Related papers: Phase imaging in scanning transmission electron mi…
The phase shift of an electromagnetic wave, imprinted by its interaction with atomic scatterers, is a central quantity in optics and photonics. In particular, it encodes information about optical resonances and photon-matter interaction.…
Sample thickness is an important parameter in transmission electron microscopy (TEM) imaging, for interpreting image contrast and understanding the relationship between properties and microstructure. In this study, we introduce a method for…
A novel scheme for Zernike-type hard X-ray phase-contrast imaging is proposed. The scheme relies on X-ray dynamical diffraction in a two-block crystal system with parallel crystal plates of equal thickness. A phase shifter providing a…
In this paper, we describe the principle of a multi-aperture interferometer that uses a phase-shifting technique and is suitable for quick, snapshot imaging of astrophysical objects at extreme angular resolution through Fourier inversion. A…
We consider the phase sensing via weak optical coherent state at quantum limit precision. A new detection scheme for the phase estimation is proposed which is inspired by the suboptimal quantum measurement in coherent optical communication.…
Different imaging modalities are used to extract the diverse information carried in an optical field. Two prominent modalities include bright field and phase contrast microscopy that can visualize the amplitude and phase features of a…
Accurate computational ptychographic phase reconstructions are enabled by fast direct-electron cameras with high dynamic ranges used for four-dimensional scanning transmission electron microscopy (4D-STEM). The availability of open software…
Recovering both amplitude and phase information from a system is a fundamental goal of optical imaging. At the same time, it is crucial to operate at low photon doses to avoid altering the sample, particularly in biological applications.…
We propose a method for optical nano-imaging in which the structure of a three-dimensional inhomogeneous medium may be recovered from far-field power measurements. Neither phase control of the illuminating field nor phase measurements of…
Scanning Electron Microscopy (SEM) is indispensable in modern materials science, enabling high-resolution imaging across a wide range of structural, chemical, and functional investigations. However, SEM imaging remains constrained by…
Ptychography is an imaging technique which involves a sample being illuminated by a coherent, localized probe of illumination. When the probe interacts with the sample, the light is diffracted and a diffraction pattern is detected. Then the…
Observing the individual building blocks of matter is one of the primary goals of microscopy. The invention of the scanning tunneling microscope [1] revolutionized experimental surface science in that atomic-scale features on a solid-state…
A unified method for three-dimensional reconstruction of objects from transmission images collected at multiple illumination directions is described. The method may be applicable to experimental conditions relevant to absorption-based,…
In Part I of this diptych, we outlined the theory and an analysis methodology for quantitative phase recovery from real-space distortions of Fresnel images acquired in the parallel mode of transmission electron microscopy (TEM). In that…
Electron energy loss spectroscopy is consolidating as a powerful tool to explore electronic (as well as vibrational) excitations of matter, including molecules. Performed in a scanning transmission electron microscope, this technique is…
The transverse emittance of a charged particle beam is an important figure of merit for many accelerator applications, such as ultra-fast electron diffraction, free electron lasers and the operation of new compact accelerator concepts in…
Transmission electron microscopes use electrons with wavelengths of a few picometers, potentially capable of imaging individual atoms in solids at a resolution ultimately set by the intrinsic size of an atom. Unfortunately, due to…
The dark-field signal uncovers details beyond conventional X-ray attenuation contrast, which is especially valuable for material sciences. In particular, dark-field techniques are able to reveal structures beyond the spatial resolution of a…
In Part I of this diptych, we outline the parallel mode of differential phase contrast (TEM-DPC), which uses real-space distortion of Fresnel images arising from electrostatic or magnetostatic fields to quantify the phase gradient of…
Fourier ptychographic microscopy (FPM) is a recently developed imaging modality that uses angularly varying illumination to extend a system performance beyond the limit defined by its optical elements. The FPM technique applies a novel…