…

Instrumentation and Detectors · Physics 2017-04-28 Gustavo Cordova , Brenda Yasie Lee , Zoya Leonenko

We describe and demonstrate a method by which the nonlinear piezoelectric properties of a piezoelectric material may be measured by detecting the force that it applies on a suspended micromechanical resonator at one of its mechanical…

Applied Physics · Physics 2018-05-25 Joseph A. Boales , Shyamsunder Erramilli , Pritiraj Mohanty

Atomic force microscopy (AFM) routinely achieves structural information in the sub-nm length scale. Measuring time resolved properties on this length scale to understand kinetics at the nm scale remains an elusive goal. We present a general…

Mesoscale and Nanoscale Physics · Physics 2018-03-15 Zeno Schumacher , Andreas Spielhofer , Yoichi Miyahara , Peter Grutter

Traction Force Microscopy (TFM) computes the forces exerted at the surface of an elastic material by measuring induced deformations in volume. It is used to determine the pattern of the adhesion forces exerted by cells or by cellular…

Biological Physics · Physics 2018-02-09 Stanislav Makarchuk , Nicolas Beyer , Christian Gaiddon , Wilfried Grange , Pascal Hébraud

Mechanical nonlinearities dominate the motion of nanoresonators already at relatively small oscillation amplitudes. Although single and coupled two-degrees-of-freedom models have been used to account for experimentally observed nonlinear…

Mesoscale and Nanoscale Physics · Physics 2023-04-05 Ata Keşkekler , Vincent Bos , Alejandro M. Aragón , Peter G. Steeneken , Farbod Alijani

The atomic force microscope (AFM) is a versatile, high-resolution tool used to characterize the topography and material properties of a large variety of specimens at nano-scale. The interaction of the micro-cantilever tip with the specimen…

Materials Science · Physics 2011-09-05 David Busch , Qingze Zou , Baskar Ganapathysubramanian

Two-dimensional (2D) materials are envisaged as ultra-thin solid lubricants for nano-mechanical systems. So far, their frictional properties at the nanoscale have been studied by standard friction force microscopy. However, lateral…

Mesoscale and Nanoscale Physics · Physics 2018-10-02 Borislav Vasić , Igor Stanković , Aleksandar Matković , Markus Kratzer , Christian Ganser , Radoš Gajić , Christian Teichert

Cellulose, as a naturally abundant and biocompatible material, is still gaining interest due to its high potential for functionalization. This makes cellulose a promising candidate for replacing plastics. Understanding how cellulose…

The use of polymer nanocomposites as gas barrier materials has seen increasing interest, including applications involving hydrogen transport and storage. Better understanding of gas transport through those polymeric systems requires 3D…

Fractional models and their parameters are sensitive to changes in the intrinsic micro-structures of anomalous materials. We investigate how such physics-informed models propagate the evolving anomalous rheology to the nonlinear dynamics of…

Numerical Analysis · Mathematics 2020-09-28 Jorge L. Suzuki , Pegah Varghaei , Ehsan Kharazmi , Mohsen Zayernouri

A dual-excitation method for resonant-frequency tracking in scanning probe microscopy based on amplitude detection is developed. This method allows the cantilever to be operated at or near resonance for techniques where standard phase…

Materials Science · Physics 2008-03-13 B J Rodriguez , C Callahan , S V Kalinin , R Proksch

We demonstrate the measurement of laterally induced optical forces using an Atomic Force Microscope (AFM). The lateral electric field distribution between a gold coated AFM probe and a nano-aperture in a gold film is mapped by measuring the…