Related papers: Accurate Vertical Nanoelectromechanical Measuremen…
Tuning and reconfiguring nanophotonic components is needed to realize systems incorporating many components. The electrostatic force can deform a structure and tune its optical response. Despite the success of electrostatic actuators, they…
The field of optical metrology with its high precision position, rotation and wavefront sensors represents the basis for lithography and high resolution microscopy. However, the on-chip integration - a task highly relevant for future…
Piezoresponse Force Spectroscopy (PFS) has emerged as a powerful technique for probing highly localized switching behavior and the role of microstructure and defects on switching. The application of a dc bias to a scanning probe microscope…
Due to their simplicity and versatility of design, straight strip or rectangular pad anode structures are frequently employed with micro-pattern gas detectors to reconstruct high precision space points for various tracking applications. The…
Efficient ion-photon coupling is an important component for large-scale ion-trap quantum computing. We propose that arrays of phase Fresnel lenses (PFLs) are a favorable optical coupling technology to match with multi-zone ion traps. Both…
Correlative nanoscale surface characterization benefits from simultaneously measuring electronic and structural properties in the same environment, a capability that is essential for modern-day materials science and semiconductor failure…
We perform an extensive experimental spectroscopic study of the collective spin-wave dynamics occurring in a pair of magnetic nano-disks coupled by the magneto-dipolar interaction. For this, we take advantage of the stray field gradient…
Polarization is a fundamental property of light that carries distinct and valuable information. Consequently, its precise measurement is crucial for numerous applications, including biomedical imaging, remote sensing, and optical…
The thermodynamics and kinetics of tip-induced polarization switching in Piezoresponse Force Microscopy in the presence of surface charge defects is studied using the combination of analytical and numerical techniques. The signature of the…
In order for data products from WIIT to be as robust as possible, the alignment and mechanical positions of source, receiver, and detector components must be controlled and measured with extreme precision and accuracy, and the ambient…
Atomic-level imperfections play an increasingly critical role in nanophotonic device performance. However, it remains challenging to accurately characterize the sidewall roughness with sub-nanometer resolution and directly correlate this…
Frequency-modulation atomic force microscopy provides an outstanding precision of the measurement of chemical bonding forces. However, as the cantilever oscillates with an amplitude A that is usually on the order of atomic dimensions or…
Molecular dipoles near interfaces emit highly directional radiation due to near-field interactions, making surface-bound fluorophores sensitive probes of local physicochemical changes. We introduce smart coverslips, stably coated with…
Ferroelectric domain imaging with piezoresponse force microscopy (PFM) relies on the converse piezoelectric effect: a voltage applied to the sample leads to mechanical deformations. In case of PFM one electrode is realized by the tip,…
Lensless imaging enables exceptionally compact fluorescence sensors, advancing applications in \textit{in vivo} imaging and low-cost, point-of-care diagnostics. These sensors require a filter to block the excitation light while passing…
In this paper, we describe the modification of Nanoscale Impedance Microscopy (NIM), namely, a combination of contact-mode atomic force microscopy with local impedance measurements. The postulated approach is based on the application of…
Light has shown up an incredibe capability in precision measurement based on opto-mechanic interaction in high vacuum by isolating environment noises. However, there are still obstructions, such as displacement and mass estimation error,…
Mechanical force is an essential feature for many physical and biological processes.1-12 Remote measurement of mechanical signals with high sensitivity and spatial resolution is needed for diverse applications, including robotics,13…
The selective optical detection of individual metallic nanoparticles (NPs) with high spatial and temporal resolution is a challenging endeavour, yet is key to the understanding of their optical response and their exploitation in…
Point Spread Function (PSF) engineering is used in single emitter localization to measure the emitter position in 3D and possibly other parameters such as the emission color or dipole orientation as well. Advanced PSF models such as spline…